-Honors Thesis Defense- In Situ Ellipsometry of Surfaces in an Ultrahigh Vacuum Thin Film Deposition Chamber Joseph Choi Department of Physics and Astronomy,

Slides:



Advertisements
Similar presentations
Thermo-compression Bonding
Advertisements

MPA 2010, Braga HIGH VACUUM PLANTS FOR REACTIVE SPUTTER DEPOSITION OF MULTI-LAYER STACKS Milko Angelov Milko Angelov Consulting Co Ltd., Plovdiv, Bulgaria.
Sputter Stand Safety Specifics Electrical Hazards High Voltage : Electrical power is required for the high voltage supply, gauging, system controller and.
Eliminating organic contamination on oxidized Si surfaces using atomic oxygen Liz Strein, David Allred, R. Steven Turley, and the EUV/thin films group.
Bellow valve (trap&pump) Inside glove box. (Note: Ar glove box is not necessary, if you work with single crystalline organic materials like rubrene that.
Vacuum System Design Considerations Materials Plumbing –Pumping –Throughput Ultimate pressure –Dynamic equilibrium –Pumping speed –Leaks.
Overview of Vacuum Systems Tejas Deshpande 24 July, 2014.
1 Uranium Oxide as a Highly Reflective Coating from 2.7 to 11.6 Nanometers William R. Evans, Richard L. Sandberg, David D. Allred*, Jed E. Johnson, R.
Center for Materials for Information Technology an NSF Materials Science and Engineering Center Vacuum Fundamentals Lecture 5 G.J. Mankey
1 Extreme Ultraviolet Polarimetry Utilizing Laser-Generated High- Order Harmonics N. Brimhall, M. Turner, N. Herrick, D. Allred, R. S. Turley, M. Ware,
L.B. Begrambekov Plasma Physics Department, Moscow Engineering and Physics Institute, Moscow, Russia Peculiarities, Sources and Driving Forces of.
NLC - The Next Linear Collider Project Leif Eriksson 10/11/99 NLC BD VACUUM Thermal Outgassing Rate for Various Beam Line Materials.
Silicon Wafer Cleaning for EUV Reflectance Measurements by Cold, High-Pressure CO 2 Jet William Evans Brigham Young University.
Vacuum Technology Part II of the “What exactly do we have down there?” series.
10 October 2005 Determining Optical Constants for ThO 2 Thin Films Sputtered Under Different Bias Voltages from 1.2 to 6.5 eV by Spectroscopic Ellipsometry.
Vacuum Technology Need for Vacuum Environment
1 Oxidation Effects on the Optical Constants of Heavy Metals in the Extreme Ultraviolet Amy Grigg R. Steven Turley Brigham Young University.
2 May May 2006 Determining Optical Constants for ThO 2 Thin Films Sputtered Under Different Bias Voltages from 1.2 to 6.5 eV by Spectroscopic Ellipsometry.
Uranium Oxide as a Highly Reflective Coating from 2.7 to 11.6 Nanometers Richard L. Sandberg Thanks to Advisors: David D. Allred, R. Steven Turley Fellow.
1 X-Ray Photoelectron Molecular By Amy Baker R. Steven Turley, David Allred, Matt Linford, Yi Lang, BYU Thin Special Thanks to R. Steven Turley, David.
Comparison of Cleaning Methods for Thin Film Surfaces Lena Johnson, Mitch Challis, Ross Robinson, Richard Sandberg Group 4 English 316 Oral Report June.
The Deposition Process

