ION BEAM ANALYSIS.

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Presentation transcript:

ION BEAM ANALYSIS

Participant: Nataliya Paltseva (Slovak Republic, Comenius University in Bratislava) Supervisor: Alexander P. Kobzev, PhD. Place of work: Frank Laboratory of Neutron Physics

RUTHERFORD BACKSCATTERING SPECTROMETRY (RBS)

Kinematic factor

Differential scattering cross section

Height of the energy spectrum ΔE - the energy difference observed for ions scattered from the surface and from depth x; E0, E1 - incident and exit energies; ε - stopping cross section factor

RBS energy spectrum

Experimental conditions : Spectrum file : F.142 Type of the beam ( atomic number ) : 2 Energy of the beam in [MeV] : 2.03 Solid angle of detector [sr] : .0018200 Angles between target and beam [deg] IBM : 25.00 Cornell : 90.00 Angle between detector and beam [deg] : 170.00 Detector resolution [keV] : 15.00 Integrator count : 20000.00 Constant of integrator (In exp. form) : .3478E+10 Calibration Energy - Channel E = A*k + B A = .0019406 B = .0471190 Depth Element Concentrations (at %) nm Ru Sr Fe Si O ------------------------------------------------------------------------------- 100.8 19.44 14.37 1.20 .00 64.99 221.2 .00 .00 .79 34.28 64.93 623.1 .00 .00 .00 100.00 .00 10669.3 .00 .00 .00 100.00 .00

Particle Induced X-ray Emission (PIXE) The incident beam particles eject inner shell electrons from the target atoms which results in the emission of characteristic x-rays. Moseley's Law:

PIXE energy spectrum

RBS energy spectrum

Concentration [%] of elements in the sample obtained by using methods RBS and PIXE Sample N7 C N O Na Mg Al Si S Cl K Ca RBS 37 21 25 3,2 3,1 5,2 1,3 PIXE 0,006 0,01 0,3 RBS PIXE Ti V Mn Fe Cu Zn As Sr Zr 0,42 0,02 0,05 0,01 0,04

The advantages and weakness of RBS: well suited for thin film analysis provides depth information without the requirements for destruction of the sample rapid analysis high sensitivity The advantages and weakness of PIXE: capable to recognize each element heavier than C suitable for trace element analysis no depth information only general information about concentration

Thank you for attention!