Mastering JMP® Analyzing and Reducing Spatial Defects Michael D. Anderson, Ph.D. JMP Systems Engineer

Working With Spatial Defect Data CASE 1 Working With Spatial Defect Data

Working With Spatial Defect Data Problem: 183,000 individual defect opportunities on our part. Each opportunity has a specific spatial location. Mfg process may produce defect clusters with distinct spatial signatures. Findings: Possible to reduce spatial defect data down to a few key clusters that we can correlate to our process for improvement activities.

CASE 2 Process Improvement

Process Improvement Problem: Findings: Need to isolate a localized defect signature and provide insight back to the engineering community about potential root causes to focus mitigation efforts. Findings: Can correlate the defect signature back to 3 specific process steps within the manufacturing process.

Image Analysis and 3D Reconstruction CASE 3 Image Analysis and 3D Reconstruction

Image Analysis and 3D Reconstruction Problem: Root cause analysis often requires detailed information about a defect and being able to spatially correlate different defects within a part. Finding: A 3D reconstruction of a defect demonstrates that the damage done to the back of the part is spatially related to the defect of interest in the middle of the part.