Silicon: 14 electrons 4 in outer shell.

Slides:



Advertisements
Similar presentations
Agenda Semiconductor materials and their properties PN-junction diodes
Advertisements

P-N JUNCTION.
1 Chapter 5-1. PN-junction electrostatics You will also learn about: Poisson’s Equation Built-In Potential Depletion Approximation Step-Junction Solution.
ECE G201: Introductory Material Goal: to give you a quick, intuitive concept of how semiconductors, diodes, BJTs and MOSFETs work –as a review of electronics.
© Electronics ECE 1312 Recall-Lecture 2 Introduction to Electronics Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration,
1 Fundamentals of Microelectronics  CH1 Why Microelectronics?  CH2 Basic Physics of Semiconductors  CH3 Diode Circuits  CH4 Physics of Bipolar Transistors.
Introduction to electronics (Syllabus)
Conduction in Metals Atoms form a crystal Atoms are in close proximity to each other Outer, loosely-bound valence electron are not associated with any.
Semiconductor Physics - 1Copyright © by John Wiley & Sons 2003 Review of Basic Semiconductor Physics.
AMPLIFIERS, DIODES,RECTIFIERS,WAVESHAPPING CIRCUITS
Department of EECS University of California, Berkeley EECS 105 Fall 2003, Lecture 8 Lecture 8: Capacitors and PN Junctions Prof. Niknejad.
Department of Information Engineering256 Semiconductor Conduction is possible only if the electrons are free to move –But electrons are bound to their.
The Devices: Diode Once Again. Si Atomic Structure First Energy Level: 2 Second Energy Level: 8 Third Energy Level: 4 Electron Configuration:
Lecture 3. Intrinsic Semiconductor When a bond breaks, an electron and a hole are produced: n 0 = p 0 (electron & hole concentration) Also:n 0 p 0 = n.
EE415 VLSI Design The Devices: Diode [Adapted from Rabaey’s Digital Integrated Circuits, ©2002, J. Rabaey et al.]
The Devices: Diode.
ECE 3336 Introduction to Circuits & Electronics Dr. Dave Shattuck Associate Professor, ECE Dept. Lecture Set #17 Diodes W326-D3.
Microelectronics Circuit Analysis and Design
Drift and Diffusion Current
Introduction To Semiconductors
ECE 250 – Electronic Devices 1 ECE 250 Electronic Device Modeling.
Copyright © The McGraw-Hill Companies, Inc. Permission required for reproduction or display. ECE 255: Electronic Analysis and Design Prof. Peide (Peter)
Taklimat UniMAP Universiti Malaysia Perlis WAFER FABRICATION Hasnizah Aris, 2008 Lecture 2 Semiconductor Basic.
Lecture 4 OUTLINE Semiconductor Fundamentals (cont’d)
Electronics 1 Lecture 3 Moving Charge Carriers
AELE237Semiconductor Materials1 Semiconductor Materials and pn Junctions T. Floyd, “Electronic Devices”, Maxwell Macmillan International Editions, Chapter.
Introduction to Semiconductors
EE105 - Spring 2007 Microelectronic Devices and Circuits
Semiconductors – Learning Outcomes
CSE251 CSE251 Lecture 2 and 5. Carrier Transport 2 The net flow of electrons and holes generate currents. The flow of ”holes” within a solid–state material.
PHYSICAL ELECTRONICS ECX 5239 PRESENTATION 01 PRESENTATION 01 Name : A.T.U.N Senevirathna. Reg, No : Center : Kandy.
INTRODUCTION TO SEMICONDUCTORS
COURSE NAME: SEMICONDUCTORS Course Code: PHYS 473.
© Electronics ECE 1312 EECE 1312 Chapter 2 Semiconductor Materials and Diodes.
Recall-Lecture 3 Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration, ni.
Operational Amplifier
PN-junction diode: I-V characteristics
Recall-Lecture 3 Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration, ni.
ECE 333 Linear Electronics
“Semiconductor Physics”
SEMICONDUCTOR FUNDAMENTALS
BSIC SEMICOCONDUCTOR CONCEPTS INTRINSIC SILICON:
Recall-Lecture 4 Current generated due to two main factors
EE141 Microelectronic Circuits Chapter 10. Semiconductors, Diodes, and Power Supplies School of Computer Science and Engineering Pusan National University.
Parul Institute of Engineering & Technology
Announcements HW1 is posted, due Tuesday 9/4
EE141 Microelectronic Circuits Chapter 10. Semiconductors, Diodes, and Power Supplies School of Computer Science and Engineering Pusan National University.
Semiconductors. Silicon crystal Types of semiconductors
Recall-Lecture 3 Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration, ni.
DIODE APPLICATION By: Ashwini T.P Sr.Assistant Professor Mechatronics Department.
Recall-Lecture 4 Current generated due to two main factors
Chapter 2 Solid-State Electronics
Chapter 3. PN Junctions and Related Devices
SOLIDS AND SEMICONDUCTOR DEVICES - II
Basic Semiconductor Physics
Lecture 4 Carrier Transport Phenomena
Semiconductors Chapter 25.
pn Junction Diodes: I-V Characteristics
Chapter 1 – Semiconductor Devices – Part 2
Basic Physics of Semiconductors (1)
Lecture 3 OUTLINE Semiconductor Basics (cont’d) PN Junction Diodes
ECA1212 Introduction to Electrical & Electronics Engineering Chapter 4: Basic Semiconductor and Diode by Muhazam Mustapha, October 2011.
Since (pp) >>(np)
Semiconductor Diodes Introduction Diodes
EE105 Fall 2007Lecture 1, Slide 1 Lecture 1 OUTLINE Basic Semiconductor Physics – Semiconductors – Intrinsic (undoped) silicon – Doping – Carrier concentrations.
Lecture 1 OUTLINE Basic Semiconductor Physics Reading: Chapter 2.1
BSIC SEMICOCONDUCTOR CONCEPTS INTRINSIC SILICON:
SEMICONDUCTOR PHYSICS DEPARTMENT OF APPLIED PHYSICS
Semiconductor Physics
PN-JUNCTION.
Presentation transcript:

Silicon: 14 electrons 4 in outer shell

Silicon at T=0K; Covalent bonds Poor conductor

Silicon at T>0K; free electrons (f.e.) and holes

Silicon at T>0K; Better Conductor Charge Carriers: free electrons and holes n: number of f.e. per unit volume (cm3) p: number of holes per unit volume Intrinsic (pure silicon) n=p=ni ni=BT3/2e-Eg/2kT Commonly refer to the product pn=ni2 Think of a rectangle p: base, n: height; ni2: area Number of Charge Carriers is: Circumference/2

Current: Free Electrons and Holes Moving. How do they move? (2 Types)

Currents: Free Electrons and Holes Moving. How do they move? (2 Types) 1) Apply and electric field (Voltage)

Currents: Free Electrons and Holes Moving. How do they move? (2 Types) 1) Apply and electric field (Voltage)

Currents: Free Electrons and Holes Moving. How do they move? (2 Types) 1) Apply and electric field (Voltage)

Currents: Free Electrons and Holes Moving. How do they move? (2 Types) 1) Apply and electric field (Voltage)

Drift Current: Current due to an e-field. Force: Electric field Property: Charge Equations: velocity = mobility × Force vp-drift = µpE µp=480 cm2/Vs (for silicon) vn-drift = -µnE µn=1350 cm2/Vs (for silicon) Current = Area × (#/cm3) × v × charge Ip = A∙q∙p∙vp-drift = A∙q∙p∙µp∙E In = -A∙q∙n∙vn-drift = A∙q∙n∙µn∙E Current Density = Current / Area = Conductivity × Force Jp = q∙p∙µp∙E Jn = q∙n∙µn∙E J = Jp+Jn = q(p∙µp + n∙µn)E = σ∙E Conductivity and resistivity σ = q(p∙µp + n∙µn) ρ = 1/σ = 1/q(p∙µp + n∙µn)

Free Electrons and Holes Moving. How do they move? (2 Types) Currents: Free Electrons and Holes Moving. How do they move? (2 Types) 2) Concentration Gradient, p’(x) p(x) x

Free Electrons and Holes Moving. How do they move? (2 ways) Currents: Free Electrons and Holes Moving. How do they move? (2 ways) 2) Concentration Gradient, p’(x) p(x) x

Free Electrons and Holes Moving. How do they move? (2 ways) Currents: Free Electrons and Holes Moving. How do they move? (2 ways) 2) Concentration Gradient, p’(x) p(x) x

Free Electrons and Holes Moving. How do they move? (2 ways) Currents: Free Electrons and Holes Moving. How do they move? (2 ways) 2) Concentration Gradient, p’(x) p(x) Jp = -q∙Dp∙n’(x) x

