Session 1A at am MEMCON Detecting and Mitigating

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Presentation transcript:

Session 1A at 11.20 am MEMCON Detecting and Mitigating Data-Dependent DRAM Failures by Exploiting Current Memory Content Samira Khan Chris Wilkerson, Zhe Wang, Alaa Alameldeen, Donghyuk Lee, Onur Mutlu

VISION: SYSTEM-LEVEL DETECTION AND MITIGATION Unreliable DRAM Cells Detect and Mitigate Reliable System Detect and mitigate errors after the system has become operational ONLINE PROFILING

BENEFITS OF ONLINE PROFILING Technology Scaling Reliable DRAM Cells Unreliable DRAM Cells Improves yield, reduces cost, enables scaling Vendors can make cells smaller without a strong reliability guarantee

BENEFITS OF ONLINE PROFILING LO-REF HI-REF LO-REF HI-REF LO-REF Unreliable DRAM Cells Reduce refresh count by using a lower refresh rate, but use higher refresh rate for faulty cells 2. Improves performance and energy efficiency Reduce refresh rate, refresh faulty rows more frequently

DETECTION IS HARD DUE TO INTERMITTENT FAILURES DATA-DEPENDENT FAILURE 1 NO FAILURE 1 FAILURE Some cells can fail depending on the data stored in neighboring cells

HOW TO DETECT DATA-DEPENDENT FAILURES? Test with specific data pattern in neighboring cells 1 L D R LINEAR MAPPING X-1 X X+1

HOW TO DETECT DATA-DEPENDENT FAILURES? Test with specific data pattern in neighboring cells 1 L D R LINEAR MAPPING X-1 X X+1

HOW TO DETECT DATA-DEPENDENT FAILURES? Test with specific data pattern in neighboring cells 1 L D R LINEAR MAPPING X-1 X X+1 1 1 SCRAMBLED MAPPING X-1 X X+1

HOW TO DETECT DATA-DEPENDENT FAILURES? Test with specific data pattern in neighboring cells 1 L D R LINEAR MAPPING X-1 X X+1 NOT EXPOSED TO THE SYSTEM 1 1 SCRAMBLED MAPPING X-4 X X+2

MEMCON 65%-74% 40%-50% Detects data-dependent failures 1 SCRAMBLED MAPPING X-? X X+? Detects data-dependent failures without the knowledge of the DRAM internal address mapping 65%-74% Reduction in refresh count 40%-50% Performance improvement using 32Gb DRAM

Session 1A at 11.20 am MEMCON Detecting and Mitigating Data-Dependent DRAM Failures by Exploiting Current Memory Content Samira Khan Chris Wilkerson, Zhe Wang, Alaa Alameldeen, Donghyuk Lee, Onur Mutlu