MOS Transistor Theory (Deep Submicron Effects)

Slides:



Advertisements
Similar presentations
EE466: VLSI Design Lecture 02 Non Ideal Effects in MOSFETs.
Advertisements

Device models Mohammad Sharifkhani.
Short-channel Effects in MOS transistors
UNIT II : BASIC ELECTRICAL PROPERTIES
Chapter 6 The Field Effect Transistor
Chapter 3 Fabrication, Layout, and Simulation.
Chapter 2 MOS Transistors.
Chapter 3 Differentiation
Lecture 20 OUTLINE The MOSFET (cont’d) Qualitative theory
Lecture 22 OUTLINE The MOSFET (cont’d) MOSFET scaling
© 2010 Pearson Education, Inc. All rights reserved
3: CMOS Transistor Theory
積體電路元件與製程 半導體物理 半導體元件 PN junction CMOS 製程 MOS 元件.
Long Channel MOSFETs.
EE141 Chapter 3 VLSI Design The Devices March 28, 2003.
Modeling Rp B R1 CL A R2 Cint
VLSI System Design Lect. 2.1 CMOS Transistor Theory
Chapter 17 Linked Lists.
Lecture 22 OUTLINE The MOSFET (cont’d) Velocity saturation
Chapter 19 Binary Search Trees.
Chapter 4 Inheritance.
Further Applications of Integration
Chapter 14 Graphs and Paths.
Long Channel MOS Transistors
Lecture 16 ANNOUNCEMENTS OUTLINE MOS capacitor (cont’d)
Lecture #40 OUTLINE The MOSFET: Velocity saturation
Chapter 9 One- and Two-Sample Estimation Problems.
Reading: Finish Chapter 17,
Day 10: September 26, 2012 MOS Transistor Basics
Transistors (MOSFETs)
VLSI Design CMOS Transistor Theory
ECE 875: Electronic Devices
Long Channel MOS Transistors
Chapter 10 Datapath Subsystems.
MOSFETs - An Introduction
11.8 Length of Curves Copyright © 2011 Pearson Education, Inc. Publishing as Pearson Addison-Wesley.
Chapter 18 Bayesian Statistics.
Chapter 20 Hash Tables.
Chapter 2 Limits and Continuity
Copyright © 2011 Pearson Education, Inc
The MOS Transistors, n-well
Chapter 2 – Transistors – Part 2
Searching for Guinea Pig B: Case Study in Online Research
Lecture 3: CMOS Transistor Theory
Channel Length Modulation
Lecture 20 OUTLINE The MOSFET (cont’d) Qualitative theory
Device Performance of Scaled Transistors
CP-406 VLSI System Design CMOS Transistor Theory
EXAMPLE 7.1 BJECTIVE Determine the total bias current on an IC due to subthreshold current. Assume there are 107 n-channel transistors on a single chip,
Lecture 22 OUTLINE The MOSFET (cont’d) MOSFET scaling
Chapter 5 Algorithm Analysis.
Lecture 22 OUTLINE The MOSFET (cont’d) Velocity saturation
Lecture #15 OUTLINE Diode analysis and applications continued
Lecture 3: CMOS Transistor Theory
ECE 875: Electronic Devices
The Facts to Be Explained
ECE 875: Electronic Devices
Lecture 3: CMOS Transistor Theory
Lecture 4: Nonideal Transistor Theory
Introduction: Some Representative Problems
Lecture 4: Nonideal Transistor Theory
Circuit Characterization and Performance Estimation
JFET Junction Field Effect Transistor.
The Classical Model with Many Goods
Copyright © 2004 The McGraw-Hill Companies, Inc. All rights reserved.
Chapter 2 Part 1 Data and Expressions.
Chapter 6 Dynamic Programming.
Chapter 2 Reference Types.
Chapter 4 Greedy Algorithms.
Copyright © 2011 Pearson Education, Inc
Presentation transcript:

MOS Transistor Theory (Deep Submicron Effects) Chapter 2 MOS Transistor Theory (Deep Submicron Effects)

