Run5 Analysis of RHIC-pC Polarimeter

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Presentation transcript:

Run5 Analysis of RHIC-pC Polarimeter RIKEN/RBRC Itaru Nakagawa Sept. 30, 2006

Contents Kinematics Reconstruction  source energy calibration Deadlayer energy correction Systematic error estimation(1) Polarization (1st Path Analysis Results) Online/Offline Event selection 2/3 Strip by strip consistency  sin() fit Systematic error estimation (2)

Am  Source Energy Calibration Assumptions Eloss(entrance window) = Eloss(foil) = Eloss(10-6 Vacuum) = 0 Ealpha = 5.486MeV 5.486 MeV (85%) 5.443 MeV (12%) Other (<2%) 100% linearity of Attenuator 100% linearity of ADC Linear Si Response w.r.t Depth 400keV 5.5MeV ~50keV/tic Systematic Error is Negligible Fitting Error < 0.01%

Energy Correction (Stability) Stability Error 9 ~ 11 g/cm2

Energy Correction (Strip by Strip Consistency) Strip Number （７２ Total） Energy Correction(g/cm2) All Detectors are made from same wafers  Any inconsistency should be accounted as sys

Energy Correction (Strip by Strip Consistency)

Systematic Error Summary(1) Blue Yellow Energy Calibration --- strip-by-strip consistency 3.5 (1) 4.5 (2) Event Selection 3 Stability 9.0 11.1 Total 10.1 (9.1) 12.3 (11.3) Energy Correction [ug/cm2] ( ):Relative Error

Online/Offline Polarization AN(24GeV) AN(100GeV)

Event Selection Dependence 3 2 2  vs 3  Cut Consistency  Systematic Error

Event Selection Error ~ 1% ( was 3% in Run3,4)

Strip by Strip Consistency ~ sin() fit ~

Azimuthal Angle Distribution

Strip by Strip Consistency Error 2 Distribution of sin() fit Well Distributed around 1 Evidence of Consistent Polarization Measurements by individual strips No systematic error allocated

Systematic Error Estimate Blue Yellow Energy Scale 3% 4% Event Selection 1% Polarization Profile Normalization from Run4 8.5% Total 9% 9.5% This systematic error estimation is estimated based on Run4 Normalization

Road Map to Finalize the Analysis Remaining Major Items Continue QA Suspicious bunch, strips Study Off-Centered Target Measurements Fill by Fill Analysis Polarization Profile Normalization with Jet