Specimen Preparation XRD Pikes Peak 1 & 2

Slides:



Advertisements
Similar presentations
Melbourne Continuous On-line Measurement of Process Mineralogy for Quality Control and Optimisation using X-ray Diffraction Dr Peter Storer Principle Scientist,
Advertisements

Powder X-ray diffraction – the uses
(see Bowen & Tanner, High
Development of Bialkali Transfer Photocathodes for Large Area Micro- Channel Plate Based Photo Detectors 1 Argonne National Laboratory, Argonne, IL 2 University.
X-ray Clinics 2005 in Review ICDD CLINICS X-ray Fluorescence Spectrometry Clinic Practical XRF, May 2-6, 2005 X-ray Powder Diffraction Clinic Session.
1 SpectroscopIC aNALYSIS Part 7 – X-ray Analysis Methods Chulalongkorn University, Bangkok, Thailand January 2012 Dr Ron Beckett Water Studies Centre &
CHAPTER 3: CRYSTAL STRUCTURES X-Ray Diffraction (XRD)
Claylab Applied Geology & Mineralogy X-ray diffraction A tool for material characterization and mineral quantification 1 Rieko Adriaens
ICDD Workshop 1 and 3 Sample Preparation Group C Photographs by Stephen Williams.
X-Ray Analytical Methods X-Ray Analytical Methods X-ray radiography is used for creating images of light-opaque materials relies on the relationship between.
Preparation & Characterization of heterogeneous catalyst
X-Ray Crystallography The most important technique for mineralogy The most important technique for mineralogy Direct measurement of atomic arrangement.
Synchrotron Diffraction. Synchrotron Applications What? Diffraction data are collected on diffractometer beam lines at the world’s synchrotron sources.
Are your X-ray powder diffraction patterns any good? Are your X-ray powder diffraction patterns any good?
X-Ray Diffraction. The XRD Technique Takes a sample of the material and places a powdered sample which is then illuminated with x-rays of a fixed wave-length.
Yat Li Department of Chemistry & Biochemistry University of California, Santa Cruz CHEM 146C_Experiment #3 Identification of Crystal Structures by Powder.
X-ray diffraction to identify phases
Comminution (milling, grinding), sifting and mixing. Principle of equipment work.
Timothy G. Fawcett, Soorya N. Kabbekodu, Fangling Needham and Cyrus E. Crowder International Centre for Diffraction Data, Newtown Square, PA, USA Experimental.
IPCMS-GEMME, BP 43, 23 rue du Loess, Strasbourg Cedex 2
Atomic Force Microscopy Studies of Gold Thin Films
Catalysis and Catalysts - X-Ray Diffraction (XRD) X-Ray Diffraction Principle: interference of photons by reflection by ordered structures n = 2d sin 
Thin Film Quantitation of Chemistry and Thickness Using EPMA John Donovan Micro Analytical Facility CAMCOR (Characterization of Advanced Materials in Oregon)
Submitted By:- Nardev Kumar Bajaj Roll NO Group-C
Thin Film Deposition Prof. Dr. Ir. Djoko Hartanto MSc
Organization of hydrogen energy technologies training.
It's cute (可爱)……… But does it DO anything??.
Unit 2, Part 3: Characterizing Nanostructure Size Dr. Brian Grady-Lecturer
STRUCTURAL CHANGES STUDIES OF a-Si:H FILMS DEPOSITED BY PECVD UNDER DIFFERENT HYDROGEN DILUTIONS USING VARIOUS EXPERIMENTAL TECHNIQUES Veronika Vavruňková.
Good Practice Guide & the Residual Stress Working Group Tony Fry National Physical Laboratory BSSM Workshop : The Measurement of Residual Stress using.
Scanning Electron Microscopy
