Rev 5/02 Luna Technologies 2003

Rev 3/03 Luna Technologies, providers of Optical Vector Analysis, allowing you to do things never before available in optics XMTRX Source H( )

Rev 3/03 About Luna Founded - Summer 2000 Focused on measurement instrumentation for fiber-optic components and subsystems World headquarters in Blacksburg, VA Sales offices in Atlanta, Los Angeles, Canada, China, and Tokyo Completed B round of funding led by Columbia Capital - March 2003

Rev 3/03 Before the Luna OVA…nothing could Use a measured linear transfer function to determine all characteristics…future-proof Measure and display all-parameters simultaneously at a 4 hertz update rate Align optical devices to optimize all device parameters in seconds Cost-effectively manufacture tunable devices Measure devices with large dispersion Peer inside the device to determine the source of degraded specifications

Rev 3/03 Luna Technologies Products & Services Optical Vector Analyzer (OVA) All parameter test solution Industry leading combination of speed and accuracy CT - Component Test (30m) ST - System Test (80m) LP – Loss and PMD Analyzer OFDR Peer into the heart of your subsystems with 20 micron accuracy Measure up to 200 ns of delay and 80 m of DUT length 80 dB sensitivity Optical Testing Services Outsource your measurement needs to the experts at Luna, its... Fast Easy Economical Software Analysis Tool Set Desktop Analysis Software Coming Soon … Filter Characterization and Eye Diagram Analysis Software Redefining the Economics of Optical Test

Rev 3/03 Lunas Optical Vector Analyzers… Test with one sweep across C and L bands: – IL, RL, GD, CD, PDL, DGD, Optical Phase, Time Domain Combine the power of an all-parameter analyzer with the functionality of an OTDR Decrease testing cycles by a factor of 20 Reduce capital equipment cost Pay back period in months The best choice for measurement and characterization of components and sub modules.

Rev 3/03 Fiber Optic Test Product of the Year Luna Technologies OVA is clearly the most innovative product in the optical test arena…scoring top points for speed of testing, ease of testing, price-to-performance ratio, resolution and accuracy, and scalability…it enables end-users to achieve lower development time and offers cost savings Award Recipient: Luna Technologies Technology Award, 2002

Rev 3/03 Lunas Optical Vector Analyzers… We would not have made it through these tough times without the OVA. OFS Fitel …the best thing to happen to optical measurements since Ive been in the business. Lucent Bell Labs It would not be feasible to make our device without the speed of the OVA Accumux Technologies

Rev 3/03 H(t) DUT Bits go inBits come out DUT affects both the amplitude and phase of the transmitted data. Single mode system example:

Rev 3/03 Optical Vector Analysis DUT is completely characterized by four independent complex functions. From H( ), calculate IL, PDL, GD, CD, PMD, etc.

Rev 3/03 The Result is… – Breakthrough measurement speeds – Dramatically reduced costs – Rapidly determine the source of degraded specifications – Completely characterize a device under test – Maximized yields by tracking every stage of the development process – Bin components to match design performance

Rev 3/03 OVA Product Highlights All Parameter Analysis - Obtain all parameters in a single scan Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy Breakthrough Measurement Speeds - View all parameters in Real > 4 Hz update rate for 2.5 nm scan

Rev 3/03 Measure all parameters… In less than 0.25 seconds

Rev 3/03 OVA Product Highlights All Parameter Analysis - Obtain all parameters in a single scan Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy Breakthrough Measurement Speeds - View all parameters in Real > 4 Hz update rate for 2.5 nm scan

Rev 3/03 Model data transmission with ease Measured H( ) Data Simulated 10Gb/s NRZ Signal Spectrum

Rev 3/03 Tangible future benefits…2 nd Order PMD

Rev 3/03 OVA Product Highlights All Parameter Analysis - Obtain all parameters in a single scan Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy Breakthrough Measurement Speeds - View all parameters in Real > 4 Hz update rate for 2.5 nm scan

Rev 3/03 Measurement Example - FBG

Rev 3/03 OVA Product Highlights All Parameter Analysis - Obtain all parameters in a single scan Exclusive Linear Transfer Function Measurement - The most complete measurement of your component available Industry Leading Accuracy - Fully specified measurements in < 15 seconds for 2.5 nm scan with high dynamic range and extreme accuracy Breakthrough Measurement Speeds - View all parameters in Real > 4 Hz update rate for 2.5 nm scan

Rev 3/03 OVA Product Highlights Time Domain Filtering - Look inside devices with femtosecond resolution Desktop Analysis Software - Analyze stored data (No retesting!) at later time and location Test Long Devices - Test components up to 80 meters long Minimal Setup time - Full calibration takes ~ 1 minute for C + L bands