EE Chamber Commissioning By: Eric Seabron. How to find Momentum using MDTs Find To Values => t – to = td Create R-T functions to find drift radius (rd)

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Presentation transcript:

EE Chamber Commissioning By: Eric Seabron

How to find Momentum using MDTs Find To Values => t – to = td Create R-T functions to find drift radius (rd) where, rd f(td) R = Rd ± r where, r Resolution Function R values are used to find the Sagitta value (S) N = # of position measurements k = distance between each measurement

To Values & R-T Graphs

Tracking Resolution

Finding Leaks and Fixing Leaks

~5.18 Volume Exchanges/Day

Low Voltage Electronics Testing 1) Stress Test with 3-15 hour High Voltage Tests 2) Look for Errors and Bugs which indicate faulty electronics 3) Replace Faulty Electronics and Restart HV Stress Tests If Lucky the Chambers will pass all tests and can be put back in storage DAQ System

The Mezzanine card processes 24 tubes using 3 ASD (Amplifier Shaper Discriminator) chips and a TDC (Time to Digital Converter) chip. The CSM uses an passive interconnection of all 18 Mezz Cards to obtain is data which it sorts through using a active components including a Multiplexer. CSM Board

Dark Currents < 2uA Chamber Temperature Probes

Mezz Temp. Probes B-Field Irregular Magnetometer Reading

We must remove screws between the multilayers from electronics covers for easier access to the Mezz Cards in the pit. Reinstall mounting plates for HV splitter boxes with better fortified copper plate backs. 16 More Electronics Hardware

Summary Commissioned 8 sectors ~ 16 Chambers. Removed >1000 screws. Installed 16 HV boxes. Ran >80 stress tests. Intimately learned about the EE Chambers … we treated each one as if it were our own. In total we … Our Commissioning Team: Kareem Hegazy, Rex Brown, Eric Seabron, Lulu Liu, Dr. Junjie, Dr. Bing, Dr. Tiesheng, Dr. Jianbei Questions???