6- PRENTICE HALL ©2007 Pearson Education, Inc. Upper Saddle River, NJ CRIMINALISTICS An Introduction to Forensic Science, 9/E By Richard Saferstein.
Applying X-Ray Diffraction in Material Analysis Dr. Ahmed El-Naggar.
A Raman spectrum gives a unique chemical signature of a specimen The Raman microscopy is used extensively in the following applications: Pharmaceuticals.
Mike Rusak and Laura Fairburn CURRENT OBSTACLES ON THE APPLICATION OF AMBIENT IONIZATION MS IN FORENSICS.
X-Ray Measurement Methods From Chapter 6 of Textbook 2 and other references Diffractometer Hull/Debye-Scherrer method Pinhole method Laue Method Rotating.
Reminders Quiz#2 and meet Alissa and Mine on Wednesday –Quiz covers Bonding, 0-D, 1-D, 2-D, Lab #2 –Multiple choice, short answer, long answer (graphical.
Micromechanical Testing of Thin Films WarrenOliver MTS Nano Instruments Oak Ridge, Tennessee.
Introduction P. Chelvanathan 1, Y. Yusoff 2, M. I. Hossain 1, M. Akhtaruzzaman 1, M. M. Alam 3, Z. A. AlOthman 3, K. Sopian 1, N. Amin 1,2,3 1 Solar Energy.
Center for Materials for Information Technology an NSF Materials Science and Engineering Center Substrate Preparation Techniques Lecture 7 G.J. Mankey.
INFRARED SPECTROSCOPY
Least squares & Rietveld Have n points in powder pattern w/ observed intensity values Y i obs Minimize this function: Have n points in powder pattern w/
The Muppet’s Guide to: The Structure and Dynamics of Solids XRD.
Passivation of HPGe Detectors at LNL-INFN Speaker: Gianluigi Maggioni Materials & Detectors Laboratory (LNL-INFN) Scientific Manager: Prof. Gianantonio.
2001 Denver X-ray Conference Steamboat Springs, Colorado 50 Years of Progress & Development.
결정 구조 분석 結晶 構造 分析 Analysis of Crystal Structure 일반화학 Chemistry
Characterization of Coal Ash by Materials Science Techniques R. J. Lauf Metals & Ceramics Division Oak Ridge National Laboratory.
Miral Shah Course: Thermodynamics and kinetics of confined fluids
EBB245 Material Characterisations Lecture 2. X-ray Diffraction Methods Dr Zainovia Lockman Lecture 2. X-ray Diffraction Methods Dr Zainovia Lockman 1.
UV/VIS SPECTROSCOPY.
Preparation Stationary Sample Holders
Pulsed Energetic Condensation of Nb Thin Film Cavities at JLab
V.O. Yukhymchuk, V.M. Dzhagan, V.P. Klad’ko,
Presentation Outline Introduction to Chapman Instruments
Other imaging techniques
Electron probe microanalysis - Scanning Electron Microscopy EPMA - SEM
Properties of Boron Subcarbide (B13C2) Synthesized by Self-propagating High-temperature Synthesis (SHS)   Lembit Kommel, Raido Metsvahi and Karl Kolju.
Chapter 6 INORGANIC ANALYSIS
X – Ray Diffraction (XRD)
Wide Angle Scattering (WAXS) (Powder Diffraction) How do we do
Preparation of Samples
Institut Laue-Langevin
BONDING The construction of any complicated mechanical device requires not only the machining of individual components but also the assembly of components.
Sample Preparation and Mapping
Kaustubh K. Rane Department of Materials Science and Engineering,
Phase identification Identification of crystalline substance and crystalline phases in a specimen is achieved by comparing the specimen diffraction spectrum.
What if you use a capillary, small specimen or transmission technique
Examples of our own Tricks
{ What is usually going to cause you trouble? Texture effects
Reducing Particle Size and Crystallite Size
Presentation transcript:

