Implantation detector as active stopper Rakesh Kumar, P. Doornenbal, I

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Presentation transcript:

Implantation detector as active stopper Rakesh Kumar, P. Doornenbal, I Implantation detector as active stopper Rakesh Kumar, P. Doornenbal, I. Kojouharov, W. Prokopowicz, H. Schaffner, H.J. Wollersheim Active catcher for implantation-decay correlations Double-sided silicon-strip detectors (DSSSD) - surface 5x5 cm2 - thickness 1 mm - 2 x 16 3.125 mm strips - manufactured by MICRON implantation of several ions: thickness and area subsequent beta decay of stopped ions implantation-decay position correlation: granularity

Rare ISotope INvestigation at GSI Spectroscopy at stopped beams n - det. g - det. identified projectile fragments g - det. DSSD for HI and β Projectile Decays implantation ↔ range focusing position correlation ↔ high garnularity time correlation ↔ dedicated electronics Projectile Implants TRIGGER : SC 41 & DSSSD DSSSD & g,s

Implantation detector as active stopper Rakesh Kumar, P. Doornenbal, I Implantation detector as active stopper Rakesh Kumar, P. Doornenbal, I. Kojouharov, W. Prokopowicz, H. Schaffner, H.J. Wollersheim 4 old DSSSD (already used in HI beam) 1 new DSSSD Test with mesytec electronics Multi Channel Systems electronics Using 241Am (alpha) source and 207Bi (electron) source Measurements performed in vacuum and dry nitrogen

Measurements with a double-sided Si-strip detector Rakesh Kumar, P Measurements with a double-sided Si-strip detector Rakesh Kumar, P. Doornenbal, I. Kojouharov, W. Prokopowicz, H. Schaffner, H.J. Wollersheim Rear Ohmic Side Front Junction Side CAEN 32 Micron Semiconductor Nº Junction Elements: 16 Element Length: 49.5 mm Element Pitch: 3.1 mm Element width: 3.0 mm Active Area: 50x50 mm2 Thickness: 1000 µm Price: 5600 € MPR-32 Charge Sensitive Preamplifier 32 channel compact module Sensitivity switch, factor 5 Bias voltage up to ±400V Price: 2790 € STM-16 16 fold shaper 16 channel NIM module shaper amplifier timing filter amplifier leading edge discriminator Price: 2x 3415 € ADC V785AF 32 channel Price: 5094 € MRC-1 rc master controller for STM-16 Price: 2200 € Total cost 22,514.- €

Energy resolution with 241Am Source measurement in vacuum Front Junction Side Rear Ohmic Side Low energy peak from gap events at about ½ the full pulse height C.Wrede et al. NIM B204 (2003), 619 MICRON #2215-17 Voltage: 200V 241Am Eα=5.486 MeV range ~28 µm

Strip Multiplicity with 241Am Source Front Junction Side Rear Ohmic Side MICRON #2215-17 Voltage: 40V below full depletion measurement in vacuum MICRON #2215-17 Voltage: 200V full depletion voltage measurement in vacuum 241Am Eα=5.486 MeV range ~28 µm Front Junction Side Rear Ohmic Side

Two Dimensional Position Spectra 241Am source centered 241Am source centered, strip-multiplicity=1 241Am source left 241Am source left, strip-multiplicity=1 MICRON #2243-5 Voltage: 40V, measurement in vacuum

Energy resolution with 207Bi Source measurement in vacuum Front Junction Side Rear Ohmic Side MICRON #2512-17 Voltage: 200V 207Bi E=482, 976 keV range 0.94, 2.31 mm (e-e- interaction) experimental set-up

Energy resolution with 207Bi Source measurement in vacuum Front Junction Side Rear Ohmic Side MICRON #2512-17 Voltage: 200V 207Bi E=482, 976 keV range 0.94, 2.31 mm (e-e- interaction) experimental set-up

