Fig. 1 Schematics of test samples and HRTEM images.

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Fig. 1 Schematics of test samples and HRTEM images. Schematics of test samples and HRTEM images. (A) Schematics of the overcoat designs: Monolithic overcoats 7CP (sample B), 7CF (sample C), and 7SiNx (sample D); carbon superlattice overcoat 2(T1/2CF) (sample E); C/SiNx multilayer overcoats 2(1.5SiNx/2CP) (sample F), 2(1.5SiNx/2CF) (sample G), 2(1SiNx/T2/2CF) (sample H), 0.75SiNx/2.75CF/1.5SiNx/2CF (sample I), 1.5SiNx/2CF/0.75SiNx/2.75CF (sample J), 2(0.75SiNx/2.75CP) (sample K), 2(0.75SiNx/2.75CF) (sample L), and 2(0.7SiNx/T4/2.75CF) (sample M). Sample A is plasma-cleaned bare AlTiC substrate. The prefixed numbers represent the thickness of the respective layer in nanometers, while the letters F and P represent carbon deposition by FCVA (F) and pulsed dc sputtering (P), respectively. High-energy carbon treatment of 350-eV C+ ions (labeled as Tn, where n = 1, 2, 3, and 4) is performed either to enhance the atomic mixing in the C/SiNx multilayer overcoats (T2, T3, and T4) or to construct a carbon superlattice structure (T1, where T1 adds 1.5 nm carbon thickness). The deposition times for T2, T3, and T4 are adjusted in such a way that they contribute to <1-, <0.3-, and <0.5-nm thicknesses, respectively, to the total overcoat thickness. (B) Cross-sectional HRTEM images with measurements of the overcoat thickness in samples C, E, K, and M. In all images, capping layers of tantalum (Ta) are deposited by magnetron sputtering before and after overcoat deposition on Si wafer substrates, as labeled, to provide image contrast for accurate overcoat thickness determination. Neeraj Dwivedi et al. Sci Adv 2019;5:eaau7886 Copyright © 2019 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).