Vielitzer Straße Selb GERMANY Tel.: Fax: Linseis Inc. 20 Washington Road P.O.Box 666 Princeton-Jct. NJ Tel.:(609) Fax:(609)

The Company Since 1957 Linseis Corporation delivers outstanding service, know how and leading innovative products in the field of thermal analysis and thermal physical properties. We are driven by innovation and customer satisfaction. Customer orientation, innovation, flexibility and last but not least highest quality are what Linseis stands for from the very beginning. Thanks to these fundamentals our company enjoys an exceptional reputation among the leading scientific and industrial companies. Claus Linseis Managing Director

The Company Linseis Germany Vielitzerstr Selb Linseis USA Princeton Jct. / NJ

ASTM E 289 This test method covers the determination of linear thermal expansion of rigid solids using either a Michelson or Fizeau interferometer. The precision of measurement of this absolute method (better than ±40 nm/(m·K)) is significantly higher than that of comparative methods such as push rod dilatometry (for example, Test Methods D 696 and E 228) and thermomechanical analysis (for example, Test Method E 831) techniques. It is applicable to materials having low and either positive or negative coefficients of expansion

Coefficient of Expansion Definition of the Coefficient of Thermal Expansion (CTE) The coefficient of thermal expansion is generally defined as the fractional increase in length per unit rise in temperature. The exact definition varies, depending on whether it is specified at a precise temperature (true coefficient of thermal expansion) or over a temperature range (mean coefficient of thermal expansion). The former is related to the slope of the tangent to the length – temperature plot, while the latter is governed by the slope of the chord between two points on this curve. Considerable variation in the value of the CTE can occur according to the definition employed.

L75 – LASER DILATOMETER Features Michelson Principle Laser Dilatometer Non contact expansion and shrinkage measurement No calibration needed Any solid sample material (reflecting & not reflecting) Free choice of sample geometry Sample preparation same as with conventional Dilatometer Measurements under inert, oxid., red., vacuum Maximum precision 0,3 Nanometer temperature range -180 up to 1600°C (different furnaces) Induction and heat resistance furnace possible

L75 – LASER The System Unmatched resolution and absolute accuracy is now possible due to the new development of the Linseis Laser Dilatometer of the Pico- series. The system consists of three main components: The Michelson Interferometer The measuring system The furnace

The Michelson Interferometer The used double plane-mirror interferometer is used for simultaneously making pairs of nanoprecision length measurements. The He-Ne lasers, which is frequency stabilized on the used model, was specifically designed for making longer length measurements, along with corrections for environmental shifts in laser wavelength, thus providing the basis for the unbeaten metric precisions.

The Measuring System Dilatometer of the Pico-series. As the name indicates already the resolution goes up to Picometers (0,3nm = 300 Picometer). That means resolutions can be obtained which are up to a factor 33,33 higher as the resolution that were possible up to date. On top the principle of interference measurement give the possibility for much higher accuracy’s, especially as some special computer calibrations are used. Up to now absolute accuracy’s of 1% were normal, with best accuracy’s up to 100nm. The new method allows accuracy’s up to 30nm.

L75 Laser 500LT Laser Dilatometer with low temperature furnace Temperature : -150 …500°C Interferometer Furnace Gas Control Interferometer Electronics

L75 Laser Laser Dilatometer with Induction Furnace Temperature : -150 …1000°C -150 …1600°C Heat up and cool down speed 100K/s Iron Sample

The Furnaces Resistance Furnace The system can be equipped with conventional resistance furnaces with a temperature range from: -150 …500°C RT …1000°C Induction Furnace The system can be equipped with an induction furnaces with a temperature range from: -150 …1000°C -150 …1600°C

Applications Reproducibility of an INVAR Sample An INVAR Sample was evaluated four times during heating in an air atmosphere. The temperature range was room temperature up to 200°C. The difference of the four measurements was as low as 0.01% FS.

Applications Measurement of fused silica, NIST SRM739 *“Soll” represents the NIST value

Applications Measurement of sapphire, cutting angle 0° to C-Axis *“Soll” represents the literature value

Applications Measurement of Copper, NIST SRM736 *“Soll” represents the NIST value

Applications Measurement of polycrystalline Al2O3, Purity 99.7% *“Soll” represents the literature value

Applications Precision measurement of thermal expansion of low expansion materials such as: carbon, graphite, composites, low expansion glass, amber alloy, quartz glass, etc. Precision measurement of thermal expansion of semiconductor materials. Quality control and quality inspection of materials of which thermal expansion characteristics can be a problem, such as glass, sealing materials, bimetals, materials for precision electronic instruments etc.