O. Siegmund 11/15/11 20 cm and 33mm MCP Test Progress Lifetest with #164/163 continues – now close to 2 C cm -2 New batch of 33mm test MCPs arrived Chem-3.

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Presentation transcript:

O. Siegmund 11/15/11 20 cm and 33mm MCP Test Progress Lifetest with #164/163 continues – now close to 2 C cm -2 New batch of 33mm test MCPs arrived Chem-3 first tests begun Need to choose MCPs for next lifetests:- Bake, and scrub with a pair of the new MCPs Find out if air exposure affects post bake/scrub SEE Investigate temp stability of gain Evaluate background sources No new 20cm MCP data – awaiting new MCPs Have made changes to 20cm detector to improve imaging for next set of tests. Continue to electrode for 20cm MCPs, 2 more coming

O. Siegmund 11/15/ v on each MCP, gain high, >10 7. Numerous black spot defects, lots of bright spots due to removed/missing ALD layer exposing electrode material. Cleanliness issues? Gain map, multifiber pattern modulation, typical of boule material with pore size variations. Not a good substrate material. ALD Chem 3, 20µm Microchannel Plates ALD Chem 3, 20µm Microchannel Plates /117, 50MΩ/180MΩ, Pair with 0.7mm gap/400v

O. Siegmund 11/15/11 3 #160, #160, , 700v MCP, earlier data shows problems with this material 20 µm pore #160 ALD MCP with NiCr electrode. Chem-3 ALD 20µm Microchannel Plate 100 sec background, ~4 events cm -2 sec -1. Some hot patches, uniform background rate is 3.5 events cm -2 sec not very good /117 Chem-3 background Previous data on boule

O. Siegmund 11/15/11 ANL ALD-MCP Samples Started with Chem boule has bad pore stacking uniformity boule has good pore stacking uniformity boule is unknown

O. Siegmund 11/15/11 Preconditioning Test of 33mm 20µm Pore MCPs  ANL MCPs 164 and 163, 20µm, 60:1, 8° bias.  INCOM serial #s, ,  Resistances 159MΩ, 138MΩ (NiCr over)  XDL detector with MCPs gapped by 0.001” spacer.  Completed 350°C bake, with RGA scans.  Scrub in progress, with RGA scans.  Have gone from 1µA to 2µA, now 3µA >1.9 C cm -2 extracted.

O. Siegmund 11/15/ x 10 5 gain, 700v per MCP MCP Scrub Record Almost all of the gain variation is due to thermal changes in the lab