© Electronics ECE 1312 Recall-Lecture 2 Introduction to Electronics Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration,

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Presentation transcript:

© Electronics ECE 1312 Recall-Lecture 2 Introduction to Electronics Atomic structure of Group IV materials particularly on Silicon Intrinsic carrier concentration, n i

© Electronics ECE 1312 Recall-Lecture 2 Extrinsic semiconductor N-type – doped with materials from Group V Majority carriers = electron P-type – doped with materials from Group III Majority carriers = holes concentration of carriers in doped semiconductors n o p o = ni 2

© Electronics ECE 1312 Drift and Diffusion Currents ● Current Generated by the movement of charged particles (negatively charged electrons and positively charged holes). ● Carriers The charged electrons and holes are referred to as carriers ● The two basic processes which cause electrons and holes move in a semiconductor:  Drift - the movement caused by electric field.  Diffusion - the flow caused by variations in the concentration.

© Electronics ECE 1312 Drift Currents ● Drift Current Density (n-type semiconductor)  An electric field E applied to n-type semiconductor with a large number of free electrons. E I e Vdn N-type Produces a force on the electrons in the opposite direction, because of the electrons’ negative charge. The electrons acquire a drift velocity, V dn (in cm/s):

© Electronics ECE 1312 Drift Currents ● Drift Current Density (p-type semiconductor)  An electric field E applied to p-type semiconductor with a large number of holes. Produces a force on the holes in the same direction, because of the positive charge on the holes. The holes acquire a drift velocity, V dp (in cm/s): E I p Vdp P-type

© Electronics ECE 1312 Diffusion Current ● The basic diffusion process ● Flow of particles from a region of high-concentration to a region of low-concentration. ● The movement of the particles will then generate the diffusion current

The pn Junction

© Electronics ECE 1312 n-type versus p-type  In n-type - the electrons are the majority carriers and holes are the minority carriers.  In p-type - the holes are called the majority carriers and electrons are the minority carriers.

© Electronics ECE 1312 The Equilibrium pn Junction ●Join n-type and p-type doped Silicon (or Germanium) to form a p-n junction. Electron diffusion Hole diffusion Creates a charge separation that sets up electric field, E ++ - pn The Electric field will create a force that will stop the diffusion of carriers  reaches thermal equilibrium condition E

© Electronics ECE Known as space charge region/depletion region. Potential difference across the depletion region is called the built-in potential barrier, or built-in voltage: V T = kT/e k = Boltzmann’s constant T = absolute temperature e = the magnitude of the electronic charge = 1 eV N a = the net acceptor concentration in the p-region N d = the net donor concentration in the n-region V T = thermal voltage, [ V T = kT / e] it is approximately V at temp, T = 300 K W E pn

© Electronics ECE 1312 The Equilibrium pn Junction Example 1 Calculate the built-in potential barrier of a pn junction. Consider a silicon pn junction at T = 300 K, doped N a = cm -3 in the p-region, N d = cm -3 in the n-region and n i = 1.5 x cm -3. Solution

© Electronics ECE 1312 Example 2 Consider a silicon pn junction at T = 400K, doped with concentrations of N d = cm -3 in n-region and N a = cm -3 in p-region. Calculate the built-in voltage V bi of the pn junction, given Given B and Eg for silicon are 5.23 x cm -3 K -3/2 and 1.1 eV respectively

© Electronics ECE 1312 ANSWER Calculation of V T = kT / e = 86 x ( 400 ) / 1eV = V Calculation of n i = BT 3/2 exp ( -Eg / 2kT ) = 5.23 x ( 400 ) 3/2 exp -1.1 / 2 (86 x ) (400) = 4.76 x cm –3 Calculation of V bi = V T ln ( N a N d / n i 2 ) = ln (10 19 ) / (4.76 x ) 2 = 0.922V

© Electronics ECE 1312 Reverse-Biased pn Junction  +ve terminal is applied to the n-region of the pn junction and vice versa.  Applied voltage V R will induce an applied electric field E A.  Direction of the E A is the same as that of the E-field in the space- charge region.  Magnitude of the electric field in the space-charge region increases above the thermal equilibrium value. Total E T = E + E A  Increased electric field holds back the holes in the p-region and the electrons in the n-region.

© Electronics ECE 1312 Hence, no current across the pn junction. This applied voltage polarity is called reverse bias. E  charge so, since there is an increase of the electric field in the depletion region, the number of charges increases too since the width of the depletion increases ETET pn WRWR ++ - W E pn Equilibrium Reverse Biased ++ - Reverse-Biased pn Junction

© Electronics ECE 1312 The space charges increase with increase of reverse-bias voltage, so a capacitor is associated with the pn junction when a reverse-bias voltage is applied. The junction capacitance or depletion layer capacitance of a pn junction is V bi EXAMPLE 2.4 Calculate the junction capacitance of a silicon pn junction diode. Consider that the diode is at room temperature (T = 300°K), with doping concentrations of cm -3, cm -3 and let. Calculate the junction capacitance at reverse bias 3.5 V.

© Electronics ECE 1312

© Electronics ECE 1312 Forward-Biased pn Junction  +ve terminal is applied to the p-region of the pn junction and vice versa.  Direction of the applied electric field E A is the opposite as that of the E-field in the space-charge region.  The net result is that the electric field in the space-charge region lower than the thermal equilibrium value causing diffusion of charges to begin again.  The diffusion process continues as long as V D is applied.  Creating current in the pn junction, i D.

© Electronics ECE pn WFWF ++ - W E pn Equilibrium Forward Biased Width reduces, causing diffusion of carriers  current flows Forward-Biased pn Junction

© Electronics ECE 1312 Ideal Current-Voltage Relationship  So, the current i D is I S = the reverse-bias saturation current (for silicon to A) V T = the thermal voltage (0.026 V at room temperature) n = the emission coefficient (1 ≤ n ≤ 2)

© Electronics ECE 1312 Ideal Current-Voltage Relationship Example Determine the current in a pn junction diode. Consider a pn junction at T = 300 K in which I S = A and n = 1. Find the diode current for v D = V and v D = V. Very small current

© Electronics ECE 1312 Example 2 A silicon pn junction diode at T=300K has a reverse biased current of I s = A. Determine the forward biased current for i. V D = 0.5V ii. V D = 0.6V iii. V D = 0.7V

© Electronics ECE 1312 PN Junction Diode  The basic PN junction diode circuit symbol, and conventional current direction and voltage polarity.  The graphs shows the ideal I-V characteristics of a PN junction diode.  The diode current is an exponential function of diode voltage in the forward-bias region.  The current is very nearly zero in the reverse-bias region.

© Electronics ECE 1312 PN Junction Diode ●Temperature Effects  Both I S and V T are functions of temperature.  The diode characteristics vary with temperature.  For silicon diodes, the change is approximately 2 mV/ o C. Forward-biased PN junction characteristics versus temperature. The required diode voltage, V  to produce a given current decreases with an increase in temperature.