ICDD Release 2008 New Features

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Presentation transcript:

ICDD Release 2008 New Features PDF-4+ Using DDView+ 2008 PDF-2 Using DDView 2008

New Features The 2008 release of ICDD databases boasts an impressive array of new features. This presentation will demonstrate many of these new features using DDView+ 2008 and DDView 2008, ICDD’s own data-mining software. This year, ICDD has: Increased the power of the user-interface Added new data and functionality Optimized searching operations Enhanced the performance of graphics

Alphabetical Prototype Structure Search The Prototype Structure searches now include the option of searching on alphabetically ordered formulas Alphabetical order

Alphabetical Prototype Structure Fields Alphabetically ordered Prototype Structures are now shown on the PDF Card Alphabetically ordered

New Display Fields* The Search Results form has four new display fields, giving a total of 70 Ambient/Non-ambient: The ambient or non-ambient conditions under which the pattern was created Has Atomic Coordinates: Whether or not the pattern contains atomic coordinate data Prototype Structure (Alpha Order): The alphabetically ordered Prototype Structure LPF Prototype Structure (Alpha Order): The alphabetically ordered LPF Prototype Structure *PDF-4 only

Enhanced Search Results Table Abbreviated data has tooltips Overflowing data shows ellipses “…” Database Comments use scrollbars* Ellipses Tooltip Scrollbar *PDF-4 only

Graph Individual Elements* The Graph Fields form can now graph individual element composition for Weight % and Atomic % display fields Graph Zn elements Select individual element *PDF-4 only

Graph Individual Elements* This is an example of the Graph Fields form, graphing the Author’s Cell a versus weight % of the element Zn Likely concentration of Zn is 15% if a=3.640Å *PDF-4 only

Clickable X-Y Graph Points PDF Cards and Diffraction Patterns* can now be opened in the Graph Fields form using the X-Y points Click X-Y points with mouse Select an area of X-Y points with mouse Select area for PDF Cards or Diffraction Patterns Click for PDF Cards or Diffraction Patterns *PDF-4 only

Footnotes for d-Spacings The * field, or Footnotes for d-Spacings field, has been added to the PDF Card d-Spacings table This field shows a number index for a d-Spacing that corresponds to an editor comment Simply match the number index in the * field with the number index in the Database Comments field

Button for full PD3 pattern PD3 Patterns* PD3 patterns are now available for over 2,600 entries, including 44 clay materials PD3 patterns are experimental powder diffraction raw data for selected: Nano-crystalline materials Semi-crystalline materials Amorphous materials Button for full PD3 pattern PD3 pattern preview *PDF-4 only

PD3 Patterns* Kaolinite-1A, a clay PD3 pattern *PDF-4 only

Enhanced Diffraction Patterns* The graphing package has been upgraded for increased speed Average Energy value is now available for Experimental and Calculated Pattern radiation Average Energy *PDF-4 only

Enhanced Electron Patterns* The Simulated Electron Patterns now show the approximate intensity via the size of the spot *PDF-4 only

Import Experimental Data in PDF-2 Importing experimental data into SIeve, ICDD’s search-index plug-in, is now available in DDView 2008 using PDF-2 2008 These experimental data operations are now available: Remove background Smoothing Peak finding

New SIeve Display Fields To increase the functionality of the SIeve Matches table, three new display fields have been added Quality Mark: A flag representing the quality of the pattern Status: A flag representing the database status of the pattern (Primary, Alternate, or Deleted) Atomic Coordinates*: Whether or not the pattern contains atomic coordinate data *PDF-4 only

International Centre for Diffraction Data Thank you for viewing our tutorial. Additional tutorials are available at the ICDD web site (www.icdd.com). International Centre for Diffraction Data 12 Campus Boulevard Newtown Square, PA 19073 Phone: 610.325.9814 Fax: 610.325.9823