先进测试助力“中国芯” 上海华岭集成电路技术股份有限公司.

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Presentation transcript:

先进测试助力“中国芯” 上海华岭集成电路技术股份有限公司

Sino IC Technology Co.,Ltd. Overview Founded in 2001; Shanghai Zhang Jiang Hi-Tech Park; Company area 4000M2, Clean room 2000M2; Employee: 100+, Engineer: 40+; Test program development; probe card / Load board design & layout; 8-12 inch wafer probing; Final test; 2012/10/24 Sino IC Technology Co.,Ltd.

Sino IC Technology Co.,Ltd. Clean room 2000m2 clean room 2012/10/24 Sino IC Technology Co.,Ltd.

Test engineering service Design VCD/WGL/STIL conversion Test program development Probe card/Load board design Debugging Remote connection Program optimization Test correlation Mass production Low yield analysis WIP management Data conversion & upload 2012/10/24 Sino IC Technology Co.,Ltd.

Sino IC Technology Co.,Ltd. Remote connection 2012/10/24 Sino IC Technology Co.,Ltd.

300mm wafer probing Test capacity 2012/10/24 Thin wafer probing (90um Min.) Inkless wafer map Wafer baking -40oC to +150oC wafer probing (SOP/DIP/QFP) Final test 2012/10/24 Sino IC Technology Co.,Ltd.

Sino IC Technology Co.,Ltd. Product type RF ICs (Bluetooth,Tuner,PA,RFID) Memory ICs (Flash,SRAM,EEPROM) MOSFET ICs (600-1000V,1-20A) PM ICs (LDO,PWM,DC-DC) SoC ICs (CPU,DSP,FPGA) Mixed signal ICs (MCU,Demodulator,ADC/DAC) 2012/10/24 Sino IC Technology Co.,Ltd.

Test system Vendor Type Configuration Devices Teradyne UltraFLEX RF 12GHz,6.4GHz,1GHz, VHFAC,BBAC,TurboAC SOC J750Ex 200MHz,MSO,MTO, 512 pins MCU/CPU Advantest T2000 125MHs, 512 pins MCU J750 100MHz,MSO,512 pins Yokogawa TS6000 60MHz,128 Pins Credence PK2 200MHz,192 pins Memory Verigy V50 50Mhz,128 Pins MCU,PMIC Juno DTS1000 1000V,10A-20A PowerMOS TRI TR6800 PVC,OVC,MUX PMIC 2012/10/24 Sino IC Technology Co.,Ltd.

Sino IC Technology Co.,Ltd. Tester configuration Ultra FLEX (High end SoC tester ) RF：Max. 12GHz Serial high speed: Max. 6.4GHz Digital channel：1GHz Power supply： DC30、DC75、HDVS Option: BBAC、TurboAC、VHFAC 2012/10/24 Sino IC Technology Co.,Ltd. 9

Tester configuration cont. J750EX Test channel: 512 - 1024 Test rate: 200MHz Option: ADC/DAC/Memory J750 Test channel: 256 - 512 Test frequency: 100MHz Option: ADC/DAC/RFID V50 Test channel: 128 - 256 Test frequency: 50MHz Option: Mixed signal 2012/10/24 Sino IC Technology Co.,Ltd. 10

Sino IC Technology Co.,Ltd. Prober configuration UF3000 Wafer size: 300/200mm Test temp.: -40oC - +150oC UF200A Wafer size: 200/150mm UF200R Wafer size: 200/150mm Wafer thickness: Min 90um P8XL/P8 Wafer size: 200-100mm 2012/10/24 Sino IC Technology Co.,Ltd. 11

Sino IC Technology Co.,Ltd. Partners Foundry & Assembly Vendor & Supplier 2012/10/24 Sino IC Technology Co.,Ltd.

Sino IC Technology Co.,Ltd. Development flow Cycle time: 2 weeks 1-2 weeks 1 week Test Plan Program Coding VCD conversion Load board/ Probe card Device setup Debugging Data correlation Pilot run (1-3 Lot) validation release 2012/10/24 Sino IC Technology Co.,Ltd.

Sino IC Technology Co.,Ltd. Testing flow Run card Test set up (program, OD,temp.) Wafer probing (OD,yield) Run correlation wafer FTP data (wafer map, datalog) Offline ink OQC IQC Packing/ shipment 2012/10/24 Sino IC Technology Co.,Ltd.

Thanks!