SIDECAR ASIC characterization

Slides:



Advertisements
Similar presentations
Controller Tests Stephen Kaye Controller Test Motivation Testing the controller before the next generation helps to shake out any remaining.
Advertisements

H1 SILICON DETECTORS PRESENT STATUS By Wolfgang Lange, DESY Zeuthen.
Lessons Learned from a Decade of SIDECAR ASIC Applications
256 channel data acquisition system for VISTA focal plane to readout sixteen 2k x 2k VIRGO detectors Largest ever such system.
Application of the SIDECAR ASIC as the Detector Controller for ACS and the JWST Near-IR Instruments Markus Loose STScI Calibration Workshop July 22, 2010.
Part 1: Introduction FRC Introduction  FRC 2907 since 2008  Each area of the robot has a team assigned  The Electronics team is headed this year.
CR1000s are only one part of a data acquisition system. To get good data, suitable sensors and a reliable data retrieval method are required. A failure.
CR1000s are only one part of a data acquisition system. To get good data, suitable sensors and a reliable data retrieval method are required. A failure.
Yu. Artyukh, V. Bespal’ko, E. Boole, V. Vedin Institute of Electronics and Computer Science Riga, LATVIA 16th International Workshop on Laser.
A High-speed Adaptively-biased Current- to-current Front-end for SSPM Arrays Bob Zheng, Jean-Pierre Walder, Henrik von der Lippe, William Moses, Martin.
CCD and CCD readout : Engineering diagnostics during development, commissioning and operation Pierre Antilogus C. Juramy, H.Lebbolo, S. Russo, V.Tocut.
Mathieu Goffe EUDET JRA1 meeting, DESY Wednesday 30 January 2008 IPHC, 23 rue du Loess BP 28, 67037, Strasbourg Cedex 02, France.
USB controller chip USB connector Spartan-III FPGA as a main controller D Connector for 5 volt DC voltage in SMA connector for external clock / sync On.
Readout Electronics: SIDECAR ASIC Hardware
ECE 8443 – Pattern Recognition ECE 8423 – Adaptive Signal Processing Objectives: Introduction SNR Gain Patterns Beam Steering Shading Resources: Wiki:
Presentation of the DriveLab Board Opal-RT Real-time institute 2009.
DCDS for roundtable Paul Jorden 10 Oct 2013 Scientific Detector Workshop, Florence e2vMatthew Bastable and others RAL Matthew Clapp and others.
What is an Amplifier…? An Amplifier is a device which takes small voltage at the input, amplifies it and produce higher voltage at the output. The gain.
CLIC and ILC Power Distribution and Power Pulsing Workshop Summary Document 10/5/2011G. Blanchot1.
 In computing, an input device is a peripheral (piece of computer hardware equipment) used to provide data and control signals to an information processing.
Xiangming Sun1PXL Sensor and RDO review – 06/23/2010 STAR XIANGMING SUN LAWRENCE BERKELEY NATIONAL LAB Firmware and Software Architecture for PIXEL L.
UV - Visible Systems Peter Moore AURA / NOAO / ETS.
In and Out are opposites. This is something to keep in mind when considering Input and Output. INPUT OUTPUT Ask: Does this device send information in?
DEPARTEMENT DE PHYSIQUE NUCLEAIRE ET CORPUSCULAIRE JRA1 - Data Acquisition Status Report Daniel Haas DPNC Genève Extended SC Meeting 1 Sep 2008.
P. Aspell CERN April 2011 CMS MPGD Upgrade …. Electronics 2 1.
Sensor testing and validation plans for Phase-1 and Ultimate IPHC_HFT 06/15/ LG1.
Input, Output, Storage Devices
LC Power Distribution & Pulsing Workshop, May 2011 Super-ALTRO Demonstrator Test Results LC Power Distribution & Pulsing Workshop, May nd November.
Electronic System Design GroupInstrumentation DepartmentRob Halsall et al.Rutherford Appleton Laboratory30 July 2001 CMS Tracker FED CMS Tracker System.
January 17, MICE Tracker Firmware Dead Time and Muon Detection Studies for the MICE Tracker Tracker Data Readout Basics Progress in Increasing Fraction.
The InGaAs IR Array of Chunghwa Telecom Laboratory Chueh-Jen Lin and Shiang-Yu Wang, Optics and Infrared Laboratory In 2006, Advanced Technology Laboratory.
Brandon Halleran.  The power supply for your personal computer gives your machine all the different voltages it needs to operate properly. It is able.
Exciting Applications of Polynomials Why Learning Polynomials?
Noise Characterization of the SIDECAR ASIC Readout Chip for SNAP Martin Diaz Stanford Linear Accelerator Center August 14, 2008.
Date of download: 6/3/2016 Copyright © 2016 SPIE. All rights reserved. Block diagram of the proposed ATR system. Figure Legend: From: Development of an.
Date of download: 6/6/2016 Copyright © 2016 SPIE. All rights reserved. The block diagram of the CMOS readout circuit structure. Figure Legend: From: Design.
Date of download: 6/23/2016 Copyright © 2016 SPIE. All rights reserved. Conventional spin-scan mode reticle seeker with a single element detector. Figure.
Week 22: Schematic Week 23-Week 27: Routing Gerber files have been available since 9th July 1st prototype: – PCB manufacturer: supervised by KIT – Cabling:
Date of download: 7/11/2016 Copyright © 2016 SPIE. All rights reserved. Configuration of the integrated electro-optic electric field (E-field) measurement.
MADEIRA Valencia report V. Stankova, C. Lacasta, V. Linhart Ljubljana meeting February 2009.
Arduino based Automatic Temperature Controlled Fan Speed Regulator.
ASICs1 Drain Current Digitizer Chip (DCD) Status and Future Plans.
Components of Mechatronic Systems AUE 425 Week 2 Kerem ALTUN October 3, 2016.
Intro to USB-6009 DAQ.
Marcin Chrząszcz Cracow University of Technology Itamar Levy
96-channel, 10-bit, 20 MSPS ADC board with Gb Ethernet optical output
Detectors of JWST Near IR Instruments
S-D analog to digital conversion
Scientific Detector Workshop, Baltimore, September 2017
MaPSA-Light Chip Test setup firmware Brown: M. Narain and others
Muon Recording Studies and Progress for the MICE Tracker
How to avoid catching things on fire.
Σ-D Analog to Digital Converter for CMOS Image Sensors Nonu Singh (RIT, MicroE Co-Op) Background After fabricating an imaging sensor it needs to be characterized.
LX1701 Key Features Key Features No output filter required
Front-end electronic system for large area photomultipliers readout
MAHESH BURSE, IUCAA, PUNE, INDIA
SIDECAR ASIC Characterization Dan Pontillo
Status of n-XYTER read-out chain at GSI
Background Developed by Teledyne Scientific & Imaging, LLC
Test Beam Measurements october – november, 2016
GLAST Large Area Telescope:
Detector Parameters Marco Sirianni - ESA.
PERSPECTIVE ON MICROWAVE MONITOR AND CONTROL INTERFACES
Protect Your Hardware from Hacking and Theft
BESIII EMC electronics
Electronics and DAQ for the GEM Detector
Turning photons into bits in the cold
Eye Movement Tracking Device Senior Design Project: P09004
Using FPGA to Provide Faster Digitally Enhanced Images in Order to Demonstrate a More Efficient Way to Process Images When Compared to Using Software.
Presentation transcript:

