IEKP - Universität Karlsruhe (TH)

Slides:

Advertisements

Similar presentations

BarCheck Barcode Validation System BarCheck BarCheck is designed to offer 100% product - barcode inspection via a simple user interface, ensuring:- ~

Advertisements

Unintentional Injury and Violence-Related Behaviors.

, April 9, 2006Václav Vrba, Institute of Physics, Prague 1. Phenix NCC Silicon Pad Sensors produced in ON Semiconductor Lukas Tomasek, Michal Tomasek,

Irradiation Workshop KarlsruheA. Furgeri 1 Irradiation in Karlsruhe The Karlsruhe-Probestations Procedure of Irradiation Results Future annealing.

Probestation 1: 6“ (200mm * 300mm + 360° rotation + 15mm Z) QTC Instruments: HP4274A (LCR), K6517 (electrometer), HP6614C (voltage supply), K595 (quasistatic.

Frank Hartmann Module Construction Meeting1 Analysis on TEC Expressline II modules Two different topics: Strip defects (3 modules) Global IV (2.

Sensor meetingF. Hartmann 1 Status report St & HPK plus add. Scratch tests. IEKP – University of Karlsruhe Frank Hartmann.

Sensor meetingA. Furgeri 1 Status report IEKP – University of Karlsruhe Alexander Furgeri.

ELC 200 DAY 28. Awad –Electronic Commerce 2/e © 2004 Pearson Prentice Hall Agenda Assignment 9 Corrected –2 A’s, 6 B’s, 2 C’s amd 1 F Assignment Avgs.

Inventory Update on RD-50 Silicon Sensors Jeff Wiseman

6/22/2015Tracker Week April 2002IEKP 1 Summary of IQC-workshop IEKP - Universität Karlsruhe (TH)

DAVID M. KROENKE’S DATABASE PROCESSING, 10th Edition © 2006 Pearson Prentice Hall COS 346 Final Day.

ELC 200 DAY 28. Awad –Electronic Commerce 2/e © 2004 Pearson Prentice Hall Agenda Assignment 9 Corrected –2 A’s, 6 B’s, 2 C’s amd 1 F Assignment Avgs.

Test Results Highlighted Material Batches tested 6WA –263(1) 230(1) 265(2) 272(1) 273(3) (3) 305(1) (6) (2) 6WB –278(1) 279(9) 282.

Contraband Detection and Retesting. The Inspection Problem A sensor is a device used to attempt to determine some truth about an object; we will assume.

Sensor meetingA. Furgeri 1 Status report IEKP – University of Karlsruhe Alexander Furgeri.

March 17, 2003 Catania, Meeting ST - CMS CMS Sensor Quality Frank Hartmann – University of Karlsruhe 1 Summary of Sensor Quality Tests List of Problems.

1/13/2004USCMS Tracker Meeting Sergey Korjenevski U of R Status Report IV curve and “second kink” QA stand status - R poly measurement has been debugged.

Elias M. Awad Third Edition ELECTRONIC COMMERCE From Vision to Fulfillment ELC 200 Day 25.

October 7, 2003 US Silicon Tracker group Sergey Korjenevski University of Rochester 1 Quality Assurance Test Stand University of Rochester oQTC at Rochester,

Fifth Grade Indiana Math Standards 5.6.1Explain which types of displays are appropriate for various sets of data. Example: conduct a survey to find the.

Institute of Physics ASCR, Prague Strip Sensors R&D for SCT and ITk Marcela Mikeštíková.

ANALYSIS OF THE PILOT PROGRAM FOR DEVELOPMENTAL ENGLISH January 2014.

Frank Lehner U Zurich Characterization of inner layer sensors DØ Inner Layer Sensor Production Readiness Review FNAL, 8/8/2003 M. Demarteau, R. Demina,

Quality Test of L1 sensors HPK 10 sensors –Tested all, 6 sent to Fermilab – Test structures, HPK 133 L00 CDF ELMA 9 sensors –Tested 6 of 9.

Welcome To Sociology 246: Sociology of Religion Professor: Dr. Richard N Pitt Teaching Assistant: Sammy Shaw

Matthias Bergholz DESY Zeuthen 1 Mpix Sensors.

Whole Numbers and Fractions on the Number Line Lessons 13-1 thru 13-3 Number your paper 1 – 12.

The Chi-Squared test is a general/broad test that is often used to test whether or not two variables are dependent on each other. One of the the two variables.

Status of Hamamatsu Silicon Sensors K. Hara (Univ of Tsukuba) Delivery leakage current at 150V & 350V number of defect channels wafer thickness & full.

We would like for you to take a seat and answer a few questions before your minute to win it challenge! We asked how frequently you traveled and what.

G. Steinbrück 6/21/ Premounting of AOHs for the TEC in Hamburg Georg Steinbrück Hamburg University AOH Meeting, CMS Week 6/21/2005  Status of AOH.

Third Grade Miss. Torres.  Whole Numbers  Solve  Multiplication (x)  Products.

