Radiative efficiency of light-emitting materials Tim Gfroerer Davidson College, Davidson, NC - Funded by Research Corporation and the Petroleum Research Fund A talk given at the SPIE Regional Meeting on Optoelectronics, Photonics, and Imaging (2000)
Outline Motivation Experimental technique Material system: InGaAs Conclusion
Motivation laser diodes light-emitting diodes light is good! heat is bad!
Motivation (continued) collection efficiency = ? internal reflection scattering refraction reabsorption
Measuring the efficiency light in heat signal light out light in = heat + light out T heat efficiency = light in / light out
Experimental set-up light in light out - heat
Efficiency calibration increasing excitation excitation light + heat
Calibrated efficiency defects light Auger
Nonradiative mechanisms defects:Auger:
GaInAs bandgap GaAs InAs InP substrate Ga 0.5 In 0.5 As
Lattice mismatch misfit dislocations and strain
Auger activation Conduction band Valence band energy momentum EaEa smaller E a smaller bandgap:
Conclusions New radiative efficiency measurement technique Material system: InGaAs Recombination and Lattice mismatch