Yongho Seo Center for Near-field Atom-photon technology, Seoul Nation University, Rep. of Korea & Department of Physics, University of Virginia Kyungho.

Slides:

Advertisements

Similar presentations

Leaders in Light Perfect for Raman. Agenda Short corporate profile Advantages of the Starbright technology Our demanding quality assurance programme Overview.

Advertisements

Microwave near-field scanning microscope Abstract We present the development of a novel near-field scanning microwave microscope based on a dielectric.

AFM Basics Xinyong Chen.

Semiconductor nanoheterostructures in nonequilibrium conditions: glance through scanning probe microscope K.S. Ladutenko (SPbGPU) scientific advisers V.P.

Qfext07 Leipzig 17 Sep Casimir force measurements with quartz tuning fork and AFM Dr. Thorsten Ludwig Binnotec e.V. Bouchéstr. 12, Haus Berlin.

Nanophotonics January 9, 2009 Near-field optics. Resolution in microscopy Why is there a barrier in optical microscopy resolution? And how can it be broken?

Nanophotonics Class 8 Near-field optics.

The Principle of Microscopy : SEM, TEM, AFM

SCANNING PROBE MICROSCOPY By AJHARANI HANSDAH SR NO

Lecture 10. AFM.

Imaging of flexural and torsional resonance modes of atomic force microscopy cantilevers using optical interferometry Michael Reinstaedtler, Ute Rabe,

The Performance of Chip-Scale Atomic Clocks V. Gerginov 1, S. Knappe 2, P.D.D. Schwindt 3, V. Shah 2, J. Kitching 3, L. Hollberg 3 In collaboration with:

UNIT IV LECTURE 61 LECTURE 6 Scanning Probe Microscopy (AFM)

Atomic Force Microscopy

History and Applications of Atomic Force Microscopy Gregory James PhD Candidate Department of Chemical Engineering 1.

Get to the point!. AFM - atomic force microscopy A 'new' view of structure (1986) AlGaN/GaN quantum well waveguide CD stamper polymer growth surface atoms.

Atomic Force Microscop (AFM) 3 History and Definitions in Scanning Probe Microscopy (SPM) History Scanning Tunneling Microscope (STM) Developed.

Atomic Force Microscopy

Unit for nanoscience and Theme Unit of Excellence in Nanodevices S.N. Bose National Centre for Basic Sciences Kolkata Basics of.

Atomic Force Microscopy

NATSYCO. microscopy Optical microscopy Electron microscopy Scanning probe microscope.

Scanning Probe Microscopy (SPM) Real-Space Surface Microscopic Methods.

Slide # 1 SPM Probe tips CNT attached to a Si probe tip.

آشنایی با میکروسکوپ نیروی اتمی Dr. Janelle Gunther March 10, 1998 ACS Group and MENs, Beckman Institute adapted from the world wide web page at

Methods and Tehniques in Surface Science

Microcantilevers III Cantilever based sensors: 1 The cantilever based sensors can be classified into three groups (i)General detection of any short range.

TAPPINGMODE™ IMAGING APPLICATIONS AND TECHNOLOGY

Tuning Fork Scanning Probe Microscopy Mesoscopic Group Meeting November 29, 2007.

Cover of Scientific American, October Source: Actuator driven by thermal expansion of water and air.

Creative Research Initiatives Seoul National University Center for Near-field Atom-Photon Technology - Near Field Scanning Optical Microscopy - Electrostatic.

Creative Research Initiatives Seoul National University Center for Near-field Atom-Photon Technology Yongho Seo Wonho Jhe School of Physics and Center.

Magnetization dynamics

Complex Epitaxial Oxides: Synthesis and Scanning Probe Microscopy Goutam Sheet, 1 Udai Raj Singh, 2 Anjan K. Gupta, 2 Ho Won Jang, 3 Chang-Beom Eom 3 and.

Introduction to Atomic Force Microscopy

AFM. The cantilever holder The cantilever dimensions Tip position.

Tutorial 4 Derek Wright Wednesday, February 9 th, 2005.

3.052 Nanomechanics of Materials and Biomaterials Prof. Christine Ortiz DMSE, RM Phone : (617) WWW :

Common scanning probe modes

Scanning Probe Microscopy Colin Folta Matt Hense ME381R 11/30/04.

5 kV  = 0.5 nm Atomic resolution TEM image EBPG (Electron beam pattern generator) 100 kV  = 0.12 nm.

Atomic Force Microscopy (AFM)

Improvement of Infrared Lights Sensitivity on PZT EMITER Daisuke Takamuro, Hidekuni Takao, Kazuaki Sawada and Makoto Ishida.

Figure 3.1. Schematic showing all major components of an SPM. In this example, feedback is used to move the sensor vertically to maintain a constant signal.

Tuning Fork Scanning Probe Microscopy Mesoscopic Group Meeting November 29, 2007.

NC STATE UNIVERSITY Direct observation and characterization of domain-patterned ferroelectrics by UV Photo-Electron Emission Microscopy Woochul Yang, Brian.

Effect of Charging on Thermal Noise Gregory Harry Massachusetts Institute of Technology - Core Optics and Suspensions Working Groups - March 19, 2004 –

Why is AFM challenging? 1.Jump to contact: k>max(-   V TS /  z  (static) kA>max(-F TS  oscillating mode)  ideal amplitude is A~ ] 2. Non-monotonic.

