UCSB Qualification Module Grading

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Presentation transcript:

UCSB Qualification Module Grading 24 TOB 6 chip (L56p) modules tested using ST qualification batch sensors Failure rates/sources (excluding CMN modules) 0.34% bad channels on average 0.27% Known bad sensor channels 0.033% Unmarked bad sensor channels (All Noisy) A factor 5 lower rate than previously Istrip data missing from at least one sensor in each of the effected channels 0.011% open hybrid-APV bonds 0.016% module bonding 0.005% saturated FE 1 channel with low noise & no cal. injection response with no sensors connected Module Grades 22 Grade A 1 Grade B 1 Grade A/F 1 CMN module

Comparison of 4 Chip and 6 Chip Modules In previous talk, decrease in gain shown in 4 chip modules with the final 50 W inverter resistor Required re-tuning of cuts Now it appears that load capacitance of 6 chip TOB module different enough to require different set of cuts Noise 10% lower Faster peaking time, etc Currently finalizing cuts and checking false flagging rates and bad channel finding efficiency Once that is finished, we will begin to insert info into database 6 chip TOB modules are only modules built so far at UCSB with qualification sensors and good, final hybrids Final Hybrids 6 chip TOB Final Hybrids 4 chip TOB