Acceptance Corrections: Bin-by-Bin Method vs. Matrix Conversion Method

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Presentation transcript:

Acceptance Corrections: Bin-by-Bin Method vs. Matrix Conversion Method Nikolay Markov, Brandon Clary and Kyungseon Joo University of Connecticut CLAS Collaboration Meeting March 8, 2018

Acceptance Corrections Unfold true distributions from measured distributions

Acceptance Corrections Bin-by-bin method Di = Ai Ti Di is # of measured events in i-th bin Ti is # of true events in i-th bin Ai is the acceptance of i-th bin where Ai = NREC / NGEN for i-th bin 2. Matrix Method Di = ∑Mij Tj Mij is the acceptance matrix where 𝑴 𝒊𝒋 = 𝑵 𝑹𝑬𝑪 𝒊 / 𝑵 𝑮𝑬𝑵 𝒋

Bin-by-Bin Method Di = Ai Ti Di is # of measured events in i-th bin Ti is # of true events in i-th bin Ai is the acceptance of i-th bin where 1. 𝑨 𝒊 = 𝑵 𝑹𝑬𝑪 / 𝑵 𝑮𝑬𝑵 for i-th bin 2. 𝑨 𝒊 = 𝑴 𝒊𝒊 from 𝑴 𝒊𝒋 = 𝑵 𝑹𝑬𝑪 𝒊 / 𝑵 𝑮𝑬𝑵 𝒋

3 Simple Event Generators (Inclusive scattering) Beam energy: 10.6 GeV W flat, [1.0: 5.0] GeV Electron lab f angle flat, [0: 360] degrees Q2 [1.0: 10.0] GeV2 Flat 1/ Q4 sin(2*Q2) + 1.5

Generated Events

Simulation and reconstruction GEMC 4a.2.1 Coatjava 4a.8.3 Torus - 100% Solenoid - 100% MICROMEGAS in Electron PID: EB electron id Fiducial cut

Fiducial Cut

Resolutions W Q2 sQ2 = 0.02 GeV2 sW = 10 MeV

Acceptances and Purity 𝐴𝐶𝐶 𝑇 = 𝑁 𝑟𝑒𝑐 𝑁 𝑔𝑒𝑛 = 𝑁 𝑟𝑒𝑐 𝑔𝑒𝑛 + 𝑁 𝑟𝑒𝑐 𝑚𝑖𝑔𝑟𝑎𝑡𝑒𝑑 𝑁 𝑔𝑒𝑛 : Total acceptance 𝐴𝐶𝐶 𝑃 = 𝑁 𝑟𝑒𝑐 𝑔𝑒𝑛 𝑁 𝑔𝑒𝑛 : Pure acceptance 𝐴𝐶𝐶 𝑀 = 𝑁 𝑟𝑒𝑐 𝑚𝑖𝑔𝑟𝑎𝑡𝑒𝑑 𝑁 𝑔𝑒𝑛 : Migrated acceptance 𝐴𝐶𝐶 𝑇 = 𝐴𝐶𝐶 𝐺 + 𝐴𝐶𝐶 𝑀 𝑃𝑢𝑟𝑖𝑡𝑦 = 𝑁 𝑟𝑒𝑐 𝑔𝑒𝑛 𝑁 𝑟𝑒𝑐 = 𝑁 𝑟𝑒𝑐 𝑔𝑒𝑛 𝑁 𝑟𝑒𝑐 𝑔𝑒𝑛 + 𝑁 𝑟𝑒𝑐 𝑚𝑖𝑔𝑟𝑎𝑡𝑒𝑑

Acceptances vs. Models sQ2 = 0.02 GeV2 𝐴𝐶𝐶 𝑇 = 𝑁 𝑟𝑒𝑐 𝑁 𝑔𝑒𝑛 𝐴𝐶𝐶 𝑇 = 𝑁 𝑟𝑒𝑐 𝑁 𝑔𝑒𝑛 10.0 𝐴𝐶𝐶 𝑃 = 𝑁 𝑟𝑒𝑐 𝑔𝑒𝑛 𝑁 𝑔𝑒𝑛 𝐴𝐶𝐶 𝑀 = 𝑁 𝑟𝑒𝑐 𝑚𝑖𝑔𝑟𝑎𝑡𝑒𝑑 𝑁 𝑔𝑒𝑛

Purity vs. Models sQ2 = 0.02 GeV2 10.0 𝑃𝑢𝑟𝑖𝑡𝑦 = 𝑁 𝑟𝑒𝑐 𝑔𝑒𝑛 𝑁 𝑟𝑒𝑐

Purity vs. Acceptances sQ2 = 0.02 GeV2 10.0

Iterative Unfolding using Bin-by-Bin Method N Iterative Unfolding using Bin-by-Bin Method N. Harrison PhD Thesis for pion SIDIS

Bin Size Matters Large bin size may result in a loss of sensivity to high frequency components or acute changes. Small bin size may create high sensitive to bin migrations and event generator dependence.

where 𝑀 𝑖𝑗 = 𝑁 𝑅𝐸𝐶 𝑖 / 𝑁 𝐺𝐸𝑁 𝑗 Matrix Method Di = ∑Mij Tj where 𝑀 𝑖𝑗 = 𝑁 𝑅𝐸𝐶 𝑖 / 𝑁 𝐺𝐸𝑁 𝑗

Metrix Method 10 Bins

Metrix Method 50 Bins

Summary We showed that acceptance is sensitive to event generator models due to bin-migrations even for binnings with much larger than tracking resolution bin sizes. We need to avoid bins with very low purity values to minimize systematic errors. We showed that matrix conversion method is less sensitive to event generator models due to bin-migrations, but it is difficult to implement it for multi-dimensional analysis.

Generated Events vs. Reconstructed Events