San Francisco: Proposed Adjacent Channel Interference Test Methodology May 2005 doc.: IEEE 802.11-05/0451r0 July 2005 San Francisco: Proposed Adjacent Channel Interference Test Methodology Date: 2005-07-18 Authors: Notice: This document has been prepared to assist IEEE 802.11. It is offered as a basis for discussion and is not binding on the contributing individual(s) or organization(s). The material in this document is subject to change in form and content after further study. The contributor(s) reserve(s) the right to add, amend or withdraw material contained herein. Release: The contributor grants a free, irrevocable license to the IEEE to incorporate material contained in this contribution, and any modifications thereof, in the creation of an IEEE Standards publication; to copyright in the IEEE’s name any IEEE Standards publication even though it may include portions of this contribution; and at the IEEE’s sole discretion to permit others to reproduce in whole or in part the resulting IEEE Standards publication. The contributor also acknowledges and accepts that this contribution may be made public by IEEE 802.11. Patent Policy and Procedures: The contributor is familiar with the IEEE 802 Patent Policy and Procedures <http:// ieee802.org/guides/bylaws/sb-bylaws.pdf>, including the statement "IEEE standards may include the known use of patent(s), including patent applications, provided the IEEE receives assurance from the patent holder or applicant with respect to patents essential for compliance with both mandatory and optional portions of the standard." Early disclosure to the Working Group of patent information that might be relevant to the standard is essential to reduce the possibility for delays in the development process and increase the likelihood that the draft publication will be approved for publication. Please notify the Chair <stuart.kerry@philips.com> as early as possible, in written or electronic form, if patented technology (or technology under patent application) might be incorporated into a draft standard being developed within the IEEE 802.11 Working Group. If you have questions, contact the IEEE Patent Committee Administrator at <patcom@ieee.org>. Kobayashi, Trachewsky, Victor, Broadcom Corp Kobayashi, Trachewsky, Victor, Broadcom Corp

ACI Overview System Level Description ACI Test ACI specification May 2005 doc.: IEEE 802.11-05/0451r0 July 2005 ACI Overview System Level Description ACI specification ACI Test Block diagram Calibration ACI Test ACI test procedure ACI test results Kobayashi, Trachewsky, Victor, Broadcom Corp Kobayashi, Trachewsky, Victor, Broadcom Corp

Adjacent Channel Rejection (OFDM) July 2005 Adjacent Channel Rejection (OFDM) In-band signal power level at 3 dB above sensitivity of corresponding data rate Raise interfering signal power level until 10% PER Difference between interfering signal power and in-band signal power must exceed adjacent channel rejection. Std 802.11a-1999 Section 17.3.10.2 Kobayashi, Trachewsky, Victor, Broadcom Corp

Adjacent Channel Rejection (OFDM) July 2005 Adjacent Channel Rejection (OFDM) a b = b + 3 c = b + 3 + c Data Rate (Mbps) Min. sensitivity (dBm) signal level at DUT (in-band) (dBm) Adjacent channel rejection (dB) Signal level at DUT (adjacent channel) (dBm) 6 -82 -79 16 -63 9 -81 -78 15 12 -76 13 18 -77 -74 11 24 -71 8 36 -70 -67 4 48 -66 54 -65 -62 -1 Kobayashi, Trachewsky, Victor, Broadcom Corp

Adjacent Channel Rejection (CCK) July 2005 Adjacent Channel Rejection (CCK) In-band signal power level at -70 dBm for 11 Mbps Raise interfering signal power level until 8% FER Difference between interfering signal power and in-band signal power must exceed 35 dB Std 802.11b-1999 Section 18.4.8.3 Kobayashi, Trachewsky, Victor, Broadcom Corp

July 2005 ACI Block Diagram Mux AP outband Controller Power meter AP inband STA2 outband + STA1 dut inband Atten1 inband Atten2 outband legend: ethernet gpib,dio signal path Kobayashi, Trachewsky, Victor, Broadcom Corp

July 2005 Calibration Mux AP outband Controller Power meter AP inband STA2 outband + STA1 dut inband Atten1 inband Atten2 outband 3 1 2 4 Use a Network Analyzer to take path loss measurements for the DUT path (1), the ACI path (2), DUT to powermeter (3), and ACI path to powermeter (4) Measurements made on center frequencies of channel of interest Kobayashi, Trachewsky, Victor, Broadcom Corp

Basic ACI Test For each desired ACI test point July 2005 Measure power for inband AP and outband AP using a powermeter Adjust attenuators to achieve desired inband AP power to DUT, if possible otherwise abort test run Adjust attenuators to achieve desired outband AP power to DUT, if possible otherwise abort current test point measure the frame error rate (FER) repeat above for each desired ACI test point following guidelines of requirements (Take measurements at a minimum of +/- 5dB around the ACI specification and/or until the FER specified is achieved.) Note each additional point beyond the minimum ACI requirements meeting the Frame Error Conditions is considered the Adjacent Channel Rejection Margin (ACRM) Kobayashi, Trachewsky, Victor, Broadcom Corp

July 2005 ACI test results Frame Error rate versus ACI interferer power for a 54 Mpbs transmission Kobayashi, Trachewsky, Victor, Broadcom Corp