Equivalence in OC and EC between Single- and Multi-wavelength Carbon Analyzers Judith C. Chow John G. Watson, Xiaoliang Wang, Dana.

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Presentation transcript:

Equivalence in OC and EC between Single- and Multi-wavelength Carbon Analyzers Judith C. Chow John G. Watson, Xiaoliang Wang, Dana L. Trimble, Steven D. Kohl, Benjamin Sumlin, Steven Gronstal, Sierra Mayorga and L.-W. Antony Chen Desert Research Institute, Reno, NV Presented at the IMPROVE Steering Committee Meeting Cape Romain NWR, South Carolina October 15, 2014

Objectives Introduce the DRI Model 2015 Thermal/ Optical Carbon Analyzer Demonstrate the equivalence in OC and EC between Models 2001 and 2015 Discuss follow-up and future plans

Motivations Improve efficiency Provide more information at lower cost Apply multiwavelength R and T to separate brown from black carbon Permit flexibility for further enhancements

Model 2015 Thermal/Optical Analyzer

Enhancements in Model 2015 From single wavelength (λ=633 nm) to 7λ (405–980 nm) Replace customized with off-the-shelf parts (e.g., circuit boards) Increase stability and reliability (e.g., rotameter → mass flow controller; and AC → DC heater) Provide easier operation and maintenance (e.g., eliminate H 2, and Ni catalyst methanator; provide pull-out drawer for maintenance) Reduce cost (e.g., HeNe laser → diode lasers; FID → NDIR, and less hardware) and laboratory footprint (by ~35%)

Model 2015 uses the same heating system and light pipes as Model 2001 to retain OC/EC consistency ComponentModel 2001Model 2015 Light Source633 nm HeNe laser 405, 445, 532, 635, 780, 808, and 980 nm diode lasers Fiber opticbifurcate fibers (bundle)8-leg fibers (single) Sample ovenOne armBranched side arm Flow controlRotametersMass flow controllers Sample oven power supply 110 V ACDC Circuit boardsCustom madeGeneric/Programmable Detector FID (CH 4 ) detection (requires ultrapure H 2 ) NDIR (CO 2 ) detection (no H 2 ) Conversion after thermal evolution Oxidization (to CO 2 ) and reduction (to CH 4 ) Oxidation (to CO 2 ) Data acquisitionKeithleyNational Instruments SoftwareVisual Basic/C+LabVIEW

Components Comparison (Model 2015 components on the bottom of each picture) Diode lasers HeNe laser 8-leg fiber Bifurcate fiber Side arm for O 2 injection Model 2001 oven Model 2015 oven Mass flow controllers Rotameters Laser Oven Fiber Optics Flow Control

Components Comparison (cont.) (Model 2015 components on the right of each picture) AC transformer DC power supply National Instruments data acquisition card Keithley data acquisition card Custom circuit boards Programmable board Flame ionization detector (FID) Non- dispersive Infrared Detector (NDIR)

A small microcontroller coordinates the signal creation and detection

Samples were analyzed on the prototype Model 2015 Lasers Transmittance photodiode Temperature controllers Optical fiber Cooling fan Sample oven Oxidation oven NDIR

New Model 2015 is under construction Mass flow controllers Power supplies Mass flow communications Data acquisition card Temperature controllers Sample oven Oxidation oven NDIR With pull-out drawer for maintenance

Main Operation Screen for Model 2015 (User-Friendly LabVIEW) Temperatures Flow Rates

Model 2015 includes more details in “sample info” input screen Model 2015 Sample Details Model 2015 Model 2001

Model 2001 Thermogram Display Reflectance Transmittance Temperature OC1 OC2 OC3 OC4 EC1 EC2 EC3 CAL FID Carbon

Displays for Model 2015 show 635 nm reflectance and transmittance (Similar to Model 2001) Reflectance Transmittance Temperature OC1 OC2 OC3 OC4EC1 EC2 EC3 CAL Reflectance Transmittance NDIR CO nm 405 nm 445 nm 532 nm 780 nm 808 nm 980nm 635 nm 405 nm 445 nm 532 nm 780 nm 808 nm 980nm Optical signals with 7λ

IMPROVE and urban Fresno samples* were analyzed for equivalence testing 73 IMPROVE-X Modules ( ) 71 IMPROVE ( ) 67 Fresno Supersite Samples ( ) *n=211

OCRECR Good equivalence is found for Fresno samples analyzed by Model 2001 and Model 2015 TC OCTECT N=67

For a wide variety of samples, TC, OC, and EC compare well between model 2015 (635 nm) and Model 2001 (633 nm) TC OCRECR OCTECT N=211 (IMPROVE , X-Module , and Fresno)

For IMPROVE samples, TC, OC, and EC are comparable for 2015 (635 nm) and Model 2001 (633 nm) TC OCR ECR OCT ECT N=73 (IMPROVE X-Module )

OC1 OC3 OC4 EC1 EC2 EC3 OPR OPT Most carbon fractions are within uncertainty estimates OC2 y - Model 2015 x - Model 2001N=73 (IMPROVE X-Modules)

Summary Consistency in OC and EC is found between Models 2015 and 2001 Carbon Analyzers Model 2015 has enhanced features with modernized components and provides additional optical characteristics

Existing Model 2001 analyzers can be retrofitted with seven-wavelength laser (Model λ) Fiber Optic Assembly Power Supplies Laser Control and Signal Conditioning PCB Lasers National Instruments DAQ (underneath PCB)

Follow-up and Future Plans Start replicates on a growing fraction of samples with Model 2015 and Model λ retrofits Compare precisions for different units Prepare publication documenting equivalence Begin 7λ data reporting for 2015 IMPROVE samples