Japan Traceability Committee Liaison Report NA Spring Meetings 2012

<Region> <Committee> Outline Leadership Organization Chart Meeting Information Ballot Results New TFOF/SNARF Upcoming Ballot TF reports Schedule for SEMICON Japan 2010 <Month> <Year> <Region> <Committee>

<Region> <Committee> Leadership Committee Co-chairs Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (Keyence) <Month> <Year> <Region> <Committee>

Organization Chart Traceability Committee Device Security TF Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (keyence) Device Marking TF Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (Keyence) Device Security TF Yoichi Iga (Renesas Electronics) Atsushi Ohwada (Adem) Hirokazu Tsunobuchi (Keyence) JIG and Unit Package ID TF Hirokazu Tsunobuchi (Keyence) Japan Anti-Counterfeiting TF Yoichi Iga (Renesas Electronics) Atsushi Ohwada (Adem) Hirokazu Tsunobuchi (Keyence) Japan PV Traceability TF Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (Keyence) 5 Year Review TF Kazuhiro Tsunobuchi (Keyence)

<Region> <Committee> Meeting Information Last meeting 7 December, 2011 SEMICON Japan 2011, Makuhari Messe, Chiba, Japan Next meeting 26 April, 2012 SEMI Japan, Tokyo, Japan <Month> <Year> <Region> <Committee>

<Region> <Committee> Ballot Results Doc.4845A, New Standard: Specification for Organization Identification by Digital Certificate Issued from Certificate Service Body (CSB) for Anti-counterfeiting Traceability in Components Supply Chain Passed SEMI T21-0212 was published Doc.4847A, New Standard: Specification for Traceability by Self Authentication Service Body and Authentication Service Body SEMI T22-0212 was published <Month> <Year> <Region> <Committee>

<Region> <Committee> New TFOF/SNARF Japan PV Traceability TF was set up. <Month> <Year> <Region> <Committee>

<Region> <Committee> Upcoming Ballot Cycle2 Doc. 5361, Reapproval of SEMI T17-0706, Specification of Substrate Traceability Developed by the 5 YR TF Doc. 5362, Reapproval of SEMI T18-1106, Specification of Parts and Components Traceability Developed by the 5YR TF Doc. 5365 Line Item Revision to SEMI T15-0705, General Specification of Jig ID: Concept Developed by the JIG and Unit Package ID TF Doc. 5383, Revision to Add a New Subordinate Standard Specification for Reduce Space Marking of Product Packages to SEMI G83-0308, Specification for Bar Code Marking of Product Packages Developed by the JIG and Unit Packaging ID TF Ballot Adjudication Those ballot documents will be adjudicated in the next Japan Traceability Committee on 1 November, 2011. <Month> <Year> <Region> <Committee>

Device Marking Task Force Co-leaders Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (KEYENCE) Current activity None <Month> <Year> <Region> <Committee>

Device Security Task Force Co-leaders Yoichi Iga (Renesas Electronics) Andy Ohwada (Adem) Hirokazu Tsunobuchi (KEYENCE) Current activity None <Month> <Year> <Region> <Committee>

Japan Anti-Counterfeiting Task Force Co-leaders Yoichi Iga (Renesas Electronics) Andy Ohwada (Adem) Hirokazu tsunobuchi (KEYENCE) Current activity Support to Int’l Anti-Counterfeiting TF No SNARF <Month> <Year> <Region> <Committee>

JIG and Unite Package ID Task Force Leader Hirokazu tsunobuchi (KEYENCE) Current activity Doc. 5365 Line Item Revision to SEMI T15-0705, General Specification of Jig ID: Concept Doc. 5383, Revision to Add a New Subordinate Standard Specification for Reduce Space Marking of Product Packages to SEMI G83-0308, Specification for Bar Code Marking of Product Packages <Month> <Year> <Region> <Committee>

5 years review Task Force Leader Hirokazu tsunobuchi (KEYENCE) Current activity Doc. 5361, Reapproval of SEMI T17-0706, Specification of Substrate Traceability Doc. 5362, Reapproval of SEMI T18-1106, Specification of Parts and Components Traceability <Month> <Year> <Region> <Committee>

Japan PV Traceability TF Co-leaders Yoichi Iga (Renesas Electronics) Hirokazu Tsunobuchi (KEYENCE) Charter The objective is to define and elaborate several standards to unify PV traceability from the sliced wafer to the end of PV cell life－cycle. Scope The activities of the task force will result in the development of several industry standards where equipment suppliers, cell manufacturers, PV module manufacturers, PV users and other involved parties can find conformity, in any technical field of PV traceability. Initial work will focus on Marking of ID to identify a product Means to identify as a right product Security countermeasure to realize other Traceability depending on need Anti-Counterfeiting Kick-off Meeting On 26 April 2012 at SEMI Japan, Tokyo, Japan <Month> <Year> <Region> <Committee>

Regional Staff Contact Information Name Hiro’fumi Kanno E-mail hkanno@semi.org Phone +81.3.3222.6018 Office Address 4-7-15 Kudan-minami, Chiyoda-ku, Tokyo 102-0074 Japan Committees In charge Japan Traceability Committee <Month> <Year> <Region> <Committee>