ATML ATML’s mission is to define a collection of XML-based schemas and services that allows ATE and test information to be exchanged in a common format adhering to the XML standard ATML defines a framework through which different architectures using XML can be implemented. defines the components from which users can build their architectures, whilst being interoperable with other compliant architectures. defines the format of the net centric services by which this information can be exchanged across different ATS platforms as part of a maintenance process defines the XML format that these elements will take. The ATML specifications will define: How to define XML schemas that represent ATE and test information A set of XML schemas supporting the exchange of specific ATE and test information How to define services that can be used for exchanging ATE and test information in a distributed net-centric environment. A set of services supporting the exchange of specific ATE and test information in a distributed net-centric environment

ATML Initiative ATML Framework ATML Framework (Web) Services Instrument Description Test Station Test Adaptor UUT Data Test Configuration Diagnostics Test Description Test Program Test Results Not Included Not Started Started Draft Candidate

SCC20 & ATML Organisations The IEEE SCC20 is the standards organisation through which the ATML components will be published under various IEEE standards. The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML. The ATML group provides draft documents and schemas, examples, use cases, requirements and trials any ATML components Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components ATML organisation prepares documents for ballot and submits draft standards into IEEE SCC20

SCC-20 ATML PARs Status Project Authorisation Request (PAR) need to be approved by the IEEE NESCOM prior to any SCC-20 working group being established. ATML Framework PAR 1671 Approved Diagnostics PAR 1232 Existing Test Results PAR 1636.1 Approved Test Description PAR Review SCC20 Apr 2005 Instrument Description PAR Review SCC20 Apr 2005 UUTData – PAR Review April 2006 Test Configuration - PAR Review April 2006 Test Station &Test Adapter - PAR Review April 2006

IEEE SCC-20 TII - Annual Report Objectives and Goals for the Current Year. The Goal of the TII Subcommittee is to have the P1671 standard written, reviewed and a ballot called by mid-2006, in order to be in a position to submit as a standard by Q4 2006 Objectives and Goals for past year and the subcommittee's performance relative to them. Not Applicable - The TII sub-committee was only re-established this year 2005 Current area(s) of activity with milestones indicated. IEEE P1671 - Standard Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML Initial Draft Content: 2005-05 (Par:2005-05) TII Draft Review: 2005-10 (new activity) Date of Submission for Initial Sponsor Ballot: 2006-05 (Par: 2005-10) Projected Completion Date for Submittal to RevCom: 2006-10 (Par: 2006-04) Meeting schedule with location, 1 year back and 1 year projected. Sept 2004 - San Antonio, TX - TII Subcommittee created April 2005 - Bath UK Sept 2005 – Orlando, FL (Coincide with ATC)

ATML/IEEE Schedule TII Sub-committee ATML Framework Test Results Operating Instructions (April 2005) ATML Framework IEEE Par Approved (Nov 2004) ATML Framework Draft (Review April 2005) ATML Framework Requirements (Review April 2005) ATML Framework Candidate (Oct 2005) ATML Framework Ballot (May 2006) Test Results ATML Candidate (Dec 2004) PAR Approved (Mar 2005) DMC Requirements Document (Review April 2005) 1636.1 Draft (Review April 2005) Test Results Ballot (July 2005) Diagnostics AI-Estate Amendment (Sept 05) P1636 SIMICA Draft (May 2005) Diagnostic Candidate (Sept 2005) Ballot (Jan 2007)

ATML Schedule (New SCC-20 Components) Test Description Draft Schema review (July 2005) Candidate Schema (Jan 2006) PAR (Oct 2005) Ballot Date (Jan 2007) Instrument Description Ballot Date (May 2007) UUT Description Requirements (April 2005) Draft Schema (Review June 2005) Ballot Date (2007) Test Configuration Start (April 2005) Requirements (July 2005) Draft Schema (Oct 2006) Ballot date (2008) Test Station & Test Adapter