Logic Gate Delay Modeling -III Bishnu Prasad Das Research Scholar CEDT, IISc, Bangalore bpdas@cedt.iisc.ernet.in
OUTLINE Delay Model History Static Timing Analysis (STA) Corner Models Drawback of Corner Approach Statistical Static Timing Analysis(SSTA) Summary
Delay Model History Courtesy : Synopsys
What to do with Delay Models? Timing analysis of the whole chip Problem: Given a circuit, find the path(s) with the largest delay (critical paths)
Timing Analysis Solution: run SPICE and report the results of the simulation Problem: SPICE is computationally expensive to run except for small-size circuits WANTED: We need a fast method that produces relatively accurate timing results compared to SPICE
Combinational Blocks Arrival time in Green Interconnect delay in Red Gate Delay in Blue What is the right mathematical object to represent this physical objects ?
Combinational Blocks as DAG Use a labeled directed acyclic graph G = <V,E> Vertices represent gates, primary inputs and primary outputs Edges represent wires Labels represent delays Now what do we do with this?
Static timing analysis Arrival time A(v) for a node v is time when the signal arrives at node v
Static timing analysis C17 from ISCAS’85 benchmarks 1/2 2/4 I1 1/2 critical path 2/3 I2 O1 9/10 9/11 2/4 I3 3/5 7/7 5/4 I4 2/4 O2 I5 1/2 1/2 I6 All inputs are arrive at time 0 Assuming all interconnects have 0 delay Each gate has rise/fall delay slack = arrival time – required arrival time paths with negative slacks need to be eliminated!
STA can lead to false critical paths STA assumes a signal would propagate from a gate input to its output regardless of the values of other inputs 21 MUX delay = 5 = 3 out a b 1 What is critical path delay according to STA? Is this path realizable? No, actual delay is less than estimated by STA
Signal Arrival Times
Simultaneous Arrival Times
Simultaneous Arrival Times
Limitations of STA False path Simultaneous Arrival Time STA is done across all corners (Computationally Expensive)
Corner Models Four types of Corner models Fast Corner Slow Corner Slow NMOS Fast PMOS Fast NMOS Slow PMOS Typical Corner
Design Corners FF Fast FS TT PMOS SS FS Slow Slow Fast NMOS
Corner Table Environmental parameters Process parameter Corner Voltage Temperature Vth Voltage Fast Vnom+10% -400C Vthnom-ΔVth Slow Vnom-10% 1250C Vthnom+ΔVth Typical Vnom 270C Vthnom
Applications of Corners For Power and race condition like hold time use Fast corner For Delay simulation use Slow corner The other two corners are used for circuits which require precise sizing for proper functioning. Ex: Memory and pseudo NMOS circuit.
Limitations of Corner Models Worst case assumption is insignificant This leads to over design Hence more power, area and loss of performance Need more intelligent accounting of variations
Gate Length Variation [Orshansky, et. al, IEEE Trans. On Sem. Manufacturing, Feb 2004]
Environmental Variations: Vdd [Anirudh Devgan, IBM, Mar 05]
Environmental Variations: Temperature [Anirudh Devgan, IBM, Mar 05]
Statistical Static Timing Analysis j o Ai Aj Ao Ao = max(Ai+ Dio , Aj+ Djo) Delay is no longer Deterministic, it is a random variable
Addition Operation Addition operation: The sum of two random number is convolutions of their probability functions. Ao = Ai+ Dio Where Ci is the CDF of Ai . Pio is the PDF of Dio.
Max Operation Ao = Max ( Ai , Aj ) Max Operation: The CDF of the maximum of two independent random variables is simply the product of the CDF of two variables Ao = Max ( Ai , Aj ) The CDF of node “o” is given by Co(t) = Ci(t) Cj(t)
Probability of Events 1 2 3 4 1 Arrival time Arrival time 1->0 Arrival time 3 4 1 1->0 Arrival time (a) A probabilistic event (b) A probabilistic event group
Propagating a Single event
Propagating An event group
Output of SSTA C17 ISCAS Benchmark z ? I1 O1 I2 I3 y I4 O2 I5 I6 pdf delay I1 I2 I3 I4 I5 I6 O1 O2 ? y z C17 ISCAS Benchmark
Summary Static Timing Analysis Limitations of STA Corner Models Limitations of Corner Models in Presence of Process Variation Statistical Static Timing Analysis
References For SSTA: For Corner Model: J. J. Liou et.al, “Fast Statistical Timing Analysis by Probabilistic Event Propagation”, DAC pp. 661-666, June 2001. A. Devgan and C. Kashyap, “Block-based Timing Analysis with Uncertainty,” ICCAD, pp. 607-614, Nov. 2003. H.Chang, V. Zolotov, S. Narayan and C. Visweswariah, “Parameterized Block-Based Statistical Timing analysis with Non-Gaussian Parameters, Nonlinear Delay Functions,” DAC, pp. 71-76, June 2005. For Corner Model: N. H. E. Weste and D. Harris, “CMOS VLSI Design, A circuits and Systems Perspective” 3rd edition
References Go to solvnet site https://solvnet.synopsys.com/amserver/UI/Login and do an account for these materials CCS Models Xin Bao, Khusro Sajid, Elisabeth Moseley, “Timing Sign-off using CCS Libraries at Qualcomm”, Snug 2006 San Jose Peter Chih-Yang Pong, Steve H. Tsai, “An Investigation of CCS”, Snug Taiwan 2006 CCS Timing Library Characterization Guidelines