MIT Amorphous Materials 4: Phase Change Data Storage

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Presentation transcript:

MIT 3.071 Amorphous Materials 4: Phase Change Data Storage Juejun (JJ) Hu hujuejun@mit.edu

Phase change materials Amorphous Crystalline Reset Set High electrical resistivity Low electrical resistivity Low optical reflectance High optical reflectance

Key performance metrics Data retention Programming speed Recording density Endurance (cycle lifetime) Power consumption Good glass stability Fast crystallization Size dependence of material properties, driver size Phase and interface stability Enthalpy of melting, heat capacity Low thermal conductivity Trade-off

Ge-Sb-Te (GST) phase change alloy Pseudo-binary alloy: (GeTe)x(Sb2Te3)y Main commercial composition Stressed rigid 3-D network Fast switching compositions Ge15Sb85, Sb2Te High thermal stability alloys (Ge2Sb1Te2)x(Ge)y GeTe4 Isostatic compositions SbTe4 Amorphous: covalent Crystal: resonant bonding Phys. Rev. B 81, 174206 (2010); Solid-State Electron. 111, 27 (2015).

Ge-Sb-Te (GST) phase change alloy Pseudo-binary alloy: (GeTe)x(Sb2Te3)y Main commercial composition Stressed rigid 3-D network Fast switching compositions Ge15Sb85, Sb2Te High thermal stability alloys (Ge2Sb1Te2)x(Ge)y Ge GeTe Amorphous: covalent Crystal: resonant bonding Te Sb Sb2Te3 Phys. Rev. B 81, 174206 (2010); Solid-State Electron. 111, 27 (2015).

Structure of cubic Ge2Sb2Te5 (225) alloy Strong electron delocalization due to resonant bonding Nat. Mater. 6, 824-832 (2007)

T-T-T diagram of GST phase change alloys Typical quench rate to get amorphous GST phase is 1E10 K/s Emerging Non-Volatile Memories, Springer (2014)

Re-writable CDs and DVDs Modulation of optical reflectance via laser- induced phase change

Phase change memory (PCM) Discovery of threshold switching in chalcogenides 1968 Ovshinsky 256-bit phase change memory demo 1970 Gordon Moore Discovery of rapid switching pseudo-binary GST material 1987 Yamada et al. Non-volatile phase change memory module commercialized IBM, Micron, Samsung, …

Phase change memory (PCM) Electrodes used for both programming and read-out Threshold switching: electric field driven bistability Transient behavior: electronic in nature, no structural change Contributes to reduced SET voltage Threshold switching mechanism: in Poole-Frenkel conduction, the electric field increases the probability of a carrier that occupies one trap to get to another one nearby. At low fields, this requires extended states. At the threshold field, however, also direct tunneling becomes possible, leading to the conductivity increase. Another model presumes that threshold switching stems from a field- and carrier density-dependent generation mechanism, thus providing a positive feedback once a critical fi eld is attained. At low fields, however, recombination counterbalances the generation. There are various possible microscopic models that could account for this phenomenological effect such as impact ionization. S. Hudgens and B. Johnson, MRS Bull. (2004); Phys. Rev. B 78, 035308 (2008).

Where does PCM stand against competitors? https://news.hpe.com/beyond-dram-and-flash-part-2-new-memory-technology-for-the-data-deluge/

3D XPoint (a likely PCM technology) https://www.intel.com/content/www/us/en/architecture-and-technology/intel-optane-technology.html

Applications beyond data storage: optics Large optical property contrast in GeTe due to change of bonding type from crystalline (resonance) to amorphous (covalent) phase Chem. Rev. 110, 240-267 (2010).

Optical properties of Ge2Sb2Te5 (225) alloy Amorphous state: low-index, reduced loss Crystalline state: high-index, high loss Data courtesy of V. Liberman @ Lincoln Laboratory

All-optical, multi-level on-chip memory Nat. Photonics 9, 725 (2015).

Optical switching and non-volatile display Applications involving bistable states Electronic paper display Nature 511, 206 (2014); Adv. Mater. 25, 3050 (2013).

Further readings Phase Change Materials: Science and Application, Springer (2009). Google book link Emerging Non-Volatile Memories, Springer (2014). Download link (MIT certificate required) “Phase change materials and phase change memory,” MRS Bull. 39, 703 (2014).