© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 1 ECID vs Device ID Bill Eklow Cisco

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 2 Moore’s Law – Transistor Count

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 3 Board Level Complexity

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 4 Moore Complexity

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 5 Combined Line Card © 2005 Cisco Systems, Inc. All rights reserved. 2005

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 6 Why Chips Fail in System DPMO Supplier test escapes ASIC design, marginality Board design Issues Environmental CM diagnostic issues ICT & XRAY escapes CM database Inaccuracy

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 7 board fails functional test Re-verified at debug ICT retest * X-ray retest Remove failed ASIC and replace it Confirmed X-ray retest ICT retest ASIC fail to Supplier for retest BScan Board to production Returning Bad Components Pass

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 8 Root Causing Bad Components Supplier retest fail yes Retest NTFs in system pass fail ATE Test escape? Test escape? Environmental fail? Bad Diags? Good ASIC? Supplier FA Diagnose fail Supplier coverage ok? pass = NTF no Add more coverage Focused ASIC RMA

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 9 Please – No More Moore!!!!  Device complexity/gate count/speed increasing  Component volumes increasing  Product Diversity increasing  Disconnect between Manufacturing and Engineering  Disconnect between CMs and Component Suppliers  Field Failures???  Result: Systemic Component Problems rarely get fixed

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 10 Q uality D ata I nfrastructure Collaboration in a Virtual Supply Chain System Integrator Component Suppliers EMS Partners Customer

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 11 What is eCID?  eCID is acronym for, “electronic chip ID” – Initiated by IBM – Now a requirement for all new ASICs – Accessible via JTAG or CPU  In IBM case, 112 bit string contains the following information – Lot ID – Wafer ID – X / Y location of die in a wafer w1234 For example, eCID = {lot xyz, w1234, 4, 2}

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 12 Pass Freq Voltage Wafer Map Analysis : feedback mech. “Good” Neighbors “Bad” Neighbors + Edge die Margin Variation

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 13 Key Analysis Tools  ECID regionality analysis  Parametric characterization data for anomalies Key Analysis Tools  ECID regionality analysis  Parametric characterization data for anomalies Actions Taken  Tightened test limits reducing product failures Actions Taken  Tightened test limits reducing product failures End-to-End Process Data

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 14 Benefits  Component Suppliers get data, not parts  Can apply component yield methodologies to system failures (Virtual Vertical Integration)  Process automation  Much finer granularity for traceability

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 15 Issues  Standardizing access and format of ECID data  Device ID???

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 16 Device ID

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 17 Challenges  Full ICT may go away  Functional diagnostics – Hard to scale – Need pilot project to test out  Need IT support – Escalate the priority  Current pilot – Not running for all ASIC/CM/Supplier

© 2006 Cisco Systems, Inc. All rights reserved.Cisco ConfidentialPresentation_ID 18