Europe SEMI Photovoltaic Committee Liaison Report Updated October 18, 2011

Committee Leadership Co-Chairs Laszlo Fabry – Wacker Chemie Hubert Aulich – PV Crystalox Solar

EU Photovoltaic Committee C: Laszlo Fabry – Wacker Chemie C: Hubert Aulich – PV Crystalox Solar PV Silicon Materials TF P. Wagner Int’ PV Analytical Test Method TF R. Hockett – Evans Analytical PV Ribbon TF C. Prischmann – Ulbrich

Meeting Information Last meeting Next meeting Oct 10-11, 2011 DAS Facility, Dresden, Germany Next meeting March 27-28, 2012 PV Fab Managers Forum Berlin, Germany Check www.semi.org/standards for latest update

New SNARFs

Ballot Results Summary from Oct 11 meeting Doc. 5226, Line Items Revision to PV17-0611, Specification for Virgin Silicon Feedstock Materials for Photovoltaic Applications Approved and will be submitted for Audits and Reviews

Ballots for cycle 1-2012 Doc. 5331, New Standard: Test Method for In-Line Measurement of Saw Marks on Pv Silicon Wafers by a Light Sectioning Technique Doc. 5332, New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications Doc. 5334, Revision of SEMI PV18-0811, Guide for Specifying a Photovoltaic Connector Ribbon Doc. 5335, Revision of SEMI PV19-0811, Guide for Testing Photovoltaic Connector Ribbon Characteristics

PV Silicon Materials TF (1) Leader: Peter Wagner Document 4805B, Specification For Virgin Silicon Feedstock Materials For Photovoltaic Applications Published as PV17-0611. Charter of TF was recently modified by adding: Develop new standardized test methods for PV Si Materials 8

PV Silicon Materials TF (2) New SNARFs: Doc. 5330 New Standard: Test Method for In-Line Measurement of Micro Cracks of PV Silicon Wafers by Infrared Imaging Doc. 5333 New Standard: Test Method for In-Line Measurement of Waviness on PV Silicon Wafers by a Light Sectioning Technique Ballots to be submitted in cycle 1-2012 Doc. 5331 New Standard: Test Method for In-Line Measurement of Saw Marks on PV Silicon Wafers by a Light Sectioning Technique Doc. 5332 New Standard: Test Method for In-Line Measurement of Thickness and Thickness Variation of Silicon Wafers for PV Applications

PV Ribbon TF Leader - Christian Prischmann/Ulbrich Current Activities: Doc. 4800A, New Standard: Guide for Specifying a Photovoltaic Connector Ribbon Published as PV18-0811 Doc. 4801, New Standard: Guide for Testing Photovoltaic Connector Ribbon Characteristics Published as PV19-0811 Future work includes making minor revision to PV18 and PV19, and writing Ribbon Specification

Crystalline Technology and Manufacturing (CTM) Group European group of eight crystalline solar cell manufacturers (Q-Cells, Deutsche Cell, Bosch Solar Energy, Schott Solar, Sovello, Sunways, SolarWatt and Solland) is working together within SEMI in a pre-competitive environment to address the technology challenges facing the photovoltaic industry, and recognizes the need for standards. The priority of the CTM Group will be the definition of the development processes for raw materials, cell technology and cell manufacturing. The CTM Group has established a crystalline solar cell technology roadmap up to the year 2020 www.itrpv.net

Questions? Contact James Amano (jamano@semi.org) Kevin Nguyen (knguyen@semi.org) New SEMI Europe Staff Yan Guillou , SEMI Europe yguillou@semi.org