Automated Testing Environment Concepts required for testing embedded systems adopted in this course (quizzes, assignments and laboratories) 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

To be tackled today Why test, and what kinds of tests are there? Difference between TLD – Test Last Development TDD – Test Driven Development (Test First Development) How do you add tests? More details on the testing process E-TDD and the testing toll E-UNIT Other kinds of available tests – time and access Design of custom TESTs and ASSERTS 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Why test? Unit test I AM CURRENTLY BUILDING A NEW FUNCTION – does it work the way I expect? Testing my and my partner’s understanding of the Design WE ARE DESIGNING A NEW PRODUCT -- If we can’t explain (to ourselves via a test) the product ideas – how do we know when product is working? Regression testing MY PARTNER ADDED A NEW FEATURE to a product – how do I know it did not “break something” I wrote? System testing How do I PROVE TO THE CUSTOMER that the product (Lab. or assignment) works the way that was requested? 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

What are the problems with this sort of “Human intervention” test? This code is placed in Assignments1 directory 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

VisualDSP development environment (IDDE) – Communication overhead Debugging Interface “JTAG” boundary scan operation Processor Peripherals VisualDSP++ program Debugging Interface HPPCIce Lab. station (ICT318 / 320) BF533 Evaluation Board Each time we want to send a message (via printf( ) or cout) we must “stop” the processor from doing what we want it to do, and then send messages over the interface – Slow, plus the testing can impact on peripheral performance. E.g. no sound while doing printing in Assignment 2 and Lab. 1 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

More issues with this sort of test! Tests are mixed up “with production code” Must remove tests before release to customer Unreliable – may result in test messages at wrong time in released code Difficult to “add” and “remove tests” Can’t be automated – therefore unlikely to have tests run often during development – leads to unreliable product 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

E-TDD Tool E-TDD – embedded test driven development Build-the-tests-first (during design) ideas for product development has been made popular by the “Agile” approach Requires an automated testing approach (test framework) In this class, we are going to use the E-Unit tool for its automated behaviour Will use in both “test last” development (what most people currently do) and in “test first” development. I (the customer) will provide tests so that you can check that you have developed the “right” stuff at the “high” level You will build additional tests to check your own code at the “low level” 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Test Environment Can download “LabTestEnvironment.zip” file from the web (Check the September webpages for exact name of file) LabX directory is where you keep your “project” code LabXcode_main.cpp LabX_start.cpp LabX_initializeASM.asm LabXTests is where you keep the tests for LabX LabXtests_main.cpp (built by GUI) Tests_for_LabX_start.cpp Tests_for_LabX_initializeASM.cpp written in C++) E_UnitConnect.cpp (built by GUI) 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Build a new VDSP project “Assignment1Test” and place in “AssignmentTests” directory Now add certain standard files to the project Same set of files for all assignments and laboratory Use the automated features of the GUI to “convert” VDSP project to test project 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Now add your Assignment1 subroutines files to the Assignment1Test project Don’t move or copy the files into the test directory – just “add” them to the project Note the use of “Assignment1.h” which has the prototypes for all “C++” and “assembly code” functions used (from Assignment dir.) This files are “added” to the “Test” project and NOT copied from the Assignment1 directory 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

The GUI has automatically added the “Tests_main.cpp” 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

The GUI has automatically added a “TestGroup” file for you 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Modify “Assignment1Tests.cpp” to perform the needed testing 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Tests and Test Groups have a standard format TESTGROUP NAME TEST NAME Add further tests at this location TESTGROUP NAME, 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Tests then need to be customized A lot of this can be automated by GUI 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Test Components Remember format for “exams” and “quizzes” The ACTUAL Test (This is a TEST MACRO) CHECK(result1 == result2) Would provided better test messages if we “self-documented the code” int result1_CPP = int result2_ASM = CHECK(result_CPP == result_ASM); Test CONTROL statements (ALL MACROS) TEST_CONTROL( testgroup_name) TEST_FILE_RUN_NOTIFICATION( testgroup_name) 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Have added stub versions of functions Note “code DEFECT” There is NO return value placed in R0 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Now build source files to make executable 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada Note the format of the error messages.

Fix the code. Review the code for syntax errors and “logical” errors DON’T IGNORE WARNINGS 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Now “build and run” the tests All the tests should fail (no code) Quick test failure visualization Detailed test failure information 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Now “build and run” the tests All the tests should fail (no code) Quick test failure visualization Clicking on the “detailed test info” automatically takes you to the “test” that failed Detailed test failure information 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

The test that failed Clicking on the “detailed test info” automatically takes you to the “test” that failed 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Test information modes are controlled in “Test_main” Show Failures and Expected Failures only Show Failures and Successes 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Add further tests at this location Add a separate test to show that result2 (from the ASM code) is equal to 42 Add further tests at this location 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Gui automatically adds new test 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Write the tests for “self-documenting” messages (What does “result1 == result2” mean if 200 tests present?) HAVE WANT 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Write the “CPP” code to get to work but “Write the ASM for speed” “../E-UNITIncludes/E-UNIT_Tests1Sept07.h” FAIL SUCCESS SUCCESS 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Get a “Volun-tell” to come to the front and write the “better” test 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Available ASSERTS More can be “customized” CHECK(expected == actual) – Success if passes XF_CHECK(expected == actual) – Success if “fails” CHECK_EQUAL(expected, actual) XF_CHECK_EQUAL(expected, actual) – Success if fails CHECK_CLOSE(expected, actual, tolerance) CHECK_ARRAY_EQUAL(expected, actual, length) CHECK_ARRAY_CLOSE(expected, actual, length, toler) REPORT(“character message”); 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

Handled today – some easy “non-programming” quiz and midterm questions Why test, and what kinds of tests are there? Difference between TLD – Test Last Development TDD – Test Driven Development (Test First Development) How do you add tests for Assignment 1? More details on the testing process E-TDD and the testing tool E-UNIT Other kinds of available tests – time and access Design of custom TESTs and ASSERTS 11/24/2018 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada