Characterization of polycrystalline diamond films grown by MWPECVD for UV radiation detection Presenter: M.F. Muscarella Dipartimento Interateneo di.

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Presentation transcript:

Characterization of polycrystalline diamond films grown by MWPECVD for UV radiation detection Presenter: M.F. Muscarella Dipartimento Interateneo di Fisica dell'Università e Politecnico di Bari, Via G. Amendola 173, 70126 Bari, Italy muscarella@fisica.uniba.it A full characterization of selected PolyCrystalline Diamond (PCD) films grown by MicroWave Plasma Enhanced Chemical Vapor Deposition (MWPECVD) suitable for UV radiation detectors has been performed. Dark current-voltage and impedance measured on two early grown diamond films have been found to be dependent on the grain size and of the quality of investigated films. A standard charge PA allows to perform sensor optical characterization.

Preliminary results Dark currents Impedance measurements Optical Response