Page 1 Group/Presentation Title Agilent Restricted 8 January 2014 Remove this slide before customer presentation This is the slide set that should be used.

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Page 1 Group/Presentation Title Agilent Restricted 8 January 2014 Remove this slide before customer presentation This is the slide set that should be used for customer presentations. The FTD slides are for internal use. This slide set contains speaker notes. Please read them before presenting the material.

Page 2 Group/Presentation Title Agilent Restricted 8 January 2014 The Nonlinear Problem

Page 3 Group/Presentation Title Agilent Restricted 8 January 2014 Measuring nonlinearities A 0,P 0 F 0 in F 0 out F 2 out F 3 out A 0,P 0 A 2,P 2 A 3,P 3 Wouldnt it be nice if you could measure and display the full amplitude and phase information of each spectral component?

Page 4 Group/Presentation Title Agilent Restricted 8 January 2014 Fast ! Accurate ! The new industry paradigm for nonlinear measurements … Agilent NVNA NVNA Easy to Use !

Page 5 Group/Presentation Title Agilent Restricted 8 January 2014 Calibrated absolute amplitude and relative phase (cross- frequency relative phase) of measured spectra traceable to standards lab 26 GHz of vector corrected bandwidth for time domain waveforms of voltages and currents of DUT X-parameters provides unique insight into nonlinear DUT behavior X-parameter extraction into ADS PHD block for nonlinear simulation and design Standard PNA-X with Nonlinear features and capability NVNA: Vector corrected (amplitude/phase) nonlinear measurements from 10 MHz to 26.5 GHz … the NVNA provides industry-leading performance, accuracy, and configurability to simplify test setups and provide detailed insight into designing nonlinear components.

Page 6 Group/Presentation Title Agilent Restricted 8 January 2014 Nonlinear hierarchy from device to system Devices Systems Circuits Transistors, diodes, … Amplifiers, Multipliers, …. Chips Characterization and modeling Modules Instrument Front-ends Cell Phones Military systems Etc.

Page 7 Group/Presentation Title Agilent Restricted 8 January 2014 Component Characterization Calibrated measurements of incident, reflected and transmitted waves of DUT. absolute amplitude and cross frequency relative phase of measured spectra traceable to standards lab Data displayed in frequency, time and power domains User defined parametric displays such as dynamic I/V curves Full A and B wave data for building models in ICcap Integrated extension of PNA-X Ease of use Key Customer Benefit: Provide strong insight into DUT behavior by measuring and displaying fundamental and harmonic input and output spectra (amplitude and phase) on a familiar, high performance PNA-X network analyzer. Opt 510

Page 8 Group/Presentation Title Agilent Restricted 8 January 2014 Measurement based, device independent, identifiable from a simple set of measurements Fully nonlinear (Magnitude and phase of harmonics) Cascadable (correct behavior in mismatched environment) Characterization, Design, and Modeling of nonlinear components and systems PNA-X: Measure device X-parms ADS: Simulate using X-parms ADS: Design using X-parms X-parameters are the mathematically correct extension of S-parameters to large-signal conditions. Opt 514 X-parameters will revolutionize:

Page 9 Group/Presentation Title Agilent Restricted 8 January 2014 Pulse Envelope Domain Key Customer Benefit: Analyze memory effects in nonlinear devices. Opt 518 Vector corrected amplitude and phase of fundamental and harmonic envelope.

Page 10 Group/Presentation Title Agilent Restricted 8 January 2014 Measurement Display View corrected waveforms in frequency, time, power and parametric domains. Currently showing absolute amplitude of a and b waves from device in frequency and time domain. Can also display all formats including cross- frequency phase.

Page 11 Group/Presentation Title Agilent Restricted 8 January 2014 Advantages: Lower temperature sensitivity Lower sensitivity to input power Smaller minimum tone spacing (10 MHz vs 600 MHz) Lower frequency (10 MHz vs 600 MHz) Much wider dynamic range due to available energy vs noise Phase Reference: New!! Agilent Proprietary Calibrated Phase Reference Agilents new, InP IC based phase reference is superior in all aspects to the existing phase reference technologies.

Page 12 Group/Presentation Title Agilent Restricted 8 January 2014 NVNA System Configuration Amplitude Calibration Vector Calibration Phase Calibration Phase Reference X-Parameter extraction source PNA-X Network Analyzer New!! Agilent Proprietary Calibrated Phase Reference