Deflectometry-based Measurement And Correction Of Mirror Misalignment

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Presentation transcript:

Deflectometry-based Measurement And Correction Of Mirror Misalignment Joel Berkson Large Optics Fabrication and Testing (LOFT) Group Mentor: Dae Wook Kim

What is Deflectometry? Object Optics Image How did we get from object to image?

General Deflectometry Display Sample Input data Measured data Camera

Sheared Fourier Transform for Phase Data Sheared Pattern g(x+Δ)-g(x) Measured Pattern Show subtraction of waves/general FT idea Δ Heejoo Choi, et al. Proc. SPIE 103770G, 103770G (2017)

Benefits and Applications High updating time (~10Hz) Scalable to monitor multiple mirrors simultaneously JWST (James Webb Space Telescope) GMT (Giant Magellan Telescope) Can achieve mrad and μrad relative misalignment measurement Scalable by camera and display pixel size/geometry of setup Closed loop monitoring and correction of mirror segments

Test Procedure Closed Loop Control LCD Tilt Mounted Mirror Display and image initial pattern Start monitoring process External mirror misalignment Capture image Analyze pattern Evaluate tilt Move motor Test Procedure Closed Loop Control Computer LCD Motorized Rotation Stage Camera Laser Tilt Mounted Mirror Motor Driver

Results (μrad)

Results Manual mirror tilt (μrad)

Results Compensate tilted mirror (μrad)

Results Return position (μrad)

Conclusions Deflectometry for mirror orientation has potential to be used in active control systems in both fabrication and assembly stages of an optical system Future work Absolute as well as relative tilt measurement Using voice coil actuators for quick correction Adjust for non-static alignment disruption

Acknowledgements NASA Space Grant Consortium Dae Wook Kim, Heejoo Choi, LOFT group

Thank You!

Sheared Fourier Transform for Phase Data Measured Pattern Sheared Pattern g(x+Δ)-g(x) Δ Show subtraction of waves/general FT idea ∆= 1 2𝜋𝑓 𝑎𝑟𝑐𝑐𝑜𝑠 1− 1 2 𝐹𝑇 𝑔 𝑥+∆ −𝑔 𝑥 2 𝐹𝑇[𝑔 𝑓 ] 2 Heejoo Choi, et al. Proc. SPIE 103770G, 103770G (2017)

Angle Calculation 𝑥 𝑓 = 𝑥 𝑖 + Pixel pitch in physical units × number of pixels for one period × shifted phase (D) 𝜃= 1 2 𝑎𝑟𝑐𝑡𝑎𝑛 x 𝑓 − x 0 z 𝑑 −𝑎𝑟𝑐𝑡𝑎𝑛 x 𝑖 − x 0 z 𝑑 , Heejoo Choi, et al. Proc. SPIE 103770G, 103770G (2017)