IFR Praha 2004, 16 th April 2004Václav Vrba, Institute of Physics, AS CR 1 Václav Vrba Institute of Physics, AS CR, Prague Silicon sensors status.

Run Iib Workshop Dec 12-13, 2002 Silicon sensors procurement and quality assurance WBS Regina Demina Kansas State University.

Advanced Word Problem Structures First Grade.  Taking Apart Into Three Parts.

C.V. S.W. T.S. L.G. X.S. M.S. IPHC-LBL meeting, January 22, Probe Test Results for 5 wafers of Ultimate-2 sensors Outline:  Yield and wafer.

Textbook Problem Java – An Introduction to Problem Solving & Programming, Walter Savitch, pp.217, Problem 04.

Strasbourg status Ring 7 pilot run François Didierjean.

Chap 7.1 Discrete and Continuous Random Variables.

Notes Over 1.6 Do you feel like it’s hard getting everything working together? Well start focusing on one thing at a time.

Magnification showing pads and “bias ring” First Look at SiD Charge Division Sensors at SCIPP.

GLAST LAT ProjectMarch 24, B Tracker Peer Review, WBS GLAST Large Area Telescope: Tracker Subsystem WBS B: Silicon Strip Detector.

Exam 1. Spring Comparison Spring 2007 A’s 12 8% B’s 25 17% C’s 46 32% Passing 83 57% D’s 34 23% Median 71% Spring 2008 A’s 25 14% B’s 45 27% C’s 38 22%

Electrical characterization results for wafers from different vendors Maria Rita Coluccia December 10, 2001.

Pixel Production Database STATUS P. Netchaeva - INFN Genova 13 February 2003.

Discrete and Continuous Random Variables Section 7.1.

Status of PQC Florence, Strasbourg, Vienna

Testing Goodness of Fit

Recent TOB Developments

US Testing Mailing List

Module production in Italy

Hybrid Testing Status 10 new hybrids brought by Lenny all tested

Socials 10 Story Telling.

CORRELATION BETWEEN LEAKAGE CURRENT AND NOISE

Как да кандидатстваме по НИФ

Understanding Report Cards

TEC module quality overview

Hybrid & Module Testing Status

Hybrid & Module Testing Status

Boggle Review 1) Draw a circle that takes up most of your page but leaves some space on the outside. 2) Inside the circle, list everything you can remember.

Brad Campbell – CS6501 Embedded OS September 10, 2018 Brad Campbell –

The Sheridan-Baker Thesis Machine

ARTIC Industrial Training (AIT) -Advanced Course-

Hybrid & Module Testing Status

Dynamics: Forces and motion in 1D and 2D 3/1/2017

IEKP - Universität Karlsruhe (TH)

- '1:- bs? a ' I.

Welcome to the School year

The assignment of grades in all grades for Texas is a bell curve and shows that the majority of Texas schools earned a C. 62% of schools with less than.

Presentation transcript:

IEKP - Universität Karlsruhe (TH) Status QTC Karlsruhe IEKP - Universität Karlsruhe (TH) 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 OB1 - 50599 Sensors: 02, 05, 07, 09, 10, 12-14, 16, 17, 20, 21, 24 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Optical Inspection 50599 (13): 5 x A, 2 x As (7) 2 x B (2) 1 x C, 1 x Cs (2) 2 x D (2) 4 Rejects ! 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 IV failed 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 CV 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Cc 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Rpoly 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Ileak 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Summary OB1-50599 1 failed due to bad IV ! 13 sensors => 4 failed due to opt. inspection ! 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 OB1 - 48457 Sensors 01, 03, 05, 07-10, 15, 17, 19, 20, 22, 23, 25 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Optical Inspection 48457 (14): 9 x A, 1 x As 3 x B 0 x C 1 x D 1 Reject ! 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 IV failed 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 CV 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Cc 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Rpoly 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Ileak 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Summary OB1-48457 2 failed due to bad IV ! 14 sensors => 1 failed due to opt. inspection ! 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Sensors 01 - 09 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Optical Inspection All grade A ! 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 IV 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 CV 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Cc 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Rpoly 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Ileak 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Summary W3-22003 Everything in specs ! 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 OB1 - 18457 Sensors 2, 3, 6, 8, 12-14, 20, 22, 25 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Optical Inspection 18457 (10): 4 x A* (4) 2 x Bs (2) 3 x D, 1 x Ds (4) * 1x draggeld due to missing protection paper 4 Rejects ! 3 sensors measured: 1 bad IV curve ! 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 OB1 - 18459 Sensors 3-5, 8-10, 12, 16, 18, 20 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Optical Inspection 18459 (10): 6 x A, 1 x As (7) 1 x D, 2 x Ds (3) 3 Rejects ! As or Ds ? 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Optical Impressions 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Optical impressions 11/17/2018 Sensor Meeting - TW Sept. 02

Sensor Meeting - TW Sept. 02 Udep on whole wafer 20V difference on one wafer ! 11/17/2018 Sensor Meeting - TW Sept. 02