Module Testing in Florence Carlo Civinini INFN-Florence Test Statistics Defects Analysis (rejected modules) Bad Strip Flagging DB ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Statistics (up to April 19th) received> 87 (31 L12p) bonded> 78 (22 L12p) ARCtested> 78 (22 L12p) ARC Ok> 76 (22 L12p) LTtested> 74 (19 L12p) LT Ok> 73 (19 L12p) ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Rejected Modules Two bad Modules detected by ARC: 30200020035163 Voltage breakdown at ~200V 30200020035190 23 contiguous noisy strips One bad (suspicious) Module detected by LT: 30200020035065 Some strange behaviour (affecting Peak Time only) at room temperature then a failure at -15oC followed by intermittent failures with ARC and LT 3/78  rejection rate of 3.8% ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

ARC Discarded Modules (i) IV breakdown (after bonding) at 200V No evident anomalies after optical inspection (30200020035163) IV from sensor DB OK (Imax~200nA) ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

ARC Discarded Modules (ii) One module (two, actually) has shown a group of noisy strips in peak mode. Noise (almost) normal in deconvolution. No detailed information about Istrip or Cac from DB: Hamamatsu claims that no defective strips are present on that sensor Another module behaves very similarly (but 10 noisy strips only <2% bad strips anyway) On the same sensor batch we have seen sensors with anomalies on the surface (part of them without any effects on the electrical characteristics). ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Anyway no correlations with the group of noisy strips Module 30200020035190 (the bad one) 2cm Anyway no correlations with the group of noisy strips ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

…but this module works… ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Module 30200020035190 Noisy strips 148…167 148…167 ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

A ‘good’ module, anyway… <2% bad strips ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

LT Discarded Module (i) ARC Tests Marginal ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Pinholes One new pinhole (not present in the sensor DB) has been generated after some bonding problems on strip #1  promptly identified by both ARC and LT Another new pinhole has been identified by ARC but it is not apparently related to any bonding problems  not identified by HPK? Both strips have been disconnected At present time no new pinhole has developed during the LT runs. ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

HW problems LT: Recently one peltier element of our Vienna box fails We got a spare from Vienna (last one, other spares?) The box has been repaired: it is not so easy but feasible  10 days down time) ARC: One channel of a DEPP card fails No down time (we have a second ARC system) ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

LT Test The I2C problem has been solved (thanks to Marco) In the shadow of this effect a minor problem was hidden This new problem shows up as a ‘gain reduction’ of the first couple of chips; it is rare and not reproducible It is not correlated with the temperature but, perhaps, is connected with certain slots in the LT system (Vienna box connectors, VUtri card, cables, Mux channel) It is highly probable to be a LT system related problem, but, honestly speaking, I cannot 100% exclude a module problem… ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

An example Noise too low ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Defect Statistics The defect analysis has been carried out using the Tony-Riccardo’s macros and xFLAG generated xml files 58 ARC tested modules and 54 LT tested modules have been analyzed and inserted in DB The bad strips distributions are peaked at zero and are dominated by the marginally noisy strips (aka statistical fluctuations noisy strip in only one - out of four - mode) ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Defect Statistics (from DB) out of 31000 strips ARC LT #mod in DB 58 54 # bad strips 79 27 # noisy strips 64 8 # shorted strips 1 # opens 13* 15* # pinholes # ???? 2 * Mainly unbonded pinholes ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

ARC bad strip distribution A total of 79/31000 bad strips ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

LT bad strip distribution A total of 27/31000 bad strips ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

23 contiguous Unstable module Bad strips After LT ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

ARC bad strip position inside a chip Middle of the chip Close to border ARC tests ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Module grading by xFLAG As Riccardo already reported: ARC 54/58 grade A 2/58 grade B 2/58 grade C  rejected LT 52/54 grade A 1/54 grade B 1/54 grade C  rejected The .xml files have been uploaded into production DB ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Comments on tests Despite of the intensive use of the logical OR for different test combination the total bad strip number is under control (10-3) We are confident to be able to detect ‘any’ real defect (at strip level) The ARC-LT cross-check, after excluding the marginally noisy strips, is good: on a total of 59 modules checked only 3 have to be studied in more detail and eventually retested before inserting them into DB Apart edge (and middle of the chip) effects we found no systematics in the bad strip position Bonding generated defects are very rare ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

Conclusions In Florence we produced 78 TIB modules (56 L34p and 22 L12p) The ARC test follows immediately the module bonding, LT within one week A total of 3 modules have been rejected The bad strips are at the permille level 112 .xml files have been inserted into DB ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze

The Module Production Crew in Florence Bonding: Mirko Brianzi, Enrico Scarlini Tests: Riccardo Ranieri, Cristiano Marchettini, Andrea Bocci, Florentina Manolescu, Carlo Civinini, Marco Meschini ModTest Meeting TK-week April 20th 2004 Carlo Civinini INFN-Firenze