NA Photovoltaic Materials Committee Liaison Report NA PV Liaison Report - Baylies/BayTech NA Photovoltaic Materials Committee Liaison Report Updated Feb 25, 2013 Berlin, March 9, 2010

Lori Nye (Brewer Science) Co-chairs Lori Nye (Brewer Science) John Valley (MEMC) NA PV Materials Committee Liaison

NA Photovoltaic Materials Committee C: Lori Nye – Brewer Science C: John Valley – MEMC PV Electrical and Optical Properties Measurement TF Austin Blew – Lehighton Electronics Chris Moore – Semilab Int’l PV Analytical Test Methods TF Hugh Gotts – Balazs Analytical Services NA PV Committee Liaison

NA PV Materials Committee Liaison Meeting Information Last meeting NA Fall Standards Meetings SEMI HQ, San Jose, CA Oct 30-31, 2012 Next meeting NA Spring Standards Meetings April 2-3, 2013 Check www.semi.org/standards for the latest update NA PV Materials Committee Liaison

Ballot Results Summary [1] Document 4675B, New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock for Silicon Solar Cells By Bulk Digestion, Inductively Coupled-Plasma Mass Spectrometry Failed and reballoted in cycle 2-2013 Document 5438, Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials for Silicon Solar Cells by Inert Gas Fusion Infrared Detection Method Passed and published as PV43-0113 NA PV Materials Committee Liaison

Ballot Results Summary [2] Doc. 5436, Auxiliary Information on Round Robin Report for SEMI PV10 Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon Approved and published as AUX027-0213 NA PV Materials Committee Liaison

NA PV Materials Committee Liaison New SNARFs [1] PV Analytical Test Methods TF Doc. 5501: Auxiliary document to include interlaboratory study for PV43 - Test Method For The Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method Interested lab participants, contact Patrick Schnabel at Evans Analytical (pschnabel@eaglabs.com) PV Silicon Materials TF Doc. 5502: Line item Revision to SEMI PV39: Test Method For In-line Measurement Of Cracks In PV Silicon Wafers By Dark Field Infrared Imaging NA PV Materials Committee Liaison

NA PV Materials Committee Liaison Ballot for cycle 1 & 2, 2013 Doc. 4675C, New Standard: Test Method for the Measurement of Elemental Impurity Concentrations in Silicon Feedstock by Bulk Digestion, Inductively-Coupled-Plasma Mass Spectrometry To be reviewed at NA Spring 2013 meeting Doc. 5439, Revision to SEMI PV13-1110, Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor NA PV Materials Committee Liaison

Int’l PV Analytical Test Methods TF [1] Leader: Hugh Gotts (Balazs Analytical Services) Charter: Develop standards for analytical test methods for PV industry. Published 6 Standards, 5 Auxiliary Information PV1-0211 - Test Method for Measuring Trace Elements in Si. Feedstock for Si. Solar Cells by High-Mass Resolution Glow Discharge Mass Spectrometry PV9-0611 - Test Method for Excess Charge Carrier Decay in PV Silicon Materials by Non-Contact Measurements of Microwave Reflectance After a Short Illumination Pulse PV10-1110 - Test Method for Instrumental Neutron Activation Analysis (INAA) of Silicon NA PV Materials Committee Liaison

Int’l PV Analytical Test Methods TF [2] PV13-1111 - Test Method for Contactless Excess-Charge-Carrier Recombination Lifetime Measurement in Silicon Wafers, Ingots, and Bricks Using an Eddy-Current Sensor PV25-1011 - Test Method for Simultaneously Measuring Oxygen, Carbon, Boron And Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry PV43-0113 - Test Method for the Measurement of Oxygen Concentration in PV Silicon Materials for Silicon Solar Cells by Inert Gas Fusion Infrared Detection Method NA PV Materials Committee Liaison

Int’l PV Analytical Test Methods TF [3] Auxiliary Information — A Type of Document that is independently published, not a part of a Standard or Safety Guideline, containing illustrative, explanatory, or supporting material (e.g., application information, examples) AUX017-0310, Auxiliary Information for Contactless Measurement of Carrier Recombination Lifetime in Silicon Wafers and Ingots AUX019-0211, Auxiliary Information for Interlaboratory Study Results For Determining the Precision of SEMI PV1 AUX022-0611, Auxiliary Information Conversion of units for impurity concentrations in Silicon AUX026-1012, Research Report On Interlaboratory Study To Establish Precision Statements For SEMI PV13, Test Method For Contactless Excess-charge-carrier Recombination Lifetime Measurement In Silicon Wafers, Ingots, And Bricks Using An Eddy-current Sensor AUX027-0213, Results of Round Robin for SEMI PV10, Test Method for Instrumental Neutron Activation Analysis (INNA) of Silicon NA PV Materials Committee Liaison

Int’l PV Analytical Test Methods TF [4] Drafting Doc. 5435: Auxiliary Information interlaboratory study for PV25 - Test Method for Simultaneously Measuring Oxygen, Carbon, Boron and Phosphorus in Solar Silicon Wafers and Feedstock by Secondary Ion Mass Spectrometry Doc. 5501: Auxiliary Information interlaboratory study for PV43 - Test Method for Measurement Of Oxygen Concentration In PV Silicon Materials For Silicon Solar Cells By Inert Gas Fusion Infrared Detection Method NA PV Materials Committee Liaison

PV Electrical and Optical Properties Measurements TF [1] Austin Blew/Lehighton Electronics Chris Moore/Semilab Charter : Develop standards for measuring electrical and optical properties of PV materials that become an integral part of a PV “device” e.g. cells, modules, etc. NA PV Materials Committee Liaison

PV Electrical and Optical Properties Measurements TF[2] Published Standards PV15-0211 Guide for Defining Conditions for Angle Resolved Light Scatter Measurements to Monitor The Surface Roughness and Texture of PV Materials PV28-0212 Test Methods for Measuring Resistivity or Sheet Resistance with a Single-Sided Noncontact Eddy-Current Gauge PV31-0212 Test Method for Spectrally Resolved Reflective and Transmissive Haze of Transparent Conducting Oxide (TCO) Films for PV Application NA PV Materials Committee Liaison

PV Electrical and Optical Properties Measurements TF[3] Drafting Doc. 4825, New standard: Test Methods for Hg Probe Measurements of Crystalline Silicon PV Materials and Devices Doc. 5394, New Standard: Test Method for QSS Microwave PCD Measurements of Carrier Decay and Lifetime Doc. 5093, Auxiliary Information, Round Robin (Multi-Laboratory Test) for PV9-1110 NA PV Materials Committee Liaison

NA PV Materials Committee Liaison Questions? Contact Kevin Nguyen at knguyen@semi.org NA PV Materials Committee Liaison