Specimen Preparation XRD Pikes Peak 1 & 2 T. Fawcett, International Centre for Diffraction Data, Newtown Square, PA N. Bhuvanesh, Texas A&M University, College Station, TX S. Quick, Pennsylvania State University, State College, PA M. Rodriguez, Sandia National Laboratory, Albuquerque, NM

Instructors 14 Years ICDD clinic instructor Assistant Prof. Computer Sci & Eng. Materials Laboratory at Sandia Specializes in in-situ diffraction, over 100 publications Dr. Nattamai Bhuvanesh Texas A & M University College Station, Texas X-ray Diffraction Laboratory, TAMU “Principles and Applications in Powder Diffraction” 22 Years at Dow Chemical, 10 at ICDD Over 40 publications

Agenda Break at ~10:15-10:30 Introduction Tim Particle Statistics Mark Cavity Mounts Sue Small or thin specimens Bhuv Our tricks All Break at ~10:15-10:30

Critical References “Preparation of Specimens for X-ray Fluorescence and X-Ray Diffraction Analysis”, Victor E. Buhrke, Ron Jenkins, Deane K. Smith (+ 30 friends), Wiley-VCH Publishers,1998 Selected Resources for X-ray Diffraction, Methods and Practices CD- ROM – “Sample Preparation Methods in X-ray Powder Diffraction” 2004 “Introduction to X-Ray Powder Diffractometry”, Ron Jenkins, Robert L. Snyder”, Wiley-Interscience Publisher, 1996 “X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials”, Harold P. Klug and L. R. Alexander, Wiley-Interscience, 1974 “X-Ray Diffraction Methods in Polymer Science”, L. R. Alexander, Wiley-Interscience, 1969 (Note: Hard to find), Kreiger Publishing, 1979

Specimen Preparation – Free Download, Advances in X-ray Analysis http://www.icdd.com/

Specimen Preparation Cast of thousands ! Contributions by global authors, references summarize work of many researchers Definitions Sample material supplied by requestor Specimen portion of sample presented to instrument

Goal of Specimen Preparation Prepare a specimen for the diffraction experiment which is representative of the sample to provide the information needed to answer the question posed. Ideally, no more time and effort should be required or expended than is necessary to meet the above goal.

Goal of Specimen Preparation An elaborate procedure is not necessary for phase confirmation Know and understand the question before starting the procedure (assumes that the requestor understands what is really needed)

Every time you prepare a sample you change it ! Make sure the sample prep technique is not destroying, altering or masking the original problem (tip - analyze before and after preparation steps) Grinding can destroy soft materials Binders can mask or dilute phases - Temperature and humidity can change phase chemistry Sieving may separate phases as well as separating particle size

Elements of Sample Prep Basic statistics Representative samples from bulk Sampling procedures (macro) Grinding Absorption and microabsorption problems Crystallinity and particle effects Specimen configuration and equipment geometry Depth of penetration Surface roughness Background, specimen holders Crystal perfection and extinction Concentration phases Slurries and slurry mounts, analyzing films, flowing materials Use of internal standards Atmosphere sensitive or toxic materials Special chemistries (metals, drugs, minerals, thin films, gems, explosives, polymers, nanomaterials) Temperature and Pressure Studies

Container says Plaster of Paris (CaSO4). It looks Peak Shift 0.05 degrees Sample was so high that it was not in the focusing plane. Container says Plaster of Paris (CaSO4). It looks this stuff has grabbed H2O and CO2 from the air over time Sample holder Red scan – Nice data but thin preparation resulted in diffraction from aluminum substrate Green Data – Very thin film on glass – too thin not enough intensity/particles Black data – Thick preparation – assymmetry in the peaks but otherwise OK Thin layer prep CTIMP1a.raw

Specimen Prep – Macro to Micro Courtesy of PANalytical Courtesy FBI

F S

Macro to Micro - Mountains to molehills Riffle Splitters Jaw Crushers Sample Thieves Pulverizer Mills (large) Slicers & Dicers Micro Mortar & Pestle Ball mill (small) Particle Sieve Particle size (microns) Particle Orientation Particle mixing

Resources at DXC ! Angstrom Inc. Chemplex Industries (pulverizers, presses) Chemplex Industries (mills, grinding media, thin films) Corporation Scientifique Claisse (weighing stations) Herzog Automation (automated preparation systems) Premier Lab Supply (presses, binders) Rocklabs Ltd (mining and ore prep) SPEX SamplePrep (cryogenic mill, films)

What is usually going to cause you trouble? Peak Width Intensity - Y-Axis Particle statistics influence intensities via orientation Specimen displacement influences position Both particle statistics and specimen displacement influence peak profiles Position - X-Axis (d-spacing)