Chis status report.

Slides:



Advertisements
Similar presentations
VLSI Design EE 447/547 Sequential circuits 1 EE 447/547 VLSI Design Lecture 9: Sequential Circuits.
Advertisements

Introduction to Sequential Logic Design Latches. 2 Terminology A bistable memory device is the generic term for the elements we are studying. Latches.
MICROELETTRONICA Sequential circuits Lection 7.
Latches CS370 –Spring 2003 Section 4-2 Mano & Kime.
Sequential Circuits. Outline  Floorplanning  Sequencing  Sequencing Element Design  Max and Min-Delay  Clock Skew  Time Borrowing  Two-Phase Clocking.
Local Trigger Control Unit prototype
SKIROC New generation readout chip for ECAL M. Bouchel, J. Fleury, C. de La Taille, G. Martin-Chassard, L. Raux, IN2P3/LAL Orsay J. Lecoq, G. Bohner S.
The NO A APD Readout Chip Tom Zimmerman Fermilab May 19, 2006.
Design and Implementation a 8 bits Pipeline Analog to Digital Converter in The Technology 0.6 μm CMOS Process Eri Prasetyo.
Flip-Flops Module M10.2 Section 7.1. D Latch Q !Q CLK D !S !R S R X 0 Q 0 !Q 0 D CLK Q !Q Note that Q follows D when the clock in high, and.
Latches Section 4-2 Mano & Kime. Sequential Logic Combinational Logic –Output depends only on current input Sequential Logic –Output depends not only.
DEVELOPMENT OF A READOUT SYSTEM FOR LARGE SCALE TIME OF FLIGHT SYSTEMS WITH PICOSECOND RESOLUTION Considerations and designs for a system of tdc’s with.
Tera-Pixel APS for CALICE Progress 19 th January 2007.
Large Area, High Speed Photo-detectors Readout Jean-Francois Genat + On behalf and with the help of Herve Grabas +, Samuel Meehan +, Eric Oberla +, Fukun.
August SGSS front end, Summary August 2008 Edwin Spencer, SCIPP1 SGST Preview SCIPP, UC Santa Cruz Andrey Martchovsky Gregory Horn Edwin Spencer.
8-Bit Gray Code Converter
Flip-Flops and Related Devices
NA62 front end Layout in DM option Jan Kaplon/Pierre Jarron.
TOT01 ASIC – First Results (STS prototype chip – first results) Krzysztof Kasiński, Paweł Gryboś,Robert Szczygieł
555 Timer ©Paul Godin Updated February Oscillators ◊We have looked at simple oscillator designs using an inverter, and had a brief look at crystal.
Counter Section 6.3.
Various Topics Related to FEB Liang Han, Ge Jin University of Science and Technology of China Dec.21,2013.
Development of a 20 GS/s Sampling Chip in 130nm CMOS Technology Jean-Francois Genat On behalf of Mircea Bogdan 1, Henry J. Frisch 1, Herve Grabas 3, Mary.
TOF Electronics Qi An Fast Electronics Lab, USTC Sept. 16~17, 2002.
MB, 9/8/041 Introduction to TDC-II and Address Map Mircea Bogdan (UC)
Sakari tiuraniemi - CERN Status of the submission – End of Column.
Analog to Digital Converters (ADC) 1
MR (7/7/05) T2K electronics Beam structure ~ 8 (9?) bunches / spill bunch width ~ 60 nsec bunch separation ~ 600 nsec spill duration ~ 5  sec Time between.
P. Baron CEA IRFU/SEDI/LDEFACTAR WORKSHOP Bordeaux (CENBG) June 17, Functionality of AFTER+ chip applications & requirements At this time, AFTER+
1 ACES Workshop, March 2011 Mark Raymond, Imperial College. CMS Binary Chip (CBC) status 130nm CMOS chip for short strip readout at sLHC contents introduction.
January 22, 1999SciFi L1 Trigger Review 1 Analog Hardware Front-end Board (CTT_FE) –Transmit (and split) the VLPC signal to the Multi-chip Modules –Discriminate.
Front End Circuit.. CZT FRONT END ELECTRONICS INTERFACE CZTASIC FRONT END ELECTRONICS TO PROCESSING ELECTRONICS -500 V BIAS+/-2V +/-15V I/O signal.
Features of the new Alibava firmware: 1. Universal for laboratory use (readout of stand-alone detector via USB interface) and for the telescope readout.
1 A High-Speed and Wide Detectable Frequency Range Phase Detector for DLLs Babazadeh, H.; Esmaili, A.; Hadidi, K.; NORCHIP, 2009 Digital Object Identifier:
March 9, 2005 HBD CDR Review 1 HBD Electronics Preamp/cable driver on the detector. –Specification –Schematics –Test result Rest of the electronics chain.
Sampling chip psTDC_02 Jean-Francois Genat – Herve Grabas Mary Heinz – Eric Oberla 1/27/ psTDC_02 presentation.
17-19/03/2008 Frédéric DULUCQ Improvements of ROC chips VFE - ROC.
Click to edit Master subtitle style Presented By Mythreyi Nethi HINP16C.
VMM Update Front End ASIC for the ATLAS Muon Upgrade V. Polychronakos BNL RD51 - V. Polychronakos, BNL10/15/131.
- Herve Grabas - Ecole Superieure d’Electicite 1 Internship presentation - University of Chicago – 3 sept
Technical status of the Gossipo-3 : starting point for the design of the Timepix-2 March 10, Vladimir Gromov NIKHEF, Amsterdam, the Netherlands.
Low Power, High-Throughput AD Converters
ASAD Workshop Saclay (CEA Irfu) November 25, AGET circuit: Application Information actar.
GOSSIPO-3: Measurements on the Prototype of a Read- Out Pixel Chip for Micro- Pattern Gas Detectors André Kruth 1, Christoph Brezina 1, Sinan Celik 2,
The AGET chip Circuit overview, First data & Status
OMEGA3 & COOP The New Pixel Detector of WA97
Jinfan Chang Experimental Physics Center , IHEP Feb 18 , 2011
LHC1 & COOP September 1995 Report
VMM ASIC ― Status Report - April 2013 Gianluigi De Geronimo
Integrated Circuits for the INO
ETD meeting Electronic design for the barrel : Front end chip and TDC
From SNATS to SCATS C. Beigbeder1, D. Breton1,F.Dulucq1, L. Leterrier2, J. Maalmi1, V. Tocut1, Ph. Vallerand3 1 : LAL Orsay, France (IN2P3 – CNRS) 2 :
Overview of the project
Christophe Beigbeder PID meeting
Dr. Michael Nasief Lecture 2
SEQUENTIAL LOGIC -II.
Hellenic Open University
Flip Flop.
Electronics for the E-CAL physics prototype
Latches and Flip-flops
LHCb calorimeter main features
ECE 354 Computer Systems Lab II
MCP Electronics Time resolution, costs
Eric Oberla, Hervé Grabas, JF Genat, Sam Meehan
Stefan Ritt Paul Scherrer Institute, Switzerland
Jean-Francois Genat – Herve Grabas Mary Heinz – Eric Oberla
Mark Bristow CENBD 452 Fall 2002
PHENIX forward trigger review
Ongoing R&D in Orsay/Saclay on ps time measurement: status of the USB-powered 2-channel 3.2GS/s 12-bit digitizer D.Breton & J.Maalmi (LAL Orsay), E.Delagnes.
CBETA bunch pattern and BPM trigger generator Version 2
Presentation transcript:

Chis status report

Next submission Due date 16 february 2010 http://www.mosis.com/ibm/ibm_schedule.html Process 0.13um IBM (8RF-DM)

Specs 4 Channels / 2 Token readouts / 1 DLL 256 cells/channels Max power = 100mW/channels Conversion time = 2us Readout time = 1us/channels

Improvements New IBM design kit 1.6.2.4 (Redraw layouts) Trigger at the input (New Comparators) Increased range (New buffer) Faster and better AtoD conversion Faster read-out (New D-Flipflop) Two-edges DLL (To do) Removal of the DC current in the IO pads

Trigger schematic

Internal Trigger trigger output- control write switch latency 2-3 ns threshold levels simulated pulse (stalactite) reset trigger – restart writing process

-Works for both + and – pulses Internal Trigger trigger output threshold levels simulated pulse (stalagmite) reset trigger – restart writing process latency 1-2 ns -Works for both + and – pulses -Acceptable latency (each sampling capacitor is rewritten every ~ 25 ns) -Keep external trigger option in addition

A to D conversion Logic setup: when Reset = 1, mux sends gnd to Clock input on register, stopping count

simulation -> rollover protection 2.5 GHz clock comparator output in red (stays high) counting stops when 13th bit goes high (400ps*4096=1.64us)

New input structure Sampling capacitance with read and write switches Rail to rail voltage follower used as a buffer for the stored value.

Buffer 1V of linear input dynamic

Sampling Sampling Buffered value Capacitance value

Phase detector

The output1 fires when input1 comes first and vice versa The output1 fires when input1 comes first and vice versa. The pulse width depends on the delay between the two input pulse.