Current Necessary for CMN Problem

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Presentation transcript:

Current Necessary for CMN Problem A small increase in bias current may cause CMN problem For CMN modules built prior to re-probing, the difference between the module current and sum of the QTC sensor measurement used as the DI of sensor

New Combination Results Added 98 sensors from UR reprobing (2001-2002) Added 93 sensors from UCSB reprobing (2003) Waiting on FNAL info Sensor Quarter Number Tested >1.5 mA >5 mA % >1.5 mA % >5 mA 2001-4 140 17 14 12.1% 10.0% 2002-1 202 19 15 9.4% 7.4% 2002-2 156 9.6% 9.0% 2002-3 49 3 6.1% 0.0% 2002-4 41 1 7.3% 2.4% 2003-1 86 6 7.0% 3.5% 2003-2 95 2 3.2% 2.1% 2003-3 20

Fit to Rate of Change R(t)=A*(1-exp(-t/B)) A=0.125 B=1.5 Years

US Testing Mailing List USCMS-SILICON-TESTING@fnal.gov UC-Riverside Gale Hanson Patrick Gartung UCSB Joe Incandela Claudio Campagnari Anthony Affolder Russell Taylor Jim Lamb Brad Patterson Sam Burke Derek Barge Chris McGuinness Lance Simms UIC Elizabeta Chabalina Timour Ten KU Alice Bean Don Coppage Len Chistofek FNAL Lenny Spiegel Nicola Bacchetta Slawek Tkaczyk Anatoly Ronzhin Kenan Sogut UR Paul Tipton Regina Demina Sergey Korjenevski Ricardo Eusebi Thomas Ferbel Elisabeth Groves

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