Properties of irradiated semi-insulating GaN

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Presentation transcript:

Properties of irradiated semi-insulating GaN J.Vaitkus (1), J.P.Grant (2), E.Gaubas (1), V.Kazukauskas(1), V.Kalendra(1), K.Kazlauskas(1), S.Sakai (3), J.Storasta(1) (1) Institute of Materials Science and Applied Research, Vilnius University, Lithuania; (2) Dept. Physics and Astronomy, Glasgow University, Scotland, (3) Dept. Engineering, Tokushima University, Tokushima, Japan.

Introduction: According known material properties GaN was proposed to have an ability to be radiation hard material. In previous talk it was demonstrated that C.C.E. can reach 40% in highly (1e16 cm-2) irradiated sample. What properties are changing and where are the problems to become the detector?

The results of investigation of SI-GaN by: photluminescence, photoconductivity spectra and kinetics, microwave absorption kinetics thermally stimulated current. The samples were irradiated: by neutrons and compared with data for the similar samples irradiated by proton and neutron earlier.

Photoluminescence spectra in neutron irradiated GaN samples

Comparison of proton and neutron irradiation in SI-GaN protons neutrons

Decay time constants dependence on T

PC decay constants

GaN PC

TSC

TSC

TSC, multiple heating

An “working”model:

Some conclusions (positive): The irradiation generates the different defects, but their influence is not crucial: the detectors irradiated by protons and neutrons up to 1016 cm-2 fluence are alive: CCE ~ 20-40 % (J.Grant talk); The substrate related defects play most important role and the detector properties were improved by increasing the epi-layer thickness.

Some conclusions (problematic): The contacts problem (injection) is not solved yet. Also, it is necessary to change the sapphire substrate (exclude Al), therefore this has a priority to contact problem (that will be necessary to solve in the new samples). Two ways for the detector improvement are proposed (and small financial support is obtained): Growth of SI-GaN on Si Free standing GaN samples. Today SI-GaN cannot compete with epi-Si (E.Fretfurst talk) but who knows what will happen in the future (GaN is so “young” material).

Thanks for Your attention !