Fig. 1 RELATIONSHIP BETWEEN SOC AND THERMAL STARTING TEMPERATURE

Fig. 2 RELATIONSHIP BETWEEN SOC AND CALORIFIC VALUE

FIG. 3 INTERNAL SHORT CIRCUIT(SIMULATION) CYLINDRICAL ：ＩＣＲ１８６５０ SOC ：５０％ HIGHEST TEMPERATURE ：３３６℃ AMBIENT TEMPERATURE ：１００℃

FIG. 4 INTERNAL SHORT CIRCUIT (SIMULATION) CYLINDRICAL ：ＩＣＲ１８６ ５０ SOC ：７０％ HIGHEST TEMPERATURE ：３８７℃ AMBIENT TEMPERATURE ：１００℃

FIG. 5 INTERNAL SHORT CIRCUIT (SIMULATION) CYLINDRICAL ：ＩＣＲ １８６５０ SOC ：１００％ AMBIENT TEMPERATURE ：１００℃

FIG. 6 HEAT SPREAD AFTER SHORT CIRCUIT （ at100 ℃） s0.2s0.3s0.4s0.5s0.6s0.7s0.8s SOC 100% SOC 70% SOC 50% TEMPERATURE BECOMES OVER DECOMPOSING TEMTERATURE OF ACTIVE MATERIALS AT LIMITED AREA AT PLACES OF INTERNAL SHORT CIRCUIT ALL BATTERIES BURNT DOWN DUE TO CHAIN REACTION TEMPERATURE BECOMES DOWN DUE TO HEAT SPREAD

GRAPH 1. INTERNAL SHORT CIRCUIT TEST (CRUSH TEST) PRISMATIC ：ＩＣＰ１０３４５０ AMBIENT TEMPERATURE ：１００℃ ● ： HEAT GENERATED （ NO THERMAL RUNAWAY ） DATA AT TEST ATTACHED △ ： SMOKE OR BURST OCCURED VOLTAGESOC 4.19V100% 100 ℃△△△△△△△△△△ 3.82V50% 100 ℃ ○○○○○ LEGEND OF TEST RESULT HIGHEST TEMP. OF BATTERIES （℃） CHRGE CONDITIONS TEST TEMP.TEST RESULTS

FIG. 7 INTERNAL SHORT CIRCUIT TEST (CRUSH TEST) PRISMATIC ：ＩＣＰ１０３４５０ SOC ：１００ % AMBIENT TEMPERATURE ：１００℃ The burst occurred at the moment of short circuit Cell Temperature Cell Voltage

FIG. 8 INTERNAL SHORT CIRCUIT TEST (CRUSH TEST) PRISMATIC ：ＩＣＰ１０３ ４５０ SOC ：５０ % AMBIENT TEMPERATURE ： １００℃ Heat generation occurred by short circuit after reaching the highest temperature （ 116 ℃）, cell temperature fell gradually. Cell Temperature Cell Voltage

FIG. 9 INTERNAL SHORT CIRCUIT TEST(CRUSH TEST ） PICTURE SHOWN AFTER CRUSH PRISMATIC ：ＩＣＰ１０３４５０ SOC ：１００ % AMBIENT TEMPERATURE ：１００℃ No.1No.2 No.3No.4 No.5 BATTERY TOP BATTERY SIDE

FIG. 10 INTERNAL SHORT CIRCUIT TEST(CRUSH TEST ） PICTURE SHOWN AFTER CRUSH PRISMATIC ：ＩＣＰ１０３４５０ SOC ：５０ % AMBIENT TEMPERATURE ：１００℃ No.4 No.1 No.2 No.3 No.5 BATTERY TOP BATTERY SIDE