Radiation hardness of fully depleted

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Presentation transcript:

Radiation hardness of fully depleted ADvanced MOnolithic Sensors for Radiation hardness of fully depleted CMOS Monolithic Active Pixel Sensors Tobias Bus, Benjamin Linnik, Michael Deveaux Hey gays,

MAPS – Monolithic Active Pixel Sensors MimoSIS design goals: MIMOSIS – Expected performance CMOS Process Tower/Jazz 0.18 µm Quad-Well Pixel dimensions 30.1 x 26.9 µm² Spatial resolution ~ 5µm Material budget 50 µm Si (0.05 % X0) Radiation tolerance > 3Mrad (@-20°C). > 3x1013neq/cm² The CBM-MVD T. Bus, DPG 2017, Münster

MAPS – Monolithic Active Pixel Sensors Reset +3.3V Output SiO2 SiO2 SiO2 N++ N++ N+ P+ 50µm P- 15µm Übergang verbessern zu dieser Folie. Um Ergebnisse zu verstehen Funktionsweise. E-Feld einführen.- P+ T. Bus, DPG 2017, Münster

Effects of non-ionizing radiation Readout Readout Trapping & recombination of signal electrons Diode Leakage current → higher noise Cooling decreases this effect e- e- e- Detecting layer Non-ionizing radiation Energy deposition into the crystal Particle Defects due to radiation Defect states in the crystal structure Absorption nicht, recombination and generation centers. Singalladung verlieren, Thermische rauschen als effektals One major weak point of CMOS sensors regarding non-ionizing radiation is the slow diffusion of charge as non-ionizing radiation creates defects in the epitaxial layer, which become recombination centres for the signal electrons. After recombination, signal electrons become unavailable for the charge collection. If the charge is collected trough diffusion, it has a longer path until it is collected in the diode and therefore a higher chance of being absorbed before detected. Depleting the sensor allows to accelerate the charge collection. => More radiation tolerance. T. Bus, DPG 2017, Münster

Pipper – 2: A fully depleted HR-MAPS Issue: Standard CMOS restricted to few volts => Too few for full depletion. Analysis: Restriction due to transistor gates. Diodes and metal lines tolerate higher voltages. Approach: Use AC-couping to separate vulnerable transistors from HV on diode. Depletion voltage up to 40V possible. Apply to 22x22 µm2 pixels. Standard pixel Pipper - 2 T. Bus, DPG 2017, Münster

Standard sensor – Test results Fe-55 Epi-layer Depleted volume Depleted volume Epi-layer Standard sensor – Only few hits from depleted volume. Other hits: Reduced amplitude (charge sharing). T. Bus, DPG 2017, Münster

Pipper – 2 – Test results Hits mostly in depleted volume peak. No modification for >20V => indicator for full depletion T. Bus, DPG 2017, Münster

Vllt keine zeit dafür? Standard sensor Pipper - 2 Epi-layer Depleted volume 20V Pipper - 2 Depleted volume T. Bus, DPG 2017, Münster

Test with 90Sr beta rays 1290e 860e S/N (Sr-90) >15  typically > 99% MIP - efficiency Zeit lassen beim erkären. Plots erklären, Charge Spektrum erklären. MPV,. T = -55° C Signal MPV (e) Avg. noise (e) S/N 1013neq/cm2 1290 23.19 55.6 5·1014neq/cm2 860 27.48 31.3 T. Bus, DPG 2017, Münster

Summary and conclusion Radiation tolerance (MIMOSA-series) This work A CMOS sensor allowing for 40V depletion voltage in Tower/Jazz 0.18µm has been built and tested. Results suggest full depletion. Laboratory tests suggest tolerance to >5 x 1014 neq/cm². (Remaining S/N>30 if cooled). T. Bus, DPG 2017, Münster