SIDECAR ASIC characterization Background The SIDECAR ASIC was developed by Teledyne Scientific & Imaging, LLC in an effort to streamline the normally bulky and power-hungry focal plane-electronics which are used to control imaging sensors. The SIDECAR can generate the necessary clock signals and bias voltages needed to operate the detector while simultaneously digitizing detector outputs. Reducing the size and mass of the detector control electronics is important in space missions which have mass limits. This device will be used on the Hubble Space Telescope to replace the now broken electronics. The SIDECAR will be used on the James Webb Telescope as well. To achieve optimal performance with any given imaging sensor, the SIDECAR must be configured to specific sensor requirements. This demands a high understanding of the SIDECAR and how to program it. Testing The Sidecar ASIC’s baseline performance must be measured and tested with respect to its various modes of operation, firmware settings and experimental setups. The Sidecar’s firmware must also be pared down to a simple linear readout format, minimizing the amount of noise from signal conditioning and processing. Once a baseline operational mode is achieved, the Sidecar is subjected to a battery of standard tests for digitization hardware and analog electronics. These tests will be important in determining the optimal configuration for the SIDECAR for any given application. Thus allowing us to better control imaging sensors and optimizing their performance. ABOVE: Sidecar ASIC. All signal conditioning, clock/bias generation and digitization hardware is self-contained in this small chip. ABOVE: Detector control electronics built by Astronomical Research Cameras, Inc. The SIDECAR has the same capability as this set of electronics. ABOVE: SIDECAR read noise results from two distinct setups in an experiment to remove a noise pattern. In this experiment, one input channel on the SIDECAR was fed a 1V DC signal from a power supply. In SETUP A the ASIC was powered by an AC/DC converter via the USB cable. In SETUP B the SIDECAR is powered by the laptop battery via the USB cable. The noise difference in the two setups can be attributed to the power source for the ASIC. This is an example of the tests needed to be preformed to determine the optimal operation of the SIDECAR. The SIDECAR ASIC: focal plane electronics on a single chip Markus Loose et al.,     Proc. SPIE Int. Soc. Opt. Eng. 5904, 59040V (2005) (10 pages) ABOVE: Sidecar ASIC performance specification table