Secondary Electron Emission and Photoemission Tests

Keithley Meters Keithley sourcemeters were delivered a few weeks ago Finished initial programming in Labview to control these meters We plan on attaching the meters to the system this week We have configured the meters to control an applied voltage to the sample, which will allow us to vary the energy of the incident electrons An applied positive voltage to the detector will allow better collection of secondary electrons These voltage must be carefully tuned so that the primary electrons are not deflected away from the sample

SEE and LEEDS We are currently investigating methods for pulsing the electron gun for the LEEDS setup This should allow for the limited testing of some low conductivity materials While the power supply does not have a method to pulse, it may be possible to redirect the beam

Photoemission There will be some delay for photoemission This will involve some work within the XPS system, taking it offline. Modification of the sample holder will be necessary to direct light from the source to the sample Significant relocation of electrical equipment will be required My primary concern at the moment will be SEE