Simplified Transistor Model From TSMC035 N-transistor model User defined VGS = 3V VDS=3V ID= 574 mA VGS = 3V VDS=1V ID= 373 mA VGS = 2V VDS=1V ID= 182 mA VGS = 2V VDS=3V ID= 201 mA Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Lab 2: Transistor Design W= 6l = 1,2mm L=6l = 1,2mm Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Lab 2: Simulated Curves VGS = 2V VDS=1V ID= 95 mA VGS = 2V Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Comparing Model Results Vgs (V) ID (mA) (Vds=1V) ID (mA) (Vds=3V) simulated simplified Error (%) 2V 95 182 92 100 201 101 3V 178 373 109 231 574 111 Being the simulated results quite accurate, the simplified model produces very over-estimated values !! Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Velocity Saturation VDS produces an electric field from Drain to Source In old large transistor technology (large L): Fields are low (remember, for electric field E, potential difference DV and distance d: E=DV/d) Carrier drift velocity is proportional to E. In Deep Submicron Technologies (small L): d is very small, and longitudinal electric field is high Field gets to a critical value, Ecrit, reducing mobility. Carrier drift velocity is not proportional to E anymore; velocity saturates. Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Velocity Saturation (contn´d) Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Traditional vsat model Well before pinch-off (VDS = VGS-VTH), ID reaches to a saturation value due to velocity saturation (vsat is a SPICE technological parameter). Simplifying assumptions are adopted: Velocity saturates abruptly at Ecrit ; vsat= mn.Ecrit VDSAT due to velocity saturation is constant (for any VGS); VDSAT = L.Ecrit = L. vsat /mn If VGS-VTH < VDSAT, saturation occurs by pinch-off (we use the simplified ID saturation equation) If VGS-VTH > VDSAT, saturation occurs by velocity saturation  IDSAT = kn. [(VGS-VTH). VDSAT-VDSAT2 /2] Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Applying vsat model vsat = 1,58 X 105 m/s VDSAT = L. vsat /mn = 1,2x10-6. 1,58 X 105 /421,39X10-4 = 4,49V Observe that for L=1,2mm, since VDSAT is very high, pinch-off (VGS-VTH) will occur first !! But, for L=0,4mm, VDSAT = 1,5 V Therefore, for VGS= 3V, VGS-VTH=2,45V, and pinch-off will not occur since saturation occurs first, for VDS = =VDSAT = 1,5 V Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Applying vsat model (contn´d) Simulation was performed again for W=L=0,4mm In vsat model, vsat = 1,58 X 105 m/s; VDSAT = 1,5 V Vgs (V) ID (mA) (Vds=1V) ID (mA) (Vds=3V) simulated simplified vsat 2V 75 (95) 182 ?? 81 (100) 201 3V 146 (178) 373 159 (231) 574 W=L=1,2mm Observations: Simplified model values are the same as before. Why? For 0,4 mm, LEVEL 53 model shows its effectiveness Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Computing ID by vsat model VDSAT= 1,5V A) VGS-VTH < VDSAT (pinch-off) IDSAT = kn. (VGS-VTH) 2./2 B) VGS-VTH > VDSAT (velocity saturation) IDSAT = kn. [(VGS-VTH). VDSAT-VDSAT2 /2] ( the current is linear to VGS) VGS=2V  VGS-VTH= 1,45V  Case A or B? VGS=3V  VGS-VTH= 2,45V  Case A or B?

Applying vsat model-2 Simulation was performed again for W=L=0,4mm In vsat model, vsat = 1,58 X 105 m/s; VDSAT = 1,5 V Vgs (V) ID (mA) (Vds=1V) ID (mA) (Vds=3V) simulated simplified w/ vsat 2V 75 182 81 201 3V 146 373 159 574 488 Observation: vsat model still over-estimates values of ID Copyright © 2005 Pearson Addison-Wesley. All rights reserved. 2-12

Mobility Degradation Up to now, VDSAT is the same for any VGS Transversal electrical field due to VGS is also critical for Deep Submicron Technologies (vertical dimensions are also small) Relatively high values of transversal electrical field leads to carrier scattering and mobility degradation The values of mn and mp are smaller than the ideal ones These effects are taken into account in the SPICE model LEVEL 53 Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

Empirical a-law model a-law is a simplified empirical model including: Mobility degradation Velocity saturation It is not part of SPICE models ID is given as: 0 (VGS<VTH : cutoff) IDSAT.VDS/VDSAT (VDS<VDSAT : linear) IDSAT (VDS>VDSAT : saturation) IDSAT= Pc.(b/2) .(VGS-VTH)a ; VDSAT= Pv.(VGS-VTH) a/2 Pc, Pv and a are empirically extracted parameters Copyright © 2005 Pearson Addison-Wesley. All rights reserved.

a-law model example Observations: 1. Shockley is the simplified model 2. Values of Pc, Pv and a are not provided in this example Copyright © 2005 Pearson Addison-Wesley. All rights reserved.