Energy resolution with 207Bi Source measurement in vacuum Front Junction Side Rear Ohmic Side MICRON #2512-17 (full lines) #2243-5 (dashed lines) Voltage: 200V 207Bi E=482, 976 keV range 0.94, 2.31 mm (e-e- interaction) experimental set-up

Energy resolution with 207Bi Source measurement in vacuum and dry N2 Front Junction Side Rear Ohmic Side MICRON #2243-5 Voltage: 200V conclusion: measurement in dry N2 207Bi E=482, 976 keV range 0.94, 2.31 mm (e-e- interaction) experimental set-up

Energy resolution of the DSSD MICRON ∆E (241Am) vacuum ∆E(207Bi) vacuum ∆E(207Bi) dry nitrogen #2243-5 N: 31.3 keV N: 16.2 keV P: 33.3 keV N: 16.0 keV P: 32.5 keV #2243-4 N: 30.2 keV N: 18.5 keV #2243-3 N: 34.0 keV N: 18.2 keV #2243-2 N: 35.7 keV N: 14.5 keV P: 27.0 keV #2512-17 N: 27.4 keV P: 29.7 keV N: 14.8 keV P: 18.8 keV Front Junction Side ∆E=15.4 keV Rear Ohmic Side ∆E=32.5 keV experimental set-up 207Bi Ee=976 keV ; 241Am Eα=5.486 MeV

Energy threshold of the DSSSD 207Bi Ee=482, 976 keV experimental set-up

Measurements with a double-sided Si-strip detector Rear Ohmic Side CAEN Front Junction Side CAEN 32 Micron Semiconductor Nº Junction Elements: 16 Element Length: 49.5 mm Element Pitch: 3.1 mm Element width: 3.0 mm Active Area: 50x50 mm2 Thickness: 1000 µm Price: 5600 € CPA-16 Charge Sensitive Preamplifier 16 channel compact module 2 output stages with different gains Bias voltage up to ±500V Price: 2x 2250 € Amplifier N 568BC 16 fold shaper Price: 2x 3481 € ADC V785AF 32 channel Price: 2x 5094 € Total cost 27,250.- € (discriminator not included)

Energy resolution with 207Bi Source measurement with Mesytec and Multi Channel Systems Front Junction Side MICRON #2243-5 Voltage: 200V measurement in vacuum experimental set-up

Energy resolution with 207Bi Source measurement with Multi Channel Systems ORTEC 572 MICRON #2243-5 Voltage: 200V measurement in vacuum CAEN N568BC experimental set-up

Implantation detector as active stopper Active catcher for implantation-decay correlations Measurements with 207Bi (electron) source mesytec: 15 keV (FWHM), energy threshold 150 keV Multi Channel Systems: 100 keV (FWHM), energy threshold 300keV same results in vacuum and dry nitrogen RISING experiments with dry nitrogen

Chamber for Active Stopper (measurement in dry N2) Pertinax phenolic-formaldehyd cellulose-paper PF CP 2061 result: 6mm Pertinax ≈ 2mm Al 2mm Pertinax for active stopper chamber

Chamber for Active Stopper (Pertinax)

Stopped Rising Array @ GSI: 15 x 7 element CLUSTERs with double-sided Si-strip detector

RISING: Stopped beam campaign

RISING: Stopped beam campaign BEAMS 84Kr and 136Xe at 100 MeV/u , 500 MeV/u and 1GeV/u mesytec electronics HI position measurements (X-Y) and beta decay measurements (E,X-Y) Multi Channels Systems HI implantation measurements (E,X-Y) , no beta decay measurements PROPOSAL: Primary beam for HI implants-----Trigger from SC-41 & DSSSD Beta Source 207Bi near detector to look for e-- g ----- Trigger from DSSSD & g’S One can separately measure both using different triggers

RISING: Test of the active stopper γ-energy [keV] e--energy 569.6 481.7 [K] 553.8-556.7 [L] 565.8-567.2 [M] 1063.7 975.7 [K] 1047.8-1050.6 [L] 1059.8-1061.2 [M] 207Bi emits gamma rays and electrons

g g g