Free Electrons and Holes Moving. How do they move? (2 ways) Currents: Free Electrons and Holes Moving. How do they move? (2 ways) 2) Concentration Gradient, n’(x) n(x) Jn = q∙Dn∙n’(x) x

Diffusion Current: Current due to an mass, heat, and con. grad. Force: Heat Property: Mass and Concentration Gradient Current Density = Current / Area = Conductivity × Force Jp = -q∙Dp∙n’(x) Dp=12cm2/s (for silicon) Jn = q∙Dn∙p’(x) Dn=35cm2/s (for silicon) Remember, Current = Current Density × Area Ip = -A∙q∙Dp∙n’(x) In = A∙q∙Dn∙p’(x) Dn/µn = Dp/µp = VT The problem with pure (intrinsic) silicon is that p and n are small resulting in a poor conductor. How can we increase the number of f.e. or holes?

Doped Silicon: With Phosphorus (15)

N-type Silicon: Doped with Phosporus (Donor) Excess of free electrons (negative) nn=ND Donor Concentration nn>>pn pnnn=ni2 pn=ni2/ND Charge Carriers free electrons: majority carriers holes: minority carriers If f.e. are removed to equalize holes and f.e. The region becomes depleted (poor cond.) The region becomes positively charged Think of a rectangle p: base, n: height; ni2: area

Doped Silicon: With Boron (5)

P-type Silicon: Doped with Boron (Acceptor) Excess of holes (positive) pp=NA Donor Concentration pp>>np ppnp=ni2 np=ni2/NA Charge Carriers holes: majority carriers free electrons: minority carriers If holes are filled to equalize holes and f.e. The region becomes depleted (poor cond.) The region becomes negatively charged Think of a rectangle p: base, n: height; ni2: area

The PN Junction: n(x),p(x) Diffusion Current Net Charge E-field NONE Drift Current

The PN Junction: n(x),p(x) Diffusion Current Net Charge E-field NONE

The PN Junction: n(x),p(x) Diffusion Current Net Charge E-field Drift Current

The PN Junction: n(x),p(x) Diffusion Current Majority Carriers Net Charge E-field Drift Current Minority Carriers

The PN Junction: Diffusion Current Majority Carriers Significantly blocked by the depletion region voltage. Dependent on voltage (overcome the depletion region voltage). Drift Current Minority Carriers Not dependent on e-field, but rather the small number. Significantly reduced by small number of minority carriers. Relatively constant. Diffusion and Drift Currents are in opposite directions. iD = iDiffusion - iDrift

The PN Junction: Diffusion Current Majority Carriers Significantly blocked by the depletion region voltage. Dependent on voltage (overcome the depletion region voltage). Drift Current Minority Carriers Not dependent on e-field, but rather the small number. Significantly reduced by small number of minority carriers. Relatively constant. Forward Biased PN Junction. vD is from P to N, opposite that of the depletion region voltage. Diffusion current increases. The solution to a diffusion equation is an exponential. idiffusion = Kexp(vD/nVT)

The PN Junction: Diffusion Current Majority Carriers Significantly blocked by the depletion region voltage. Dependent on voltage (overcome the depletion region voltage). Drift Current Minority Carriers Not dependent on e-field, but rather the small number. Significantly reduced by small number of minority carriers. Relatively constant. Reversed Biased PN Junction. vD is from N to P, enhances that of the depletion region voltage. Diffusion current is pushed to near zero. Drift current is constant. idrift = IS

The PN Junction: Diffusion Current Majority Carriers Significantly blocked by the depletion region voltage. Dependent on voltage (overcome the depletion region voltage). Drift Current Minority Carriers Not dependent on e-field, but rather the small number. Significantly reduced by small number of minority carriers. Relatively constant. Diffusion and Drift Currents are in opposite directions. iD = Kexp(vD/nVT) - IS Passive device iD(0) = 0, so K = IS. iD = IS(exp(vD/nVT) - 1)

The PN Junction: Diffusion Current Majority Carriers Significantly blocked by the depletion region voltage. Dependent on voltage (overcome the depletion region voltage). Drift Current Minority Carriers Not dependent on e-field, but rather the small number. Significantly reduced by small number of minority carriers. Relatively constant. PN Junction in Breakdown. vD is from N to P and is very large. vD is sufficiently large (negative) to break covalent bonds. Rush of free electrons.