CMOS Camera System-on-a-Chip

Slides:



Advertisements
Similar presentations
Topics Electrical properties of static combinational gates:
Advertisements

ECE 424 – Introduction to VLSI
Transistors (MOSFETs)
Physical structure of a n-channel device:
COMP541 Transistors and all that… a brief overview
Semiconductor Memory Design. Organization of Memory Systems Driven only from outside Data flow in and out A cell is accessed for reading by selecting.
UNIT 4 BASIC CIRCUIT DESIGN CONCEPTS
DIFFERENTIAL AMPLIFIERS. DIFFERENTIAL AMPLIFIER 1.VERY HIGH INPUT IMPEDENCE 2.VERY HIGH BANDWIDTH 3.DIFFERENTIAL INPUT 4.DC DIFFERENTIAL INPUT ACCEPTED.
Elettronica T A.A Digital Integrated Circuits © Prentice Hall 2003 Inverter CMOS INVERTER.
The NO A APD Readout Chip Tom Zimmerman Fermilab May 19, 2006.
Design and Implementation a 8 bits Pipeline Analog to Digital Converter in The Technology 0.6 μm CMOS Process Eri Prasetyo.
Fall 06, Sep 19, 21 ELEC / Lecture 6 1 ELEC / (Fall 2005) Special Topics in Electrical Engineering Low-Power Design of Electronic.
Introduction to CMOS VLSI Design Lecture 18: Design for Low Power David Harris Harvey Mudd College Spring 2004.
Prof. John Nestor ECE Department Lafayette College Easton, Pennsylvania ECE VLSI Circuit Design Lecture 9 - Combinational.
11/5/2004EE 42 fall 2004 lecture 281 Lecture #28 PMOS LAST TIME: NMOS Electrical Model – NMOS physical structure: W and L and d ox, TODAY: PMOS –Physical.
An Analog Wavelet Transform CMOS Imager Chip
Outline Noise Margins Transient Analysis Delay Estimation
DC and transient responses Lezione 3
S. Reda EN160 SP’07 Design and Implementation of VLSI Systems (EN0160) Lecture 13: Power Dissipation Prof. Sherief Reda Division of Engineering, Brown.
Microwave Interference Effects on Device,
CMOS VLSI Design4: DC and Transient ResponseSlide 1 EE466: VLSI Design Lecture 05: DC and transient response – CMOS Inverters.
Lecture 7: Power.
© Digital Integrated Circuits 2nd Devices VLSI Devices  Intuitive understanding of device operation  Fundamental analytic models  Manual Models  Spice.
The CMOS Inverter Slides adapted from:
CMOS image sensors Presenter: Alireza eyvazzadeh.
DATA ACQUISTION AND SIGNAL PROCESSING Dr. Tayab Din Memon Lecture Introduction to Opamps & Multisim.
Penn ESE370 Fall DeHon 1 ESE370: Circuit-Level Modeling, Design, and Optimization for Digital Systems Day 28: November 15, 2013 Memory Periphery.
1 Delay Estimation Most digital designs have multiple data paths some of which are not critical. The critical path is defined as the path the offers the.
Mary Jane Irwin ( ) Modified by Dr. George Engel (SIUE)
Final Year Project A CMOS imager with compact digital pixel sensor (BA1-08) Supervisor: Dr. Amine Bermak Group Members: Chang Kwok Hung
Switched capacitor DC-DC converter ASICs for the upgraded LHC trackers M. Bochenek 1,2, W. Dąbrowski 2, F. Faccio 1, S. Michelis 1 1. CERN, Conseil Européen.
Miriam Pekar Alex Liberchuk Supervisors: Dr. Alexander Fish Mr. Arthur Spivak 10/2011 P
1HSSPG Georgia Tech High Speed Image Acquisition System for Focal-Plane-Arrays Doctoral Dissertation Presentation by Youngjoong Joo School of Electrical.
In, Out , InOut , Gnd , Vdd, Source follower
1. Department of Electronics Engineering Sahand University of Technology NMOS inverter with an n-channel enhancement-mode mosfet with the gate connected.
