Electron probe microanalysis

Slides:



Advertisements
Similar presentations
X-ray Photoelectron Spectroscopy
Advertisements

Lecture Outline Chapter 30 Physics, 4th Edition James S. Walker
Frequency modulation and circuits
Chem. 133 – 2/19 Lecture. Announcements Lab Work –Turn in Electronics Lab –Starting Set 2 HW1.2 Due Today Quiz 2 Today Today’s Lecture –Noise –Electrochemistry.
Knight - Chapter 28 (Grasshopper Book) Quantum Physics.
Saeedeh Ghaffari Nanofabrication Fall 2011 April 15 1.
Electron-Specimen Interactions
Effect of Accelerating Voltage on Resolution
Basic Table-top SEM imaging
Topic 11.3 Diffraction.
Diffraction of Light Waves
Introduction Secondary electron secondary electron detector The electron beam interaction with near surface specimen atoms will make a signal which results.
Spectrum Identification & Artifacts Peak Identification.
Lab meetings Week of 6 October
ED and WD X-ray Analysis
Surface Emissions Specimen current X-rays Cathodoluminescence Pole Piece, etc SE3  ≈ 1 nm for metals up to 10 nm for insulators.
Introduction to scanning electron microscopy
Do it with electrons !. Microscopy Structure determines properties We have discussed crystal structure (x-ray diffraction) But consider now different.
Factors affecting the depth of field for SEM Afshin Jooshesh.
Electron Microscope Sarah, David, Jóhann.
Electron probe microanalysis - Scanning Electron Microscopy EPMA - SEM
Detecting Electrons: CCD vs Film Practical CryoEM Course July 26, 2005 Christopher Booth.
Scanning Electron Microscope (SEM) – Shoots a high energy beam of electrons (waves of electrons) at a target. Electron gun Focusing coil Objective lens.
EDS Energy Dispersive Spectroscopy
Scanning Electron Microscope (SEM)
UV-Vis Absorption Spectroscopy
Energy-Dispersive X-ray Microanalysis in the TEM Anthony J. Garratt-Reed Neil Rowlands.
Other modes associated with SEM: EBIC
Atomic Structure HL and SL 2.1 The Atom Atoms were thought to be uniform spheres like snooker balls. Experiments, however, have shown that atoms consist.
ECE 3455: Electronics Diode Physics: A Brief Tour.
08/03/09 SEM signal generation
Electron probe microanalysis Low Voltage SEM Operation Modified 9/23/10.
X-ray microanalysis in the electron microscope
7 April 2006 Simultaneous Reflection and Transmission Measurements of Scandium Oxide Thin Films in the Extreme Ultraviolet G. A. Acosta, D. D. Allred,
Questions/Problems on SEM microcharacterization Explain why Field Emission Gun (FEG) SEM is preferred in SEM? How is a contrast generated in an SEM? What.
A confocal Raman microprobe analysis of partial discharge activity in gaseous voids N A Freebody 1*, A SVaughan 1, G C Montanari 2 and L Wang 2 1 University.
Chapter 7 The electronic theory of metal Objectives At the end of this Chapter, you should: 1. Understand the physical meaning of Fermi statistical distribution.
Methods of electron microscopy Electron microscopy is a collection of investigation methods. Microstructure of bodies (up to atom-molecule.
Do it with electrons !. Microscopy Structure determines properties We have discussed crystal structure (x-ray diffraction) But consider now different.
Warm-Up List and Describe 5 Safety Rules that you think should always be followed in the Chemistry lab.
Spatial Resolution and minimum detection
Introduction to scanning electron microscopy
Presentation on SEM (Scanning of Electron Microscope) Represented by:-Ravi Kumar Roll:- (BT/ME/1601/006)
Introduction to scanning electron microscopy
Atoms, Molecules & Ions Isotopes and % Abundance
Electron microprobe in Askja
Photons: Light Waves Behaving as Particles
Electron probe microanalysis EPMA
Electron probe microanalysis - Scanning Electron Microscopy EPMA - SEM
Andrew D. Hardie, MD Carlo N. De Cecco, MD
Introduction to Scanning Electron Microscope by Sameer S
NANO 230 Micro/NanoFabrication
Chapter 4- Understanding the Line Spectra
PATTERNS OF REACTIVITY
Electron probe microanalysis EPMA
Preface: What’s EPMA all about? How does Geology 777 work?
The Sun The Sun’s Spectrum
Electron probe microanalysis - Scanning Electron Microscopy EPMA - SEM
Alberto Sánchez-Marroquín, S. T. Parker, J. Trembath, I. Burke, J. B
Electron probe microanalysis EPMA
Do it with electrons !.
Determining Composition through X-Ray Photoelectron Spectroscopy
Electron probe microanalysis - Scanning Electron Microscopy EPMA - SEM
A New Atomic Model Section 4.1.
Acquiring Images in the SEM
Scanning Electron Microscopy (SEM)
Key Areas covered The bohr model of the atom
Energy dispersion x-ray ( EDX) resulting as incident electron strike unexcited atoms, electrons from inner shell will be ejected and leave a hole. Electrons.
Raman Spectroscopy A) Introduction IR Raman
Acquiring Images in the SEM
Presentation transcript:

Electron probe microanalysis Low Voltage SEM Operation Created 9/22/10

What’s the point? Traditionally SEMs and microprobes operate at gun voltages (E0) in the range from 15-20 kV. However, it is possible to operate at a wider range of accelerating voltages: down to around 1 kV as well as up to 30 kV. There are benefits under certain conditions of operating at these different (esp. lower) voltages.

“Thinking like an electron” You have seen with your Monte Carlo simulations that for a constant material, dropping the incident electron kV value will decrease the scattering of the electrons in the sample. In fact this decrease goes approximately as a 1.7 power, i.e. dropping from 15 to 1.5 kV will reduce the electron range (scatter) by 101.7 which is a factor of 50!

Figure showing the SE1 and SE2 As seen in the figure SE1’s occur immediately at the beam impact point. Of course, electrons continue to scatter within the sample and SE2’s will emerge over a range of distances from that central point. Dropping the E0 therefore should produce better resolution electron images.

There are potentially limits, however, to low voltage imaging: Will the gun put out a “bright” enough beam at the particular lower voltage? Is the sample surface clean? Going to lower kV means that any junk on the surface will be preferentially enhanced in the image. -- On the other hand, if what you WANT to image is the junk on the surface, lower kV is definitely called for! SE detectors operate pretty well down to very low voltages (at or below 1 kV). However, many BSE detectors start to become less sensitive as you drop below 10 kV. However, our Hitachi S3400 BSE detector works very well below 5 kV and even gives a weak image at 1 kV.

EDS at Low Voltages In many cases, you are not just collecting images, but using EDS to qualitatively determine the composition of some phase in your sample. Operating at 15 or 20 kV gives access to K lines of elements from B to ~Se, to L lines of elements from Fe to ~Au or Pb, and M lines of most of the rest of the periodic table. However, operating at say 5 kV reduces the lines that are available for EDS examination -- and they are all crunched together, with potentially many interferences and non-unique interpretations.

Interferences at Low Voltages As Newberry (2002) points out, EDS operation at low kV is fraught with difficulties, as demonstrated in his figure. If oxygen and/or carbon are present (either intentionally or not!), there are many important L and M lines that are overlapped. From Newberry 2002 Figure 6

Additionally, as the surface layers become more important (that’s the region the electrons are paying more attention to), then little details like oxide skins (most metals will form some oxide layer, even gold, according to one report I’ve seen). Therefore, a single low voltage EDS spectrum can be a convolution of both the deeper material composition plus the surface skin contribution -- which makes for non-unique solutions to the question: is there trace amounts of oxygen present in this metal?

Why do some say use high kV for better images? A lot of books and folks with years of experience say that higher kV gives better images. I assume there must be something to this, though I cannot say I’ve seen any side by side study of images from 5 kV to say 30 kV. For example, Goldstein et al, p. 197 go thru an explanation why a 30 kV image of Silicon would be sharp at 100,000 X -- for a 1 nm! resolution beam on a 1024x1024 pixel image (=1 nm pixels) the 1 nm SE1 “signal” would have a high signal/noise ratio, with the SE2 noise “being constant” and therefore presumably vanishing. However, nowhere do they explain why this is not the case also at say 15 kV, and why 30 is better than 15 kV.

Why do some say use high kV for better images? Is it something inherent in 30 kV? Is it that the SEM’s gun is “brighter” (more electrons in a tighter beam) at higher vs lower kV? Is the detector more sensitive at higher kV? My suggestion: be empirical… try going to higher, then to lower kV, and see what you think is better…. and let me know what you decide!