US Testing Mailing List UC-Riverside Gale Hanson Patrick Gartung UCSB Joe Incandela Claudio Campagnari Anthony Affolder Russell Taylor Jim Lamb Brad Patterson Sam Burke Derek Barge Chris McGuinness Lance Simms UIC Elizabeta Chabalina Timour Ten KU Alice Bean Don Coppage Len Chistofek FNAL Lenny Spiegel Nicola Bacchetta Slawek Tkaczyk Anatoly Ronzhin UR Paul Tipton Regina Demaria Sergey Korjenevski Ricardo Eusebi Daniel Schwaab E. Groves

New Web Pages http://hep.ucsb.edu/cms/UStesting.html All papers (& drafts) All talks (Tracker/CMS, reviews, …) Testing Procedures Test Results (Updated Bi-weekly) Test Equipment (Updated Regularly) Readiness of stands (Updated Regularly) Name List Hyper-news http://hep.ucsb.edu/cms/US_silicon_info.html Paper draft & comments Testing Results Sensor re-probing info CMN module info

Testing Results Send updates bi-weekly (Monday prior to meeting) Modules Summary Module ID, Module Type, Sensor IDs, grade, # bad channels, # bad channels introduced, # sensor bad channels, # hybrid bad channels Table/histogram of sensors used by production year-week for OB1,OB2 CMN modules Module ID, CMN Sensor ID, Depletion Voltage, Turn-on Voltage, Bad Channel, Ratio (Turn-on/Dep) I @450V (measured), I @450V (predicted) IV curves Measured, Expected (Re-probed), Expected (Sensor DB) Raw Noise vs. Voltage CMN Subtracted Noise vs. Voltage

Turn-on/Depletion Voltage CMN Module Table Module Current (450V) Channel Affected Sensor Affected Turn-on Voltage Depletion Voltage Turn-on/Depletion Voltage 869 1230 29-30 30210414308316 400 247 1.619433198 871 11800 181 30210421626813 120 152 0.789473684 873 2485 14 30210421626701 185 2.162162162 881 18400 438-440 30210414308412 30 201 0.149253731 1010 8200 481 30210422067822 250 173 1.445086705 1011 22070 505 30210422066212 150 212 0.70754717 1013 310000 85-88 30210422066213 100 266 0.37593985 1014 25200 96 30210422066501 187 0.802139037 1015 151000 354-355 30210422066204 80 218 0.366972477 1016 262400 38 30210422066202 50 208 0.240384615 1030 32050 308 30210420383228 168 0.892857143 1031 20165 336 30210415061806 251 0.597609562 1038 6800 244-245 30210414843020 0.996015936 1042 6570 7-10 30210414845823 159 2.51572327 1051 2700 423-424 30210320274214 171 2.339181287 20516 12700 95 ?????????????? 0.333333333

CMN Module Figures

Testing Results (2) Sensor Re-probing Sensor ID, I @V=450 (Re-probe), I @V=450(Sensor QTC), DI(Re-probe-Sensor QTC) Table with Sensor Year-Week, # Probed, # DI > 1.5 mA, # DI > 5 mA IV curves of all sensors with DI > 1.5 mA

Sensor Re-probing Summary Table Sensor Week Number Tested >1.5 mA >5 mA % >1.5 mA % >5 mA 143 2 0.0% 147 9 1 11.1% 148 31 4 3 12.9% 9.7% 150 18 202 20 5.0% 203 28 3.6% 208 11 216 8 218 6 220 13 15.4% 7.7% 238 6.5% 239 17 5.9% 241 26 316 5 40.0% 20.0% 318 323 16 327

Testing Equipment I will keep list of testing equipment needs per site ARCS, DAQ module, DAQ rod I need an e-mail for every shipment of testing equipment to/from/within US I need a physical inventory performed at FNAL/UCSB to confirm current inventory I will update inventory on web bi-regularly Including list of stuff on-order/shipped I need update on status of test stations regularly Status, problems seen, components needed