Electric Force Microscopy (EFM)

Gravitational Experiment Below 1 Millimeter and Search for Compact Extra Dimensions Josh Long, Allison Churnside, John C. Price Department of Physics,

Magnetic Force Microscopy

1 ME 381R Lecture Semiconductor Devices and Thermal Issues Dr. Li Shi Department of Mechanical Engineering The University of Texas at Austin Austin,

EEM. Nanotechnology and Nanoelectronics

Measurements of Forces at the Nanoscale some ideas for measurements at LEPES in 2005 J. Chevrier 18 November 2004.

Champaign, June 2015 Samir Kassi, Johannes Burkart Laboratoire Interdisciplinaire de Physique, Université Grenoble 1, UMR CNRS 5588, Grenoble F-38041,

Atomic Force Microscopy (AFM)

Pooria Gill PhD of Nanobiotechnology Assistant Professor at MAZUMS In The Name of Allah.

Get to the point!.

Metallurgha.ir1. Lecture 5 Advanced Topics II Signal, Noise and Bandwidth. Fundamental Limitations of force measurement metallurgha.ir2.

Get to the point!.

Scanning Probe Microscopy: Atomic Force Microscope

Characterization of CNT using Electrostatic Force Microscopy

Modelling of Atomic Force Microscope(AFM)

Mapping vibrational modes of Si3N4 membrane - Ultrasonic Force Microscopies vs Laser Doppler Vibrometry The development of new micro and nano-electromechanical.

Scanning Probe Microscope

NSOM 2000TS Thomas Erickson.

Types of Microscopy Type Probe Technique Best Resolution Penetration

Atomic Force Microscope

Atomic Force Microscopy

AFM modes 1- Contact Mode

Magnetic force resonance microscopy

Presentation transcript:

Yongho Seo Center for Near-field Atom-photon technology, Seoul Nation University, Rep. of Korea & Department of Physics, University of Virginia Kyungho Kim, Hyunjun Jang, Wonho Jhe School of Physics and Center for Near-field Atom-photon technology, Seoul Nation University, Rep. of Korea Magnetic Force Microscopy using Quartz Tuning Fork

- Self actuating - Self sensing - No light - No alignment - optical deflection - laser diode - photo diode - optical alignment - addition actuator Quartz Crystal Tuning fork Quartz Tuning Fork as a Force Sensor Micro-machined Cantilever

Force sensitivity (Qf/k) 1/2 f ~ kHz k ~ N/m Q ~ 10 2 ~ 10 nm dithering f ~ kHz k ~ N/m Q ~ 10 4 (10 6 in vacuum) < 1 nm dithering CantileverTuning Fork Force Sensitivity of Quartz Tuning Fork Low force sensitivity Low thermal noise due to high stiffness High resolution by small dithering amplitude

Hal Edwards, et. al. (1997) Todorovic and Schultz (1998) Previous works : MFM using tuning fork

f = KHz k = 1300 N/m Q = 1300 f = KHz k = 1300 N/m Q = 1300 Tuning Fork based Electrostatic force microscopy -Ferroelectrics -surface charge in Semiconductor L = 2.2 mm, t = 190 m, w = 100 m

7 x 7 m x 0.9 m 2 poling Line drawing EFM images using Tuning Fork Surface polarization images of PZT film 4 x 4 m 2 7 x 7 m 2 Y. Seo, et al, Appl. Phys. Lett , (2002). dot

Frequency shiftPhase shift MFM contrast - magnetic force gradient between tip and sample Lift mode - keep constant gap between tip and sample (~10 nm) - to avoid the strong short range topographic contrast Magnetic force - very weak force (~pN) Force gradient Tuning Fork Based Magnetic Force Microscopy

Shear force Attractive force Approach Curve of MFM Approach Withdraw high S/N ratio high frequency Sensitivity < 3 mHz f = 0.1 Hz 0.01 Hz1 mHz

H 3 PO 4 - Co or Ni wire Pt Co, Ni D = 100 m10 m Tip Manufacture Electrochemical Etching

-Attach the wire to the tuning fork and make a tip -Use home-made micromanipulator Pt Co, Ni H 3 PO 4 Tuning fork Silver paint Tip Attachment

L = 2.2 mm, t = 190 m, w = 100 m spring constant, k = 1300 N/m Co or Ni tip Tip & Tuning Fork epoxy

- Perpendicularly recorded sample -longitudinally polarized tip - monopole approximation Advantage of the shear mode MFM Shear Mode MFM

(a) shear mode, Co tip, perpendicular (b) shear mode, Co tip, parallel dithering (c) shear mode, Ni tip (d) tapping mode (a) shear mode, Co tip, perpendicular (b) shear mode, Co tip, parallel dithering (c) shear mode, Ni tip (d) tapping mode 30 x 30 m Mbit / Inch 2 hard disk 100 Mbit / Inch 2 hard disk Magnetic Force Microscopy Images

Amplitude (a) dependency 3 x 1 m 2 13 x 3 m 2 Lift Height & Dithering Amplitude Height (h) dependency h a Tip Sample

1 Gbit/inch 2 hard disk Dithering Amplitude : 20 nm lift height : 50 nm Spatial resolution : 50 nm 2 x 2 m 2 High Resolution Tuning Fork Based MFM

Summary MFM using Tuning Fork High resolution. low power dissipation at low temperature. No laser : dark environment. Cryogenic experiment (Vortex in superconductor).