DEPFET Electronics Ivan Peric, Mannheim University.
1 Monolithic Pixel Sensor in SOI Technology - First Test Results H. Niemiec, M. Koziel, T. Klatka, W. Kucewicz, S. Kuta, W. Machowski, M. Sapor University.
THE INVERTERS. DIGITAL GATES Fundamental Parameters l Functionality l Reliability, Robustness l Area l Performance »Speed (delay) »Power Consumption »Energy.
Washington State University
The George Washington University School of Engineering and Applied Science Department of Electrical and Computer Engineering ECE122 Lab 4: VTC & Power.
Chapter 07 Electronic Analysis of CMOS Logic Gates
16-1 McGraw-Hill Copyright © 2001 by the McGraw-Hill Companies, Inc. All rights reserved. Chapter Sixteen MOSFET Digital Circuits.
Chapter 4 Logic Families.
07 October 2004 Hayet KEBBATI -1- Data Flow Reduction and Signal Sparsification in MAPS Hayet KEBBATI (GSI/IReS)
Modern VLSI Design 2e: Chapter 3 Copyright  1998 Prentice Hall PTR Topics n Electrical properties of static combinational gates: –transfer characteristics;
SRAM DESIGN PROJECT PHASE 2 Nirav Desai VLSI DESIGN 2: Prof. Kia Bazargan Dept. of ECE College of Science and Engineering University of Minnesota,
VI th INTERNATIONAL MEETING ON FRONT END ELECTRONICS, Perugia, Italy A. Dorokhov, IPHC, Strasbourg, France 1 NMOS-based high gain amplifier for MAPS Andrei.
CS/EE 3700 : Fundamentals of Digital System Design
McKenneman, Inc. SRAM Proposal Design Team: Jay Hoffman Tory Kennedy Sholanda McCullough.
Specifications & motivation 2  Lowering integration time would significantly reduce background  Lowering power would significantly reduce material budget.
LEPSI ir e s MIMOSA 13 Minimum Ionising particle Metal Oxyde Semi-conductor Active pixel sensor GSI Meeting, Darmstadt Sébastien HEINI 10/03/2005.
Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology.
Basics of Energy & Power Dissipation
Thanushan Kugathasan, CERN Plans on ALPIDE development 02/12/2014, CERN.
Subcircuits Example subcircuits Each consists of one or more transistors. They are not used by themselves.
FPGA-Based System Design: Chapter 2 Copyright  2004 Prentice Hall PTR Topics n Logic gate delay. n Logic gate power consumption. n Driving large loads.
ASIC Activities for the PANDA GSI Peter Wieczorek.
Solid-State Devices & Circuits
Low Power, High-Throughput AD Converters
Modern VLSI Design 3e: Chapter 3 Copyright  1998, 2002 Prentice Hall PTR Topics n Electrical properties of static combinational gates: –transfer characteristics;
Tera-Pixel APS for CALICE Progress 30 th November 2006.
EE141 Project: 32x32 SRAM Abhinav Gupta, Glen Wong Optimization goals: Balance between area and performance Minimize area without sacrificing performance.
Eleuterio SpiritiILC Vertex Workshop, April On pixel sparsification architecture in 130nm STM technology ILC Vertex Workshop April 2008 Villa.
M. TWEPP071 MAPS read-out electronics for Vertex Detectors (ILC) A low power and low signal 4 bit 50 MS/s double sampling pipelined ADC M.
Low Power SRAM VLSI Final Presentation Stephen Durant Ryan Kruba Matt Restivo Voravit Vorapitat.
Low Power, High-Throughput AD Converters
High Gain Transimpedance Amplifier with Current Mirror Load By: Mohamed Atef Electrical Engineering Department Assiut University Assiut, Egypt.
Nonvolatile memories:
YASHWANT SINGH, D. BOOLCHANDANI
IN5350 – CMOS Image Sensor Design
Presentation transcript:

CMOS Camera System-on-a-Chip ECE Senior Project CMOS Camera System-on-a-Chip   FIRST PAGE

TEAM MEMBERS Anil Kumar Angana Sheth Saurabh Desai George Moran Jason Moffa Takashi Ishihara ADVISOR: Dr. Brita Olson SECOND PAGE

CMOS Camera System-on-a-Chip A normal camera uses film to save the image that hits its lens. We are designing a chip that saves the image digitally by sensing the amount of light or image that each one of its pixel sees. The image consists of 128 by 128 pixels: there are total 16384 pixels. ANIL INTRO 1

PROJECT DIAGRAM 128 x128 ANIL INTRO 2

Design Goals ANGANA INTRO 1

Establishing a Chip Design Infrastructure Learning VLSI Design Learning VLSI Design Tools and Chip Design Process Establishing a Chip Design Flow at CPP Configuring tools ANGANA INTRO 2

Progress Calculations/Analysis: Component Development: Floor Planning Conversion Gain Parasitics /Loading Noise Component Development: Design Optimization, Simulation with loading, Port to new environment Decoder primitive Anti-blooming Circuitry Decoder Bus Driver Row driver: Row RST & SEL Driver Anti-blooming Circuitry Amplifier Bias Circuitry Pixel Analog Signal Chain Sample & Hold Circuit ANGANA INTRO 3

Progress (cont.) Chip Level Design: In progress: Pixel Array schematic 7-bit decoder Analog Signal Chain with Correlated Double Sampling ANGANA INTRO 4

Accomplished Tasks Floor Planning 7 Bit Decoder Anti Blooming Circuitry

FLOOR PLANNING Pitch = 150um 16 pads 16 pads 3mm 136*12um 3mm The floor plan estimates the area of major units in the chip and defines their relative placements. The floor plan is essential to determine whether a proposed design will fit in the chip area budgeted and to estimate wiring lengths and wiring congestion, so an initial floor plan should be prepared as soon as the logic is loosely defined. Pitch: It is a distance between two pads. Pads: They are wired to the pins on the chip package. They are for the I/O connection on the chip 128*128 Imager 3mm 16 pads 136*12um 3mm 4 AMI 0.5um Tiny Chips Packaging : 150um pad pitch Pixels : 12um pitch

APS Architecture Row Decoder: Selects row for readout. Column Decoder: V E S Row Decoder: Selects row for readout. Column Decoder: Controls readout of Pixels In given row. 128*128 PIXEL ARRAY Row[i] 27=128 128 A decoder is a Combinational circuit, when enabled, produces one of 2n minterms or maxterms at the output based on the input Combinations. READOUT CIRCUITS 128 COLUMN DECODER 27=128

Decoder Implementation Row-add<0:6> Row-add<0:6> Selects row 0 1 Selects row 1 A 7 input nand gate based implementation results in a compact and regular realization reducing development time and cost. The chip that we are designing has 128*128 pixels so the decoder consists of 128 of 7 input nand gates.

Decoder Design Requirements Master Clock = 20MHz Trise/Fall requirements are relaxed. In our design Trise/Fall times are 50% of clock. Trise/Fall = ½(1/20MHz) = 25ns

Schematic of 7-input nand gate PMOS Operational W/L = (W min/L min to 7W min/L min) NMOS Operational W/L = W min/7L min Both NMOS & PMOS are minimum sized transistor (W=1.05um, L=0.7um) W/L eff PMOS : 1.05/0.7 W/L eff NMOS : 1/7(1.05/0.7)

Simulation for fall time when W = 1.05um

Simulation for rise time when W = 1.05um

Rise / Fall Time Table Rise Time Fall Time W = 1.05um 1.46ns 2.709ns L = 0.7um Better Trise/Fall times results due to reduced W of PMOS transistor. Reduced W of transistor results in Reduction of power consumption Reduction in substrate noise Reduction in input capacitance – Reduces chip area, power, & noise.

Anti Blooming Circuitry Reduces charge buildup in pixels due to excessive illumination Prevents flow of excess charge into neighboring pixels. It does this by redirecting the excess current into the anti-blooming drain when the photodiode is too full. Without anti blooming circuitry imaging artifacts will happen.

Anti Blooming Circuit Operation Vdd RST = 5V RST_LO = 1V VTH = 0.7V RST 5v RST_LO = 1V Integration Normal Imaging Condition: When RST signal is applied FD is around 2.8V and after integration of light it becomes 1.8V. (Vgs < VTH) = 1 – 1.8 < 0.7 - Transistor Off Bright Light: Due to bright light FD decreases to 0.3V (Vgs >= VTH) = 1 – 0.3 >= 0.7 – Transistor on and excess carriers removed.

