Visual Field Digest Teaching Kit Chapter 7 HAAG-STREIT AG

Teaching Kit Copyright The Visual Field Digest Teaching Kit includes all figures and illustrations from the Visual Field Digest. They can be used for non-commercial presentations free of charge. Haag-Streit AG allows the use of this figures for personal or academic use under the conditions that (i) it is used without commercial purpose and (ii) the content is reproduced exactly as the original by mentioning Haag-Streit AG, Switzerland as the owner of the copyright. Non-academic, non-personal or commercial users might only use this figures in whole or in part after a written authorization by the copyright holder. “Haag-Streit”, “900” and “Octopus” are either registered trademarks or trademarks of Haag-Streit Holding AG. The following are either registered trademarks or trademarks of Carl Zeiss Meditec: “Guided Progression Analysis”, “GPA”, “Humphrey”, “HFA”, “SITA”, “SITA Fast”, “SITA Standard”, “Visual Field Index”, and “VFI”. Copyright © 2018 HAAG-STREIT AG

Fig. 7-1: Relationship among different visual field representations

Fig. 7-2: Values representations display sensitivity thresholds

Fig. 7-3: Values

Fig. 7-4: Grayscale (Values)

Fig. 7-5: Comparisons representation displays deviations from the normal visual field

Fig. 7-6: Comparisons

Fig. 7-7: Grayscale (Comparisons)

Fig. 7-8: Inverse relationship between Values and Comparisons representations

Fig. 7-9: Distribution of sensitivity thresholds of the normal population

Fig. 7-10: Probabilities

Fig. 7-11: Defect Curve

Fig. 7-12: Cluster Analysis displays ten cluster mean defects

Fig. 7-13: Cluster Analysis

Fig. 7-14: Design of the Polar Analysis

Fig. 7-15: Polar Analysis

Fig. 7-16: Corrected Comparisons and its relationship with other corrected representations

Fig. 7-17: Corrected Comparisons

Fig. 7-18: Grayscale of Corrected Comparisons

Fig. 7-19: Corrected Probabilities

Fig. 7-20: Corrected Cluster Analysis

Fig. 7-21: Square root of Loss Variance (sLV)

Fig. 7-22: False positive (FP) answers

Fig. 7-23: False negative (FN) answers

Table 7-1: Global indices available for Octopus perimeters

Table 7-2: Reliability indices available on Octopus perimeters

Box 7A: Defect Curve

Box 7B-1: Design of Cluster Aanalysis

Box 7B-2: Cluster Analysis for different test patterns

Box 7C: Diffuse Defect (DD)

Box 7D: Local Defect (LD)