INTEGRATED CIRCUITS Dr. Esam Yosry Lec. #5.
Thin Film Deposition Prof. Dr. Ir. Djoko Hartanto MSc
Photoelectron Spectroscopy Lecture 5 – instrumental details –General spectrometer design –Vacuum generation and measurement.
Solar Cell conductive grid and back contact
CsI Photocathode Production and Testing
Cleaning of Hydrocarbon Buildup on Metallic-oxide Thin-Films Richard Sandberg Ross Robinson, Dr. David Allred, Dr. R. Steven Turley, Aaron Jackson, Shannon.
Methods in Surface Physics Experimentation in Ultra-High Vacuum Environments Hasan Khan (University of Rochester), Dr. Meng-Fan Luo (National Central University)
Vacuum science.
Andrew Jacquier Brigham Young University
Vacuum Fundamentals 1 atmosphere = 760 mm Hg = kPa 1 torr = 1 mm Hg vacuum range pressure range low 760 ~ 25 torr medium 25~ high ~ 10.
Cressington 208 HR Sputter coater
Optical Constants of Uranium Nitride Thin Films in the EUV (7-15 nm) Marie K. Urry EUV Thin Film Group Brigham Young University.
CCMR – RET 2008 Week 1 June 29 to July Day 1 Monday June 29, 2008 Kevin’s “Cornell is up on a hill so it is extremely steep between the.
Vacuum system.
BDS 11 Vacuum System for BDS [Completeness of RDR] Y. Suetsugu J. Noonan and P. Michelato Design principle Basic design Cost estimation.
1 X-Ray Photoelectron Spectroscopy to Examine Molecular Composition Amy Baker R. Steven Turley Brigham Young University.
Vacuum Fundamentals 1 atmosphere = 760 mm Hg = kPa 1 torr = 1 mm Hg vacuum range pressure range low 760 ~ 25 torr medium 25~ high ~ 10.
Center for Materials for Information Technology an NSF Materials Science and Engineering Center Vacuum Systems Lecture 6 G.J. Mankey
Optical Constants of Uranium Nitride Thin Films in the EUV ( eV) Marie K. Urry EUV Thin Film Group Brigham Young University.
DILBERT. Did research and learned about several communication devices – cellular phones, Bluetooth/Wi-Fi, and RFID Did research and learned.
Vacuum Technology.
Top Down Method Vacuum Applications in Nanomanufacturing Author’s Note: Significant portions of this work have been reproduced and/or adapted with permission.
+ Analysis of Anomalous Film Growth when Yttrium Oxide Thin Films are Exposed to 7.2eV Light Alison Wells Dr. David D. Allred Devon Mortenson Kristal Chamberlain.
Solar Cells need a top side conductor to collect the current generated They also need a conductive film on the backside.
1 Vacuum chambers for LHC LSS TS Workshop 2004 Pedro Costa Pinto TS department, MME group Surface Characterization & Coatings Section.
2-D Nanostructure Synthesis (Making THIN FILMS!)
Sputtering. Why? Thin layer deposition How? Bombarding a surface with ions which knocks out molecules from a target which in turn will redeposit onto.
Vacuum Technology and Components for Cryogenics
Roughness and Electrical Resistivity of Thin Films Spencer Twining, Marion Titze, Ozgur Yavuzcetin University of Wisconsin – Whitewater, Department of.
Jari Koskinen 1 Thin Film Technology Lecture 2 Vacuum Surface Engineering Jari Koskinen 2014.
NIU’s ion beam deposition system for boron deposition on a CCD Donna 9May2013.
Solar Cells need a top side conductor to collect the current generated They also need a conductive film on the backside.
Vacuum Systems for Electron Microscopy Constraints on Specimens Specimens placed in the electron microscope must be able to withstand very high vacuum.
Working with Ultra High Vacuum (UHV) Equipment
DILBERT.
© 1997, Angus Rockett Section I Evaporation.
Jari Koskinen, Sami Franssila
1.3-GHz Cavity Vacuum Furnace at IB4
Cornell ERL Prototype Injector DC Photocathode Gun Design Review Vacuum Systems Yulin Li, January 5th– 6th, /5-6/2011 Cornell Gun Review.
K. H. Lee, H. Y. Lee, Young-Gi Kim, J. Yang, S. M. Yang, K.J. Chung, Y.S. Na and Y. S. Hwang Residual Gas analysis during Glow discharge cleaning, Baking.
CEPC Vacuum System Dong Haiyi 2017/11/5.
PVD & CVD Process Mr. Sonaji V. Gayakwad Asst. professor
Thermal Outgassing Rate for Various Beam Line Materials
1.6 Magnetron Sputtering Perpendicular Electric Magnetic Fields.
REMOVING SURFACE CONTAMINATES FROM SILICON WAFERS
XFEL Collimation and Beam Switchyard Vacuum Issues
IC AND NEMS/MEMS PROCESSES
Presentation transcript:

-Honors Thesis Defense- In Situ Ellipsometry of Surfaces in an Ultrahigh Vacuum Thin Film Deposition Chamber Joseph Choi Department of Physics and Astronomy, Brigham Young University June 19, 2001 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University Definition of Terms UHV (ultrahigh vacuum)- Base pressure < 10-9 torr. (Atmospheric pressure is 7.6 x 102 torr) Ellipsometry- Optical measurement technique of reflection, transmission, optical constants, and thickness using polarization of light. In situ- Measurement inside the chamber without opening to the atmosphere. Evaporation- Deposition of material by thermally heating it using metallic boats with high resistance. Sputtering- Deposition by bombarding positive ions onto the material, and physically vaporizing it. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University Research Goals Building: Build a UHV (ultrahigh vacuum) chamber with in situ ellipsometry, sputtering, and evaporation capabilities. Measurement / Modeling: Measure and develop model for thin film oxidation. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Motivation – Study of Oxidation Reflectance of a silicon film can vary from 70% to below 5% dependent on oxidation. Immediate oxidization when exposed to atmosphere. (Model of a silicon film produced using IMD©) 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University Thesis Description Design and building of vacuum chamber from stainless steel body made by Varian, Inc. – Since April 2000. UHV, ellipsometry, deposition, procedures. Ruthenium thin film ( 290 Å) sputtered in HV (high vacuum;10-8-10-6 torr). Real-time in situ ellipsometric measurements to analyze Ru thin film and its oxidation. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University UHV Vacuum (10-9 torr) Benefit- Purity of film: - Comparison with HV (10-6 torr): Gas flux  1 cm2/sec. Achieving UHV: - Cleanliness: No oil; cleaning agents (hexane, methanol). - Bake out: > 250 ºC to eliminate water, hydrogen, speed degassing. - Parts: Minimize o-rings, use metal-to-metal seals. - Material: Low outgas rates (Aluminum, stainless steel). - Machining: Inert gas welding or vacuum brazing. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Conflat flange- Copper seal Thermocouple Bake out power control- Variac + Transformer Cleaning agent- Methanol Heating tape- Bake out 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University Vacuum Pumps Principle - Cold trap. - Large surface area. Sorption pumps - Atmosphere to roughing pressure (10-3 torr). Cryopump - To UHV pressure. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Overview of Components The Ellipsometer[1] Usage of p- and s- polarization of the E(Electric)-field. Measurement of Ψ and Δ: Ψ: Magnitude of p- to s- reflectance ratio. Δ: Difference in phase of p- and s- reflection. Ψ and Δ related by reflectance: Optical constants, thickness obtainable with computer using Ψ, Δ. Geometry of an ellipsometric experiment, showing the p- and s- directions [1]J.A.Woollam Co., Inc., Guide to Using WVASE32TM. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Overview of Components (cont.) Sputter Gun We use Mighty MAK 4” from US Inc. Principle of Operation:[2] 1. Under vacuum, fill chamber with noble gas. Our chamber uses Ar. 2. By applying a mostly negative potential (0.5 - 5kV) to the target material, while grounding the outer parts, Ar is positively ionized and bombards the target material, physically knocking the atoms off onto the film. [2] http://www.sputteringmaterials.com/sputtering_technology.htm 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Sputter Gun Mechanism in Vacuum Chamber 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Overview of Components (cont.) Evaporator A 3 boat evaporator using 4 medium current feedthroughs from MDC. Alumina ceramic shields to protect cross-contamination. Principle of Operation: Heating of metallic boats using current; thermally evaporate material. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Overview of Components (cont.) Sample Stage - Hold film. Shutter - Controlled deposition. Crystal Monitor (MaxTek, Inc.) - Measure deposition rate and amount. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Overview of Components (cont.) Oxygen line - UHV leak valve. - Controlled oxidation of sample. Argon line - Gas medium for plasma. - To vent chamber. O2 Ar 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University Ruthenium Thin Film May 3, 2001: Ru sputtered in 1x10-6 torr. Real-time in situ analysis: in HV, Ar venting, atmosphere. Improved Ru optical constants. RuO2 thickness fit. Little apparent oxidation . 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University Current Status Base vacuum pressure- 1.5 x 10-7 torr. Training: Evaporator installed with chromium boat. Bake out and pump down chamber. In situ analysis of chromium. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Comments on Length of Thesis Majority of research was in building the UHV system- over a year. Training purpose: Recording of effort that goes into building a vacuum deposition system. Understanding of procedures and components. Details to clarify possible questions of system. 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University

Joseph Choi, Dept. of Physics, Brigham Young University Credits and Thanks Dr. David Allred J.J. Warriner, Greg Harris Zach Barton, Brian Schramm Department of Physics and Astronomy, Honors Department ORCA, Multi-cultural Scholarship, SPIE 11/17/2018 Joseph Choi, Dept. of Physics, Brigham Young University