Anti Blooming Circuitry Final stage of row driver Anti blooming circuitry

7 BIT INPUT SIGNAL DECODER DRIVER ANIL SLIDE 1

Schematics Driver (4x8x) Driving a load of 64, CMOS N and P transistors. ANIL SLIDE 2

Simulations Rise Time ~ 6% Fall time ~ 5% Approximate time is 1 nano second to drive signal. ANIL SLIDE 3

VALUES GIVEN W = 1.05uM L = 0.7uM VDD = 3.3v

SCHEMATIC V5 V4 V0 VDD

SCHEMATIC RESULT

SYMBOL FOR THE AND GATE ROW [i] RST[i] RST

Accomplished Tasks 1. Determine Resistive and Capacitive Parasitic Loading (Caused by dimension of the pixel Array) 2. Row Driver Design -Determine best combination for Drivers -Rise and Fall Times -Reset Driver -Select Driver 3. Simulations using PSPICE 4. Implementation of Design using Cadence (LINUX) GEORGE SLIDE 1

Chip Schematic GEORGE SLIDE 2

Overview of Row Driver SEL SEL[i] ROW[i] GEORGE SLIDE 3

Parasitic Loading Determination of load resistor: Determination of Capacitive load: GEORGE SLIDE 4

The Row Driver GEORGE SLIDE 5

The Row Driver (cont.) GEORGE SLIDE 6

Simulations Summarized Table 1: Rise and Fall Times for Inverter driving 128 transistors (using 102,400,402,600ns; Vdd=3.3V; Cload= 41.4fF) Table 2: Rise and Fall times for inverters driving inv_8x GEORGE SLIDE 7

Schematics Two Drivers (4x_8x) Driving 128 CMOSN transistors GEORGE SLIDE 8

Simulations Rise/Fall Times GEORGE SLIDE 9

Row Select Driver Design Three Drivers (1x_4x_8x) Driving 128 CMOSN transistors GEORGE SLIDE 10

Row Select Driver Simulation with Loading Rise/Fall Times GEORGE SLIDE 11

Row Reset Driver Design Introduction of two different power supply levels GEORGE SLIDE 12

Simulations Rise/Fall Times GEORGE SLIDE 13

General Chip Layout

Pixel & Timing Diagrams

Current Mirror Circuit To Bias Pixel SF “Large” gate widths and lengths used Good threshold matching gm reduced Current Equation

Determining Initial Condition For Sample & Hold Capacitor Pixel Sample & Hold Capacitor Bias Optimize RST signal due to Body Effect

The Body Effect Source ≠Body Modified threshold voltage:

Initial Condition for Sample & Hold Capacitor

Determining Time to Discharge Sample & Hold Capacitor Within 0 Determining Time to Discharge Sample & Hold Capacitor Within 0.1% Accuracy VFD initial condition: V = 1.8V

Transient Response of Pixel Discharge

Determining time to charge sample & hold capacitor Within 0 Determining time to charge sample & hold capacitor Within 0.1% Accuracy

Transient Response of Pixel Charge

Accomplishments Designing output driver Determining the conversion gain Designing the pixel array

Output Driver Pixel Array ADC Analog Sig. Chain Parasitic Capacitance

Output Driver Operation CL = 8pF Vout Vin DV = 1V Slewing (25%) Settling (75%) Step function Ttot = 100% = .5msec Slewing: small sig. Analysis not appropriate Settling: transistors in saturation

Schematic

Settling Vin DV = 1V Amplifier transfer function: Output: Settling accuracy Vin DV = 1V Step function:

Tfall output Driver (35uA)

Trise output Driver (35uA)

Slewing and Settling

Conversion Gain Cm Cm(1-A) C(total) = Cfd + Cm(1-A) V = Q/C Miller Effect Cm Cm(1-A) C(total) = Cfd + Cm(1-A) V = Q/C C.G.= Vout/Number of Electrons = q/C(total)

Conversion Gain Gate Source (3) W 4λ 4λ W (2) (1) Source (1): Cj(W*4λ) (2): Csw(W+2*4λ) (3): Cswg*W Cfd = Cj(W*4λ)+ Csw(W+2*4λ)+Cswg*W =1.19fF

Conversion Gain Vout 0.8 0.9 0.9 C(total) C(total) = Cfd+Cm(1-A) = 1.19fF Input: C.G.= q/C(total) = 134uV/electron Output: C.G.= (0.8)(0.9)(0.9)(134u) = 87.1uV/electron

CHIP PROCESS ANIL CONCLUSION 1

Remaining Tasks Component development Chip Level Schematic Development Optimization of Analog Signal chain with CDS Chip Level Schematic Development Completion of Decoder Pad Ring Assembly of final chip schematic “Full” Chip Simulations Layout ANGANA INTRO 5

Acknowledgments ANGANA CONCLUSION 1