Scattering and Interference in Epitaxial Graphene

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Scattering and Interference in Epitaxial Graphene by G. M. Rutter, J. N. Crain, N. P. Guisinger, T. Li, P. N. First, and J. A. Stroscio Science Volume.
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Scattering and Interference in Epitaxial Graphene by G. M. Rutter, J. N. Crain, N. P. Guisinger, T. Li, P. N. First, and J. A. Stroscio Science Volume 317(5835):219-222 July 13, 2007 American Association for the Advancement of Science

Fig. 1. STM topographic images of defects in the bilayer epitaxial graphene sample. STM topographic images of defects in the bilayer epitaxial graphene sample. (A) Large field of view showing a variety of defects. Type A defects (red arrow) are subsurface irregularities blanketed by graphene. The defect indicated by the red arrow has a height of 2 Å. Type B defects are atomic-scale defects in the graphene lattice. Higher-magnification images from the boxed regions in (A) are shown: a defect-free region (B) and complex scattering patterns around type B defects [(C) and (D)]. Tunneling setpoint: I = 100 pA, V = 300 mV. G. M. Rutter et al. Science 2007;317:219-222 American Association for the Advancement of Science

Fig. 2. Defect scattering in bilayer epitaxial graphene. Defect scattering in bilayer epitaxial graphene. (A) STM topography and (B to E) simultaneously acquired spectroscopic dI/dV maps. Type A defects (mounds) and type B defects are labeled with red and blue arrows, respectively. Sample biases are: (B) –90 mV, (C) –60 mV, (D) –30 mV, and (E) 30 mV. I = 500 pA, V = 100 mV, ΔV = 1 mVrms where ΔV is the modulation voltage. G. M. Rutter et al. Science 2007;317:219-222 American Association for the Advancement of Science

Fig. 3. Bilayer graphene topography (A) and simultaneous dI/dV maps at sample bias voltages of (B) –31 mV, (C) –13 mV, (D) 1.0 mV, and (E) 21 mV. Bilayer graphene topography (A) and simultaneous dI/dV maps at sample bias voltages of (B) –31 mV, (C) –13 mV, (D) 1.0 mV, and (E) 21 mV. The type B scattering centers lie outside the image region [see lower left corner of (A)]. (F to I) dI/dV (color scale) versus sample bias (horizontal axis) and distance (vertical axis) along corresponding red lines in (B) to (E). The blue-white-red color scale spans the conductance values observed in (J) to (M). (J to M) Line-averaged dI/dV spectra obtained from regions marked by red lines in (B) to (E). The spectra are averages of nine curves acquired at positions of the \batchmode \documentclass[fleqn,10pt,legalpaper]{article} \usepackage{amssymb} \usepackage{amsfonts} \usepackage{amsmath} \pagestyle{empty} \begin{document} \(\sqrt{3}{\times}\sqrt{3}\) \end{document} interference maxima in the region of the red lines. Peaks in the dI/dV spectra correlate with maxima in the long-wavelength modulation of the \batchmode \documentclass[fleqn,10pt,legalpaper]{article} \usepackage{amssymb} \usepackage{amsfonts} \usepackage{amsmath} \pagestyle{empty} \begin{document} \(\sqrt{3}{\times}\sqrt{3}\) \end{document} interference pattern. Blue arrows indicate the bias (energy) position of the corresponding conductance images in (B) to (E). I = 500 pA, V = 100 mV, ΔV = 0.7 mVrms. G. M. Rutter et al. Science 2007;317:219-222 American Association for the Advancement of Science

Fig. 4. (A) Schematic of the 2D Brillouin zone (blue lines), constantenergy contours (green rings) at the K± points, and the two dominant classes of scattering vectors that create the interference patterns. k1 and k2 denote the wave vectors of incident and scattered carriers. (A) Schematic of the 2D Brillouin zone (blue lines), constantenergy contours (green rings) at the K± points, and the two dominant classes of scattering vectors that create the interference patterns. k1 and k2 denote the wave vectors of incident and scattered carriers. Scattering wave vectors q1 (short red arrow) are seen to connect points on a single constant-energy circle, and wave vectors q2 (long red arrow) connect points on constant-energy circles between adjacent K+ and K– points. Red circles indicate graphene reciprocal lattice points with origin Γ. (B) q-space map of scattering amplitudes, obtained from the Fourier transform power spectrum of the dI/dV map in Fig. 2D. q1 scattering forms the small ring at q = 0, whereas q2 events create the six circular disks at K± points. (C) Angular averages of the central q1 ring from the q-space maps, at bias voltages from –100 to –20 mV shown in 10-mV increments, arb., arbitrary units. (D) Energy dispersion as a function of κ for bilayer graphene determined from the q-space profiles in (C) and similar data. Values shown are derived from the radii of the central q1 scattering rings (red squares) and from the angle-averaged radii of the scattering disks at K+ and K– (blue triangles). Dashed line shows a linear fit to the data with vF = (9.7±0.6) × 105 m/s and an energy intercept of –330 ± 20 meV. Similar results are found for a single monolayer of graphene (fig. S2D) (18). The error bars represent the typical combined statistical and systematic uncertainties estimated for each data set. G. M. Rutter et al. Science 2007;317:219-222 American Association for the Advancement of Science