Improving the Electron Microscope So we can see just a few more nanometers
Electron Optics Based on the principles of DeBroglie Electrons and other particles have wave properties Magnetic fields are analogous to optical lenses
Basics of Electron Microscopy
Types of Electron Microscopes Scanning Electron Microscope (SEM) Tunneling Electron Microscope (TEM) Scanning Transmission Electron Microscope (STEM)
Limitations Target sample must be modified to maintain in a high vacuum Target sample must be conductive. Electron Scattering
Causes of Poor Resolution General Electron Diffraction Electro-Optical Aberrations
Fixing Diffraction Quite simple… It actually doesn’t need a whole slide to explain.
Scherzer ‘s Theory Non trivial Scherzer’s Theory states that aberration will always occur if the following conditions are met: (i) There is a rotationally symmetrical lens present (ii) The beam is acted upon by a static field (iii) The beam does not reverse its velocity
Correcting Electro-Optical Aberrations 1995 Researchers Have worked on Breaking symmetry on lenses. Resolution improved from 20nm to about 6nm by 1995 Today We can achieve about .075nm resolution
Correcting Electro-Optical Aberrations
Correcting Electro-Optical Aberrations Time varying Fields Very complicated dealing with complex analysis As of now, no one has been able to decrease aberration by implementing a time varying field
Ende’