Synchrotron applications of pixel and strip detectors at Diamond Light Source Julien Marchal, Nicola Tartoni, Colin Nave Diamond Light Source 03/09/2008.

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Presentation transcript:

Synchrotron applications of pixel and strip detectors at Diamond Light Source Julien Marchal, Nicola Tartoni, Colin Nave Diamond Light Source 03/09/2008 – PSD8

Outline  Overview of position-sensitive X-ray detectors at Diamond Light Source  Silicon pixel and strip detectors commissioning on beamlines  Future pixel detector requirements

Diamond Light Source  3 GeV synchrotron machine  10 beamlines operational  12 more beamlines by 2011  More beamlines by 2015  X-ray detectors on synchrotron beamlines: Diagnostic detectors Spectroscopic detectors Position-sensitive detectors

Position-Sensitive Detectors Image Plate Si pixel or strip sensors + ASIC Scintillator + CCD Gas detectors (MWPC & microstrip) Scintillator + MAPS

Hybrid Pixel Detectors Single-module Pilatus 100K  P100K developed at PSI and commercialized by Dectris  Specifications: Pixel size: 172 µm x 172 µm Sensor: 320 µm thick Si 15 keV) Frame rate: up to 200 Hz Read-out mode: Photon counting (energy threshold 3-20 keV) Pixel counter bit depth: 20 bit Dectris P100K Hybrid Pixel Detector 8 cm 3 cm Example of data recorded with P100K on I16: GISAXS pattern of liquid- crystalline phase formed by self- assembly of T-shaped molecules: Courtesy of Dr Steve Collins (I16) and Prof. G. Ungar (University of Sheffield)

Hybrid Pixel Detectors Multi-modules Pilatus detectors  Pilatus 2M 3 x 8 modules Active area: 25 cm x 29 cm Frame rate: 30 Hz Image size: 2.4 MB Pilatus 2M Hybrid Pixel detector (produced by Dectris) ~ 30 cm  1 Pilatus 2M under commissioning on material & magnetism beamline [I16]  1 Pilatus 2M under fabrication for surface and interface X-ray diffraction studies [I07]  1 Pilatus 6M under fabrication for microfocus macromolecular crystallography [I24]  Pilatus 6M: 5 x 12 modules Active area: 43 cm x 45 cm Frame rate: 12 Hz Image size: 6.5 MB

Monolithic Active Pixel Sensor (MAPS) + scintillator SOLO detector  XPCS: X-ray photon correlation spectroscopy [I07]  Detector needs good spatial/angular resolution & good time resolution CMOS Active Pixel Sensor from Micron Imaging  SOLO project: Collaboration with University of Sheffield Gadox scintillator + Fiber Optics Taper + Commercial CMOS MAPS 1280 x 1024 pixels (12 microns pixel size) Integrating read-out 500 Hz frame rate 4000 Hz for a 1280 x 128 pixels ROI

 Mythen2 developed by PSI Detector Group for the Powder Diffraction SLS  Mythen2 technology will also be used for time-resolved powder diffraction beamline at DLS [I11] Mythen2 module specifications: Number of Si strips: 1028 Si thickness: 300 microns Strip pitch: 50 microns Read-out: Photon-counting (energy threshold) Threshold adjustment: 6 bit Threshold dispersion: 140 eV FWHM after equalization Silicon Strip Detectors Mythen2 strip detector Si powder diffraction pattern recorded with a single module on I11 Mythen2 module

I11 Position-Sensitive-Detector specifications:  18 modules covering 90°  Angular resolution: °  Frame rate 15 Hz (whole 24 bit/pixel)  Higher frame rates achievable with less modules and 16 or 8 bit/pixel 3D view of I11 PSD mechanical housing Silicon Strip Detectors Mythen2 strip detectors

Future pixel detector requirements Priority 1: Smaller pixel size (~50 microns)  Large area detector with small pixels Sharp diffracted features (from small highly perfect crystals) in crystallography Sharp speckles in photon-correlation spectroscopy [I10, I07]  Curved area detector with small pixels Parallax error reduction for powder diffraction [I07] and long λ MX [I04.1]  Annular detector with small pixels For combined WAXS and SAXS

Future pixel detector requirements Priority 2: More efficient with hard X-rays  Quantum Efficiency of 300 µm thick Si: 20 keV  2 beamlines at DLS operate at X-ray energies above 25 keV Extreme conditions high-energy X-ray diffraction beamline [I15] Energy range: 20 keV to 80 keV Multipurpose high energy beamline [I12] (under construction) Energy range: 50 keV to 150 keV  Current technology: Flat panels (CsI+TFT)  limited dynamic range  image lag  Large-area hybrid pixel detectors based on high-Z materials are required

Future pixel detector requirements Priority 3: High frame rate  Pilatus frame rate: 200 Hz for P100K 30 Hz for P2M 10 Hz for P6M  Frame rate > 1 kHz required for time-resolved experiments liquid crystals switching x-ray photon correlation measurements material and magnetism experiments powder diffraction…  At high frame rate, the read-out dead time of photon-counting detectors becomes a limitation  Simultaneous Read-Write operation required

Future pixel detector requirements Priority 4: High count rate/dynamic range  Strong and weak diffracted features to be imaged at the same time in many diffraction experiments.  Integrating detectors require high dynamic range  Counting detectors require high count rate  Max count rate for photon counting detectors ~ X-rays/sec/pixel  Possible solution: mixed mode detectors switching from photon counting to integrating (High DQE not required for high intensities)

Summary  DLS beamlines are equipped with: Mature position-sensitive detector technology Image Plates, CCDs, MWPC, Microstrip gas detectors New promising semiconductor pixel and strip detector technology Commercial Hybrid Pixel Detectors, developmental strip detectors, MAPS  Requirements of future pixel detectors have been identified through a survey among DLS beamline scientists: Smaller Pixel size, Higher efficiency, Higher frame rate, Higher count rate/dynamic range  A strong development program with commercial & academic detector developers is necessary